Abstract: Methods and apparatus are disclosed for integration of image-based metrology into a milling workflow. A first ion beam milling operation is performed to an edge at a distance from a final target position on a sample. An SEM image of the sample is used to determine a distance between the milled edge and a reference structure on the sample. Based on the determined distance, the ion beam is adjusted to perform a second milling operation to shift the milled edge to the final target position. Extensions to iterative procedures are disclosed. Various geometric configurations and corrections are disclosed. Manufacturing and analytic applications are disclosed in a variety of fields, including read-write head manufacture and TEM sample preparation. Other combinations of imaging and milling tools can be used.

Abstract: The disclosed solution comprises an injection subassembly that includes a nicked alignment tube, a spray needle, and a conducting liquid tube. The nicked alignment tube has a nick near one end. The spray needle is fused within the nicked end of the nicked alignment tube and the fused spray needle and nicked alignment tube are inserted into the conducting liquid tube, where the nicked alignment tube aligns the spray needle coaxially within the conducting liquid tube. The nick and the entry end of the spray needle are positioned within the conducting liquid tube and the exit end of the spray needle extends out of the conducting liquid tube. The nick allows a conducting liquid to flow from the conducting liquid tube to within the nicked alignment tube and the spray needle. Also disclosed are a unitary optical-ESI system equipped with the injection subassembly and a method for using the same.

Abstract: A method for altering surface charge on an insulating surface of a first sample includes generating first plasma inside a plasma source, causing the first plasma to diffuse into a first vacuum chamber to generate second downstream plasma, immersing the first sample in the second downstream plasma, and applying a first bias voltage to a conductive layer of the first sample, or applying a first bias voltage to a metal holder that holds the first sample.

Abstract: Aspects of the present disclosure describe techniques for using a parabolic Cassegrain-type reflector for ablation. For example, a system for ablation loading of a trap is described that includes a reflector having a hole aligned with a loading aperture of the trap, and an atomic source positioned at a focal point of the reflector, where one or more laser beams are reflected from a reflective front side of the reflector and focused on a surface of the atomic source to produce an atomic plume, and the atomic plume once produced passing through the hole in the reflector and through a loading aperture of the trap for loading the trap. A method for ablation loading of a trap within a chamber in a trapped ion system is also described.

Abstract: A method, computer program, and computer system is provided for fault detection in an electrical network. An inductance between a reference point and a fault is determined at a first time based on measuring a fault current. A resistance between the reference point and the fault may be determined at a second time based on measuring a differential of the fault current as zero. A location of the fault may be identified based on the inductance and the resistance.

Abstract: Systems and methods are provided for testing a threshold energy required to cause a latchup on an electronic component. An exemplary method includes applying a series of laser pulses to a testing object with a pulsed laser unit. The testing object is connected to a testing circuit which can measure the energy of each of the series of laser pulses, and detect whether a pulse of the series of laser pulses resulted in a latchup on the testing object. Upon detecting the pulse, the method provides for logging the energy of the pulse using a recording unit and logging the latchup status of the test device. If a latchup is detected, the testing circuit automatically mitigates the latchup event.

Abstract: Techniques for calculating a per-tenant cost in a multi-tenant data storage system. In one example, a method comprises the following steps. One or more cost contribution factors associated with a storage provider entity operating a data storage system for a plurality of tenants of the data storage system are identified. One or more cost items chargeable to each of the plurality of tenants are identified, the one or more cost items being associated with usage of the data storage system by each of the plurality of tenants. The one or more cost contribution factors associated with the storage provider entity are correlated with the one and more chargeable cost items for each of the plurality of tenants. A respective cost value payable by each tenant is determined based on the correlation step. In one further example, the methodology calculates a fixed energy cost associated with storing tenant data and a dynamic energy cost associated with the tenant accessing the stored data.

Abstract: A method for accurate fault location in a multi-type cable connection system is provided that includes, first normalizing the measurement parameters, then grouping the data, calculating compensation correction, finding the maximum value of the data, and comparing whether the cable has faults or not. By means of a blended data automatic analysis algorithm of the method, in the presence of multiple cables, data obtained through one-time measurement can be accurately identified to determine specific data of each scanning point that belongs to each cable, and after data allocation is completed, each group of data is separately corrected by using cable parameters corresponding to the group of data, thereby obtaining an accurate fault position and a DTF return loss result.

Abstract: A measurement system includes a source unit to provide a source signal to a sample and a voltage source and/or a current source and a memory. The system also includes a measurement unit configured to acquire from the sample an measurement signal that may be responsive to the source signal and a voltage measuring unit, a current measuring unit, and/or a capacitance measuring unit, and a memory. The system also includes a control unit including a digital signal processing unit; a source converter; a measurement converter. The system further includes a synchronization unit configured to synchronize clocks of the digital signal processing unit, the source converter, the measurement converter, the source unit, and the measurement unit; a calibration unit for calibrating aspects of the system including the control unit; and a reference voltage supply configured to supply a common reference voltage for the control unit.

Abstract: A device including a first voltage domain and a second voltage domain is provided, the voltage domains being separated by an isolation barrier. In addition, the device includes a scratch detection circuit including a first and a second electrode at a distance of less than 2 ?m.

