Patents Examined by Olda Hernandez
  • Method and system for analyzing fault and snapshot operational parameter data for diagnostics of machine malfunctions
    Patent number: 6336065
    Abstract: A method for analyzing fault log data and snapshot operational parameter data from a machine undergoing diagnostics is provided. A receiving step allows for receiving fault log data comprising a plurality of faults from the machine. Respective executing steps allow for executing a set of noise-reduction filters upon the received fault log data to generate noise-reduced fault log data, and for executing a set of candidate snapshot anomalies upon the noise-reduced data to generate data predictive of malfunctions of the machine.
    Type: Grant
    Filed: November 12, 1999
    Date of Patent: January 1, 2002
    Assignee: General Electric Company
    Inventors: David Richard Gibson, Nicholas Edward Roddy, Anil Varma