Abstract: An optical-fiber filter system to narrow a linewidth and to reduce noise fluctuations of an optical beam is provided. The optical-fiber filter system includes an optical fiber having a first end-face and an opposing second end-face, the first end-face and the second end-face setting a fiber length; a fiber Bragg grating having a first reflectivity positioned at the first end-face; and a reflector having a second reflectivity positioned at the second end-face. When the optical beam at a first frequency is coupled from a laser into one of the first end-face or the second end-face, a resonant cavity is established at the first frequency between the fiber Bragg grating and the reflector while Brillouin scattered light shifted from the first frequency within the optical fiber is transmitted through the fiber Bragg grating.

Abstract: An axial motion distortion-corrected optical coherence tomography system. The system can include an optical coherence tomography sensor, a light source, a fiber-optic system arranged to provide a reference beam and an observation beam, an optical detection system arranged to receive combined light from the reference beam and the observation beam and to provide detection signals, and a data processing system arranged to receive said detection signals, construct a plurality of A-scans from said detection signals, and construct one or more images from said plurality of A-scans. The data processing system can be configured to correct distortion in the images caused by net axial motion of at least one of said optical coherence tomography sensor or a target of said optical coherence tomography sensor by calculating an estimate of the net axial motion using Doppler shift, and then shifting the A-scans according to the estimate.

Abstract: A system for detecting misalignment of an aero surface relative to other aero surfaces during simultaneous deployment of the aero surfaces is disclosed. A generator configured to shine a laser through aligned apertures in a series of aero surfaces towards a reflector during deployment of the aero surfaces, a receptor to detect reflection of the laser from the reflector back through the apertures to the generator and, a controller operable to terminate further deployment of the aero surfaces in the event that no reflection is detected by the receptor, or if an actual time taken for the reflected beam of light to be detected by the receptor differs from a predetermined time.

Abstract: An aspheric face form measuring method calculates phase information of interference light from light intensity of a fringe pattern image obtained by detecting interference light that is formed by measurement light and reference light reflected off a subject aspheric face being overlaid. The method changes a relative distance between an optical system and the subject aspheric face and transitions a position of a null region. The method performs calculation of form data for a vertical incident region where measurement light is vertically incident to the subject aspheric face, using phase information and a scanning amount. The method performs calculations of form data, of the null regions, a non-vertical incident region that is outside of the vertical incident region. The method also composites a plurality of partial form data of the subject aspheric face previously calculated, using each of a plurality of the phase information and scanning amounts.

Abstract: The positions of the slitter blades of a slitter-winder are calibrated using a laser to perform measurement and calibration of the fiber web cutting point of each slitter blade pair. Measurement and calibration is preformed on the top slitter blade of each of a multiplicity of slitter blade pairs one after another. The laser measures one slitter blade of each slitter blade pair while they are engaged. The slitter blade pairs between the laser and the slitter blade pair being measured are not engaged. Carriages which support the slitter blades have position sensors which the laser measurements calibrate and the blade pair positions are measured and the carriage positions are read simultaneously. The cutting edges of the slitter blades are sharpened to have straight sides and the laser measurement system is located so the laser beam is directed to the straight side.

Abstract: There is disclosed a polarization-modulating element for modulating a polarization state of incident light into a predetermined polarization state, the polarization-modulating element being made of an optical material with optical activity and having a circumferentially varying thickness profile.

Abstract: Embodiments described herein provide a method of modulating an input light beam of a fiber optic coil of an IFOG. The method includes intermittently jumping the phase step of a feedback signal to suppress dead band. Jumping the phase step includes: creating a jumped phase step during a first cycle of the IFOG, the jumped phase step having a whole value configured to cause a phase jump in the feedback signal and a fractional value corresponding to the fractional value from a phase step of a cycle immediately preceding the first cycle. Jumping the phase step also includes generating the feedback signal from a sum of the bias modulation value and the jumped phase step.

Abstract: An imaging system for inspecting an inner surface bounding a component bore is provided along with a method of inspection therewith. The system includes a laser light source configured to emit a laser beam. Further, a camera is configured to image a reflection of the laser beam from the inner surface. At least a first minor is disposed within the bore. The laser light source is configured to emit the laser beam directly from the laser light source in substantially parallel relation to the central axis incident on the first mirror and the camera is configured to view a reflection of the laser beam from the inner surface.

Abstract: A temporary optical wave diffusion-promoting film is adhered to a lidded microelectromechanical systems (MEMS) wafer. Testing is performed on the lidded MEMS wafer using an interferometer directed towards the temporary optical wave diffusion-promoting film applied to the lidded MEMS wafer. The temporary optical wave diffusion-promoting film is peeled from the lidded MEMS wafer to remove the temporary optical wave diffusion-promoting film from the lidded MEMS wafer after performing the testing.

Abstract: A pipe measuring system provides means for tallying a set of pipes, each of which has a threaded coupling at one end. The system includes a handheld laser instrument and target that are manually and sequentially placed at opposite ends of each pipe to measure its length. However, to measure the pipe's effective assembled length, rather than its actual length, the laser instrument has an adjustable backstop for engaging one end of the pipe. To use the system, a manufacture of the pipe first provides a specified make-up dimension that says how far the coupling should overlap the pipe when properly tightened. A manufacturer and/or end-user of the laser instrument establish the instrument with a zero reference. Then, based on the pipe manufacturer's specified make-up dimension and the location of the zero reference, the end-user adjusts the position of the backstop to be a certain distance from the zero reference.

