Patents Examined by Paresh H Patel
  • Patent number: 10527700
    Abstract: A method and system provides an acquisition scheme for generating magnetic resonance elastography displacement data with whole-sample coverage, high spatial resolution, and adequate SNR in a short scan time. The method and system can acquire in-plane and through-plane k-space shots over a volume of a sample divided into a plurality of slabs that each include a plurality of non-adjacent slices to obtain three dimensional multiband, multishot data, can apply multiband radio frequency refocusing pulses to the sample, can acquire navigators before readout, and can correct for non-linear motion errors.
    Type: Grant
    Filed: October 18, 2017
    Date of Patent: January 7, 2020
    Assignee: THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
    Inventors: Curtis L. Johnson, Bradley P. Sutton, Joseph L. Holtrop
  • Patent number: 10488439
    Abstract: An electrical contact that employs a common compressible layer for all contacts, wherein the compressible layer is fashioned with ducts that contain bridges within them. The bridges are formed of the compressible layer. This bridge serves as a compressible member for a first and second member in electrical contact with each other, and that interact with each other such that a compression force acted on the first and second members will cause them to maintain electrical contact whilst compressing the bridge. When the compressive force is released, the bridge, acting like a spring, expands thus pushing the first and second members apart, but still in electrical contact with each other.
    Type: Grant
    Filed: July 3, 2018
    Date of Patent: November 26, 2019
    Assignee: JF MICROTECHNOLOGY SDN. BHD.
    Inventors: Wei Kuong Foong, Kok Sing Goh, Shamal Mundiyath, Eng Kiat Lee
  • Patent number: 10488437
    Abstract: A tester is described having output circuits that are operable in either power mode or driver mode. A switching circuit connects force and sense lines to one of the output circuits when in power mode, or connects the same lines separately to the output circuits when in driver mode. A further configuration allows for power to be provided through the lines separately while detecting a measure of power through each line and correcting for unknown resistances of leads connected to the lines.
    Type: Grant
    Filed: December 18, 2017
    Date of Patent: November 26, 2019
    Assignee: AEHR TEST SYSTEMS
    Inventors: Donald P. Richmond, II, David S. Hendrickson
  • Patent number: 10481213
    Abstract: Disclosed is an overcharge detection method for detecting an overcharging of an accumulator of a battery including a set of parallel branches each including accumulators disposed in series, wherein the method includes steps of: (i) collecting the measurements of the currents flowing in the branches of the battery; (ii) identifying at least one variation in current in one branch with respect to at least one other branch as a function of the measurements of current collected; (iii) determining a level of state of charge of the branch; and (iv) detecting an overcharging of an accumulator in the branch as a function of at least the variation in current identified and of the level of state of charge determined.
    Type: Grant
    Filed: December 8, 2015
    Date of Patent: November 19, 2019
    Assignee: DCNS
    Inventor: Nicolas Pierre
  • Patent number: 10484676
    Abstract: Testing of control wires of a pixel array of an image sensor is performed by applying a signal transition to a control wire and detecting, based on a voltage signal detected on the control wire, the duration of at least part of the signal transition on the control wire. An electrical fault in the control wire is indicated based on a comparison of the detected duration to a threshold.
    Type: Grant
    Filed: October 20, 2015
    Date of Patent: November 19, 2019
    Assignee: STMicroelectronics (Grenoble 2) SA
    Inventors: Richun Fei, Salvador Mir, Jocelyn Moreau
  • Patent number: 10481176
    Abstract: A signal lead structured to be attached to an electrical device that comprises a signal pad, a spring housing, a spring, and a flexible conduit. The spring is carried in the spring housing, and a portion of the spring extends beyond a surface of the spring housing when the spring is unsprung. The spring is structured to touch the electrical device and carry an electrical signal between the electrical device and the signal pad when the signal lead is attached to the electrical device. The flexible conduit is coupled to the signal pad at an end of the flexible electrical conduit and extends away from the spring housing.
    Type: Grant
    Filed: September 30, 2016
    Date of Patent: November 19, 2019
    Assignee: Tektronix, Inc.
    Inventor: James H. McGrath, Jr.
  • Patent number: 10451663
    Abstract: An electromagnetic field measurement device includes a first probe and a second probe arranged in a space to measure an electric field, a reference signal generator that generates a reference signal, a first multiplier that multiplies the reference signal by a signal obtained via the first probe, a second multiplier that multiplies a signal obtained via the second probe by the signal output from the first multiplier, and a synchronous detector that extracts a signal component that is synchronous with the reference signal from the signal output from the second multiplier.
    Type: Grant
    Filed: August 9, 2016
    Date of Patent: October 22, 2019
    Assignee: OSAKA UNIVERSITY
    Inventors: Shintarou Hisatake, Tadao Nagatsuma
  • Patent number: 10451656
    Abstract: There is provided a ring-shaped magnetic core that forms a closed magnetic circuit that encloses a measured electrical path, a magneto-electric converter that detects magnetic flux inside the magnetic core and outputs an electrical signal with an amplitude in keeping with a quantity of the magnetic flux, a coil that is formed on the magnetic core and is supplied with a negative feedback current generated based on the electrical signal, and an internal shield member disposed at least in a vicinity of the magneto-electric converter and the coil. A first gap that increases a magnetoresistance of a closed magnetic circuit, which is a closed magnetic circuit for leakage flux that leaks from the magnetic core and includes the internal shield member, a part of the magnetic core where the coil is formed, and the magneto-electric converter, is formed in the internal shield member.
