Patents Examined by Richard E. Kurtz
  • Patent number: 5074666
    Abstract: A high stability interferometer is capable of continuous measurement of small changes in the refractive index of a sample. The interferometer has a diffraction grating placed to be movable sideways or radially, and diffract laser light into beams which include +1, -1 and zero order beams. The diffraction grating is in the input plane of a Fourier Transform lens. The beams are brought to a focus in the output plane of the lens and are reflected back towards the lens by a mirror placed in the transform plane of the lens. The sample whose refractive index is to be measured is placed in the path of the +1 or -1 order beam, between the diffraction grating and the mirror.
    Type: Grant
    Filed: February 5, 1990
    Date of Patent: December 24, 1991
    Assignees: Agency of Industrial Science and Technology, Ministry of International Trade and Industry
    Inventors: Thomas H. Barnes, Kiyofumi Matsuda, Naotake Ooyama
  • Patent number: 5067815
    Abstract: An optical sensor with intermodal interferometry, using a bimodal optical fiber propagating a first mode and giving rise to a second mode coupled to the first in response to a disturbance cause by a physical or chemical quantity of which it is wished to determine the position along the optical fiber by compensating the difference in the delay time between modes at the input of the interferometer.
    Type: Grant
    Filed: September 13, 1990
    Date of Patent: November 26, 1991
    Assignee: Centre Suisse d'Electronique et de Microtechnique S.A.
    Inventors: Georges Kotrotsios, Olivier Parriaux
  • Patent number: 5059026
    Abstract: An interferometric device for the detection of substances having a periodic or quasiperiodic absorption structure of their absorption spectrum includes a source of radiation, a chamber containing the material to be investigated and a downstream detector, a thermo-optically effective and temperature controlled interference filter means is interposed, its thickness determines the spacing of interference transmission lines and temperature control shifts these lines.
    Type: Grant
    Filed: July 12, 1990
    Date of Patent: October 22, 1991
    Assignee: Hartmann & Braun AG
    Inventor: Michael Zoechbauer