Abstract: A control device for an induction machine includes an angle determining device designed to determine a rotor angle of the induction machine without requiring use of sensors. The angle determining device generates measuring voltage pulses which can be selectively used to replace control voltage pulses used to control the induction machine. Machine currents generated by the measuring voltage pulses can be used to determine a rotor angle without interrupting the control voltage pulses and/or operation of the induction machine.

Abstract: A method of operating a resistive non-volatile memory can be provided by applying a forming voltage across first and second electrodes of a selected memory cell in the variable resistance non-volatile memory device during an operation to the selected memory cell. The forming voltage can be a voltage level that is limited to less than a breakdown voltage of an insulation film included in selected memory cell between a variable resistance film and one of first electrode. Related devices and materials are also disclosed.

Abstract: According to one embodiment, a semiconductor memory device includes a first memory cell array including a first block that includes memory cells, a second memory cell array including a second block that includes memory cells, word lines arranged in the first and second memory cell arrays, and a row decoder including transfer gates that respectively transfer voltages to the word lines. Word lines arranged in the first block include first and second groups, word lines arranged in the second block include third and fourth groups, and the first and third groups commonly use the transfer gates.

Abstract: Disclosed herein is a semiconductor device including a multi-level wiring structure that includes a lower-level wiring, an upper-level wiring and an interlayer insulating film between the lower-level and upper-level wirings. The device further includes a plurality of bit lines for a plurality of memory cells, and each of the bit lines includes a first portion that is formed as the lower-level wiring and a second portion that is electrically connected in series to the first portion and formed as the upper-level wiring.

Abstract: An architecture and method includes providing an oscillatory signal through each magnetic tunnel junction (MTJ), or in a line adjacent each MTJ, in a magnetoresistive random access memory array. A rectified signal appearing across each MTJ is measured and compared to a reference signal for determining the state of the MTJ.

Abstract: A nonvolatile memory device, which has an improved read reliability through a refresh operation, and a memory system, are provided. The nonvolatile memory device includes a resistive memory cell, a reference resistor corresponding to the resistive memory cell, a reference sense amplifier electrically connected to the reference resistor and configured to change a transition time of an output value of the reference resistor, and a refresh request signal generator configured to output the refresh request signal for the resistive memory cell when the transition time of an output value of the reference resistor is in a preset refresh requiring period.

Abstract: A bias voltage generator for providing a control voltage and a source line voltage to a memory array includes a reference voltage generating circuit and a voltage converting circuit. The reference voltage generating circuit receives a program signal or an erase signal, and generates a reference voltage. If the program signal is received by the reference voltage generating circuit, the reference voltage has a positive temperature coefficient. If the erase signal is received by the reference voltage generating circuit, the reference voltage has a negative temperature coefficient. The voltage converting circuit converts the reference voltage into the control voltage and the source line voltage. The voltage converting circuit enlarges the reference voltage by a first magnification so as to produce the source line voltage, and enlarges the reference voltage by a second magnification so as to produce the control voltage.

Abstract: Provided is a method of preventing simultaneous activation of redundancy memory line or spare word lines, the method including: programming a fail address of a memory line determined to be defective; reprogramming the fail address if a first spare line for the memory line is determined to be defective; storing additional information with respect to the reprogrammed fail address; and activating a second spare line and inactivating the first spare line, referring to the additional information.

Abstract: A nonvolatile semiconductor memory device includes a memory cell array having first and second groups of memory strings, each memory string including first and second memory cells connected between select transistors. The nonvolatile semiconductor memory device further includes a first word line connected to the first memory cells of the memory strings, a second word line connected to the second memory cells of the memory strings, and a control unit configured to control application of control voltages to the select transistors and the word lines, such that a select line voltage is applied to the first word line and a non-select line voltage is applied to the second word line and not discharged while select transistors of the first group of memory strings are turned off and select transistors of the second group of memory strings are turned on.

Abstract: The present disclosure includes apparatuses and methods related to performing logical operations using sensing circuitry. An example apparatus comprises an array of memory cells and sensing circuitry coupled to the array. The sensing circuitry is configured to perform a logical operation using a data value stored in a first memory cell coupled to a sense line as a first input and a data value stored in a second memory cell coupled to the sense line as a second input. The sensing circuitry is configured to perform the logical operation without transferring data via a sense line address access.

Abstract: An apparatus includes a group of data cells and a reference cell coupled to the group of data cells. The reference cell includes four magnetic tunnel junction (MTJ) cells. Each of the four MTJ cells is coupled to a distinct word line. Each of the four MTJ cells includes an MTJ element and a single transistor. The single transistor of each particular MTJ cell is configured to enable read access to the MTJ element of the particular MTJ cell.