Abstract: The present disclosure is directed to a system for measuring a thickness variation and a shape of a wafer. The system includes a first reference flat and a second reference flat. The first reference flat and the second reference flat are spaced apart to form a cavity. The cavity is configured to receive the wafer. The system also includes a plate. The plate may be inserted into the cavity with the wafer. The system also includes a first interferometer located on a first side of the cavity and a second interferometer located on a second side of the cavity. The system also includes a processor which may be in communication with the first interferometer and the second interferometer. The processor is configured to determine the thickness variation and the shape of the wafer based on at least the readings of the first interferometer and the second interferometer.

Abstract: Methods and a computer readable medium for deriving a quantitative phase contrast tomographic image of a specimen. The specimen is illuminated and a focus of the illuminating light is scanned to a plurality of depths within the specimen. Light transmitted through the specimen is spatially Fourier transformed at each of the plurality of depths to form a spatially transformed image, and at least one of the phase and amplitude of a plurality of spatial frequency components of the spatially transformed image is spatially modulated. An intensity image of the specimen plane as modulated with respect to spatial frequency components is detected and deconvolved at a plurality of spatially modulated instances to obtain a three-dimensional phase representation of the specimen at each of the plurality of distances relative to a fiducial plane.

Abstract: An apparatus for inertial sensing is provided. The apparatus comprises at least one atomic inertial sensor, and one or more micro-electrical-mechanical systems (MEMS) inertial sensors operatively coupled to the atomic inertial sensor. The atomic inertial sensor and the MEMS inertial sensors operatively communicate with each other in a closed feedback loop.

Abstract: The process includes measuring flops of a layer of the coating composition applied over a test substrate of a mottling prediction device of the present invention at the start and then after a desired time interval. A delta flop is determined by subtracting from the flop at the start from that after the desired time interval and a degree of mottling of a coating resulting from the layer is visually assessed. The process is repeated with varying amounts of one or more rheology additives added to the composition and the degree of mottling vs. delta flop is plotted on a graph and then by using a curve fitting equation, a mottling prediction curve is obtained. By measuring the delta flop of a wet layer of a target coating composition, the degree of mottling in the target coating composition can then be predicted by using the mottling prediction curve.

Abstract: Portable spectrophotometer and method for characterizing solar collector tubes for simultaneously and on-field characterizing reflection and transmission coefficients. This device includes all the components needed to take this measurement, such as a module that takes the measurement of the reflection coefficient (R) of the inner tube (1?), a module that takes the measurement of transmission coefficient (T) of the outer tube (1?), an electronic data acquisition and processing system (12), an external computer (13) for controlling the device and sending the measured data (17) and a communication system (15) between device and the computer (13).

Abstract: A device is provided for demonstrating and testing the effectiveness of an anti-reflection treatment of an ophthalmic lens. An image (2) is backlit by a light source (7) with a second face (1B) forming an angle of at least 90° relative to the first face and is placed facing a third face (1C) for positioning at least one ophthalmic lens (4A) with its concave face facing outwards. The device includes text (5) on a transparent medium behind the mirror and a face of uniform color (6) behind the text, such that when a user looks through the orifice (4) and the lens (4A), the user can see the reflection of the image (2) on the lens (4A) by means of the mirror (3), the image being superposed on the text (5) and on the face (6) of uniform color.

Abstract: This invention, methods and apparatus for biomedical agent multi-dimension measuring and analysis, provide the multi-dimension measuring of the biomedical agents, cells, molecules, any and all explosive and hazardous agents, aerosol, airborne particles, liquid/fluid contaminations/particles, gas particles, etc. in order to recognize the multi-dimension size of the particles, select and sort them by their multi-dimension measurements, and count the particles in each sorted group. An improved apparatus for biomedical agent multi-dimension measuring and analysis comprises at least two light (laser) beam sources and at least two light detection means respectively located in the chamber. Also, the improved apparatus includes the amplifying, processing and control means providing distinguish and imaging of the particles/biomedical agents by their multi-dimensions, thereby, providing more precise agent grouping for analysis and counting.

Abstract: A light interference system and a substrate processing apparatus can suppress loss of reflection spectrum. The light interference system 1 includes a light source 10, a coupler 41, multiple collimators 12A and 12B, a collimator 42, a mirror 43, a spectrometer 14, and an operation unit 15. The collimator 42 and the mirror 43 are provided at a side of multiple input terminals except a first input terminal and configured to send reflected lights from multiple output terminals to the multiple output terminals again.

Abstract: A method of performing a hot test of a wafer-level, packaged high-brightness phosphor converted light-emitting diode (pc-HBLED) includes selectively heating portions of the phosphor layer using a laser to provide a predetermined temperature gradient in the phosphor layer. The selective heating can directly heat the silicone in a silicone-based phosphor layer, or directly heat the active ion(s) of the phosphor in a Lumiramic™-based phosphor or even the active ion(s) of a silicone-based phosphor layer. A current is applied to the InGaN film to establish a predetermined temperature at the InGaN film junction, the film junction being adjacent to the phosphor layer. Photometric measurements are performed on the HBLED after the selective heating and during the applied electroluminescent current. This method quickly establishes the temperatures and temperature gradients in the HBLED consistent with those of an operating, product-level HBLED, thereby ensuring accurate binning of the HBLED.

Abstract: By forming nanoparticles from gas-phase precursors within cracks or defects in a gas-barrier film, crack-width may be determined from the diameter of the nanoparticles formed within. The optical absorption and emission wavelengths of a quantum dot are governed by the particle size. For a particular material, the absorption and/or emission wavelengths may therefore be correlated to the particle size (as determined from techniques such as transmission electron microscopy, TEM). Thus, fluorescence measurement techniques and/or confocal microscopy may be used to determine the size of quantum dots formed within a gas-barrier film, allowing both the size and nature of a defect to be determined. The method may be used to assess the potential effects of defects on the integrity of the gas-barrier film.