Abstract: A method of testing electrical circuits on a substrate for detecting shorts and opens. A plurality of electrical networks in which each network has one or more nodes are tested by selectively electrically charging certain nodes and selectively testing other nodes for detecting shorts and opens between the nodes. The method of testing allows various levels of testing to be performed for detecting more and greater different kinds of possible defects.
Type:
Grant
Filed:
December 20, 1990
Date of Patent:
June 16, 1992
Assignee:
Microelectronics and Computer Technology Corporation
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