Abstract: A read-only memory (ROM) cell has first and second transistors connected in series between a true bit line and a voltage reference (e.g., ground), and third and fourth transistors connected in series between a complement bit line and the voltage reference. The gates of the first and third transistors are connected to a first word line, and the gates of the second and fourth transistors are connected to a second word line. The ROM cell is programmed to store any possible combination of two bits of information by appropriately (i) connecting the node between the first and second transistors to either the true bit line, the complement bit line, or the voltage reference and (ii) connecting the node between the third and fourth transistors to either the true bit line, the complement bit line, or the voltage reference.

Abstract: Current appearing on a bit-line with no memory cells asserted may be used during a bit-line pre-charge time before a read is performed so as to bias a gate-drain shorted PMOS pull-up device connected between the bit-line and a power supply at a VDD potential. The capacitance connected to the gate of this PMOS pull-up device may be used to “store” the resultant gate-source voltage when the drain is disconnected once the pre-charge time is completed. Once the read operation starts, the current of the PMOS pull-up device that has the “stored” resultant gate-source voltage and the “stored” resultant gate-source voltage itself are re-used as the references, or multi-reference, for sensing the state of an asserted memory cell connected to the bit-line during the read operation thereof.

Abstract: Current appearing on a bit-line with no memory cells asserted may be used during a bit-line pre-charge time before a read is performed so as to bias a gate-drain shorted PMOS pull-up device connected between the bit-line and a power supply at a VDD potential. The capacitance connected to the gate of this PMOS pull-up device may be used to “store” the resultant gate-source voltage when the drain is disconnected once the pre-charge time is completed. Once the read operation starts, the current of the PMOS pull-up device that has the “stored” resultant gate-source voltage is re-used as the reference for sensing the state of an asserted memory cell connected to the bit-line during the read operation thereof.

Abstract: Memory devices, controllers, and electronic devices comprising memory devices are described. In one embodiment, a memory device comprises a volatile memory, a nonvolatile memory, and a controller comprising a memory buffer, and logic to transfer data between the nonvolatile memory and the volatile memory via the memory buffer in response to requests from an application, wherein data in the memory buffer is accessible to the application. Other embodiments are also disclosed and claimed.

Abstract: A non-volatile semiconductor device and a method for controlling the same are disclosed, which can increase a read efficiency of the non-volatile semiconductor device using the Low Power Double Data Rate (LPDDR) 2 specifications. The non-volatile semiconductor device includes a decoder configured to output a plurality of active control signals by decoding an active address and an active signal, and a plurality of active controls configured to be controlled by the plurality of active control signals and a plurality of active reset signals so as to generate a plurality of active enable signals that are independently activated.

Abstract: Provided is a nonvolatile memory device using a resistance material and a method of driving the nonvolatile memory device. The nonvolatile memory device comprises a resistive memory cell which stores multiple bits; a sensing node; a clamping unit coupled between the resistive memory cell and the sensing node and provides a clamping bias to the resistive memory cell; a compensation unit which provides a compensation current to the sensing node; a sense amplifier coupled to the sensing node and senses a change in a level of the sensing node; and an encoder which codes an output value of the sense amplifier in response to a first clock signal. The clamping bias varies over time. The compensation current is constant during a read period.

Abstract: A method of operating a memory device includes programming a first data signal to a first memory cell, attempting to program a second data signal to the first memory cell in a state where the first memory cell is not erased, and marking the first memory cell as blank upon failing to program the second data signal to the first memory cell.

Abstract: Techniques, systems and circuitry for using One-Time Programmable (OTP) memories to function as a Multiple-Time Programmable (MTP) memory. The OTP-for-MTP memory can include at least one OTP data memory to store data, and at least one OTP CAM to store addresses and to search input address through valid entries of the OTP CAM to find a latest entry of the matched valid addresses. The OTP-for-MTP memory can also include a valid-bit memory to find a next available entry of the OTP data memory and OTP CAM. When programming the OTP-for-MTP memory, address and data can be both programmed into the next available entry of the OTP CAM and the OTP data memory, respectively. When reading the OTP-for-MTP memory, the input address can be used to compare with valid entries of the addresses stored in the OTP CAM so that the latest entry of the matched valid addresses can be output.

Abstract: A non-volatile memory circuit is formed of a P-channel MOS transistor and includes a P-channel non-volatile memory element having a floating gate and a control gate capacitively coupled together. A resistor divider has a first resistor and a second resistor for dividing a voltage difference between a power supply voltage and a ground voltage. A divided voltage output of the resistor divider is connected to the control gate. First and second switches are connected in parallel to the respective first and second resistors. The first and second switches are controlled so that a voltage of the control gate is set to a voltage of the divided voltage output which maximizes an electric field between a pinch-off point and a drain point of the P-channel MOS transistor in a writing mode.