    Type: Grant
    Filed: December 15, 2015
    Date of Patent: October 22, 2019
    Assignee: HIOKI DENKI KABUSHIKI KAISHA
    Inventors: Osamu Yokota, Hidekazu Masuda
  • Patent number: 10444296
    Abstract: A control device of the present invention includes: an OCV estimating unit that estimates, based on a voltage value and a current value of a controlled device, an OCV of the controlled device; a capacity calculating unit that calculates an integrated capacity of the controlled device based on the current value of the controlled device; and a control unit that controls discharging and charging of the controlled device, and calculates a full capacity of the controlled device based on: a first SOC and a second SOC at a predetermined first OCV and a predetermined second OCV during the discharging or the charging of the controlled device; a first integrated capacity and a second integrated capacity at the first OCV and the second OCV during the discharging; and a third integrated capacity and a fourth integrated capacity at the second OCV and the first OCV during the charging.
    Type: Grant
    Filed: September 7, 2015
    Date of Patent: October 15, 2019
    Assignee: NEC Corporation
    Inventors: Junichi Miyamoto, Yuichi Imamura, Shingo Takahashi, Sho Ohtani, Hiroshi Kajitani
  • Patent number: 10436822
    Abstract: A measurement apparatus is provided that measures a current signal IDUT that flows through a device under test. A transimpedance amplifier converts the current signal IDUT into a voltage signal VOUT. A digitizer converts the voltage signal VOUT into digital data DOUT. A digital signal processing unit performs signal processing on the digital data DOUT, and controls the measurement apparatus. The measurement apparatus has a configuration comprising two separate modules, i.e., a probe module which is located in the vicinity of the device under test during a measurement, and a backend module connected to the probe module via at least one cable. The transimpedance amplifier is built into the probe module. The digitizer and the digital signal processing unit are built into the backend module.
    Type: Grant
    Filed: October 28, 2015
    Date of Patent: October 8, 2019
    Assignee: ADVANTEST CORPORATION
    Inventor: Yasuhide Kuramochi
  • Patent number: 10429458
    Abstract: An RF coil structure used for a magnetic resonance imaging (MRI) system includes an RF shield, an RF coil provided inside the RF shield, and a high dielectric material arranged between the RF shield and the RF coil, in which an interval between the RF shield and the RF coil is changed or a thickness of the high dielectric material is changed.
    Type: Grant
    Filed: January 2, 2015
    Date of Patent: October 1, 2019
    Assignees: Samsung Electronics Co., Ltd., Samsung Life Public Welfare Foundation
    Inventors: Kyoungnam Kim, Yeon Hyeon Choe
  • Patent number: 10401386
    Abstract: A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a.
    Type: Grant
    Filed: August 29, 2016
    Date of Patent: September 3, 2019
    Assignee: Johnstech International Corporation
    Inventors: David Johnson, John Nelson, Sarosh Patel, Michael Andres
  • Patent number: 10393684
    Abstract: A low-cost and bench-top magnetic resonance relaxometer can be used for ex-vivo biochemical stress tests on plasma/erythrocytes, enabling deep-phenotyping of an individual's oxidative status, susceptibility and capacity.
    Type: Grant
    Filed: April 23, 2016
    Date of Patent: August 27, 2019
    Assignees: Massachusetts Institute of Technology, National University Hospital (S) Pte
    Inventors: Weng Kung Peng, Jongyoon Han, Tze Ping Loh
  • Patent number: 10345340
    Abstract: The invention relates to a voltage sensing device for a high and/or medium-voltage power-carrying conductor, the voltages sensing device comprising: • a carrier element (3) with a passageway for receiving the power-carrying conductor, • wherein the carrier element comprises an electrode (4) extending in an axial direction of the passageway of the carrier element and operable as a first electrode of the voltage sensing device, wherein • a conductor (1) of the power cable is operable as the second electrode of the voltage sensing device and wherein • the carrier element has a coefficient of thermal expansion that is less than 5×10^?6 1/K at 20 C.
    Type: Grant
    Filed: December 16, 2014
    Date of Patent: July 9, 2019
    Assignee: 3M Innovative Properties Company
    Inventors: Mark Gravermann, Friedrich A. Busemann, Bernd Schubert, Gerhard Lohmeier, Andreea Sabo, Rainer Reeken, Michael H. Stalder, Christian Weinmann, Sebastian Eggert, Dipankar Ghosh, Myungchan Kang, Christopher D. Sebesta
  • Patent number: 10338128
    Abstract: A life estimation circuit includes a temperature detector configured to detect temperature of a power element unit, an inflection point detection unit configured to detect an inflection point of temperature variation in the power element unit based on an output signal from the temperature detector, an operation unit configured to determine an absolute value of a difference between the temperature of the power element unit at an inflection point detected this time and the temperature of the power element unit at an inflection point detected last time, a count circuit configured to count the number of times that the absolute value of the difference in temperature has reached a threshold temperature, and a signal generation unit configured to output, when a count value from the count circuit reaches a threshold number of times, an alarm signal indicating that the power element is about to reach the end of its life.
    Type: Grant
    Filed: June 13, 2016
    Date of Patent: July 2, 2019
    Assignee: Mitsubishi Electric Corporation
    Inventors: Shiori Uota, Fumitaka Tametani, Takahiro Inoue, Rei Yoneyama
  • Patent number: 10330497
    Abstract: A modified eddy current (MEC) probe includes a probe body having a bore formed therein. A printed circuit board (PCB) assembly includes a circuit board defining a plane, has a plurality of electronic components mounted thereon, and is configured for mounting within the bore of the probe body. A coil board assembly is electrically connected to the PCB assembly, defines a plane, and includes a first coil board layer, a second coil board layer bonded to the first coil board layer, a transmitter coil formed on an outside surface of the first coil board layer, a Faraday shield formed on an outside surface of the second coil board layer, and a sensor coil formed on one of an inside surface of the first coil board layer and the second coil board layer, such that the sensor coil is positioned between the first coil board layer and the second coil board layer. The plane of the coil board assembly is arranged orthogonally to the plane of the circuit board.
    Type: Grant
    Filed: February 13, 2017
    Date of Patent: June 25, 2019
    Assignee: Centrus Energy Corp.
    Inventors: James A. Moore, Michael S. Emery, Marc L. Simpson, Mike Hileman, Terry White
  • Patent number: 10324124
    Abstract: A pad capacitance test circuit may be coupled to one or more pads of an electronic circuit, such as a processor. The pad capacitance test circuit may be located on a die including the electronic circuit. The pad capacitance test circuit may reset a pad voltage of one or more of the pads to zero, and then couple the pad to a supply voltage through a pullup resistor for a time period. The final pad voltage at or near the end of the period of time may be measured. The pad capacitance may be determined from the measured value of the final pad voltage and known values of the supply voltage, the time period, and resistance of the pullup resistor.
    Type: Grant
    Filed: June 16, 2015
    Date of Patent: June 18, 2019
    Assignee: Intel Corporation
    Inventors: Linda K. Sun, Harry Muljono
  • Patent number: 10324126
    Abstract: A method for aligning probe pins with respect to positions of electronic devices comprises conducting contact stamping on a first electronic device with the probe pins to form first probe marks on lead pads of the first electronic device, capturing an image of the first electronic device, determining positions of the first probe marks on the first electronic device using the captured image, calculating an offset using the positions of the first probe marks, adjusting relative positions between a subsequent plurality of electronic devices and the probe pins using the offset, and contacting lead pads of the subsequent plurality of electronic devices with the probe pins for testing said electronic devices. The first probe marks are configured to have greater visibility as compared with second probe marks formed when contacting the lead pads of the subsequent plurality of electronic devices with the probe pins, so as to improve the accuracy of the offset calculated.
    Type: Grant
    Filed: June 10, 2016
    Date of Patent: June 18, 2019
    Assignee: ASM TECHNOLOGY SINGAPORE PTE LTD.
    Inventors: Yu Sze Cheung, Hon Kam Ng, Chun Shing Yip
  • Patent number: 10325535
    Abstract: A method for testing a display panel includes: applying a first level signal to a first sub-pixel and a third sub-pixel of a first pixel unit and applying a second level signal to a second sub-pixel of the first pixel unit; applying the second level signal to a first sub-pixel and a third sub-pixel of a second pixel unit and applying the first level signal to a second sub-pixel of the second pixel unit; and detecting a short circuit between adjacent sub-pixels. The first level signal has a voltage polarity opposite to a voltage polarity of the second level signal. Therefore, it is ensured that any two adjacent sub-pixels have opposite voltage polarities when the short circuit between adjacent sub-pixels of the display panel is detected. The method also provides improved testing abilities to detect an open circuit in a sub-pixel.
    Type: Grant
    Filed: January 31, 2017
    Date of Patent: June 18, 2019
    Assignees: Shanghai AVIC OPTO Electronics Co., Ltd., Tianma Micro-electronics Co., Ltd.
    Inventors: Xu Yang, Nana Tian, Xupeng Wang, Zhiyong Ren, Xiaoyuan Ding, Zhengyuan Huang
  • Patent number: 10317454
    Abstract: A method for detecting electric arcs in a closed chamber having no openings larger than 5 mm and defining a gas volume to be monitored. The method includes a step of measuring a sound level captured by a microphone, placed inside the chamber, at frequencies greater than about 60 kHz while filtering out the lower frequencies, and a step of comparing the level with a threshold.
    Type: Grant
    Filed: December 8, 2014
    Date of Patent: June 11, 2019
    Assignee: Commissariat à l'Énergie Atomique et aux Énergies Alternatives
    Inventor: Pierre Perichon