Abstract: An active isolation detection method may be used with an electrical system having a battery pack connected to a high-voltage bus. The bus has positive and negative bus rails, each having a respective rail-to-ground voltage. The method may include connecting variable resistance element to the high-voltage bus, and determining input information indicative electrical characteristics of the battery pack, the high-voltage bus, and/or a charging station. The method includes varying a bias resistance of the high-voltage bus, via control of the variable resistance element, e.g., via duty cycle control of a binary switch in series with a bias resistor, to produce a varied bias resistance based on the input information. A target voltage shift is achieved on the high-voltage bus as a target level of change in one of the rail-to-ground voltages. An isolation resistance of the electrical system is determined via the controller using the varied bias resistance.

Abstract: A modular power tile and method of operating a power distribution system includes generating a predetermined identifying pattern, by a reflectometry module of a power distribution node, injecting, by the reflectometry module, the predetermined identifying pattern, receiving, at the reflectometry module, a reflected incident signal of the predetermined identifying pattern, and scheduling a maintenance task.

Abstract: A method for altering surface charge on an insulating surface of a first sample includes generating first plasma inside a plasma source, causing the first plasma to diffuse into a first vacuum chamber to generate second downstream plasma, immersing the first sample in the second downstream plasma, and applying a first bias voltage to a conductive layer of the first sample, or applying a first bias voltage to a metal holder that holds the first sample.

Abstract: A system for self-discharge prognostics for vehicle battery cells with an internal short circuit includes a plurality of battery cells and a voltage sensor providing open-circuit voltage data over time for each battery cell. The system further includes a computerized prognostic controller operating programming to monitor the open-circuit voltage data over time for each of the plurality of battery cells and evaluate a voltage drop rate through a time window for each of the plurality of battery cells based upon the open-circuit voltage data. The controller further identifies one of the plurality of battery cells to include the internal short circuit based upon the voltage drop rate and signals an alert based upon the one of the plurality of battery cells including the internal short circuit.

Abstract: A first object for assembly with a second object, the first object comprising: a body having a first mating portion; and a first electronic element fabricated on the body; wherein the first electronic element is provided to establish an electrical coupling with a second electronic element fabricated on one of: the body and the second object, wherein a second mating portion is provided on the second object, and wherein the electrical coupling is configured to provide a measurable output for positioning the first mating portion at a desired position relative to the second mating portion according to an analysis of the measurable output against a predetermined reference output.

Abstract: A hairpin type stator inspection apparatus is provided for testing performance of a stator wound with hairpin type stator coils. The hairpin type stator inspection apparatus includes: a conveyor provided on a frame for transferring the stator including a plurality of stator terminals along a predetermined path: a plurality of clamp terminals, which are installed to be movable to the frame by a driver in up and down, front and rear, and left and right directions in order to clamp the stator terminals: a controller that applies a driving control signal to the driver to change a position of the clamp terminals according to a position of the stator terminals; and an inspection portion that applies power to the stator terminals through the clamp terminals and inspects the electrical circuit of the stator.

Abstract: A touch control test device and a touch control test method are provided, and the touch control test device includes: a telescopic mechanism with an adjustable length; a touch control component connected to the telescopic mechanism so that the telescopic mechanism is configured to drive the touch control component to tap the touch screen; an acquisition unit configured to acquire an actual detection coordinate point where the touch control component taps the touch screen; a calculation unit configured to calculate a touch control coordinate error between a target coordinate point corresponding to the actual detection coordinate point where the touch control component taps the touch screen and the actual detection coordinate point. The touch test device can achieve a tap touch control test of the touch screen.

Abstract: An ion mobility filter is disclosed. The present invention relates to but not exclusively a field asymmetric ion spectrometry filter. For example, we describe an ion filter for filtering ions in a gas sample. The ion filter is comprised of a plurality of electrodes, a first ion channel, and a second ion channel. The first ion channel filters ions from a target chemical in the gas sample, defines a gap between a first pair of electrodes in the plurality of electrodes, and has a first ion channel gap width. The second ion channel filters ions from the target chemical in the gas sample, defines a gap between a second pair of electrodes in the plurality of electrodes, and has a second ion channel gap width. The first ion channel gap width is greater than the second ion channel gap width.

Abstract: An apparatus for forming a color image of a scene and a method for utilizing that apparatus are disclosed. The apparatus includes a plurality of pixel sensors. Each pixel sensor includes a first photodetector includes first main photodiode and a first floating diffusion node. The first main photodiode is characterized by a first light conversion efficiency as a function of wavelength of a light signal incident thereon. The first floating diffusion node includes a parasitic photodiode characterized by a second light conversion efficiency as a function of the wavelength. The second light conversion efficiency is different from the first light conversion efficiency as a function of wavelength. A controller generates an intensity of light in each of a plurality of wavelength bands for the pixel sensor utilizing a measurement of the light signal by each of the first main photodiode and the first parasitic photodiode in that photodetector.

Abstract: Provided herein are approaches for decreasing particle generation in an electrostatic lens. In some embodiments, an ion implantation system may include an electrostatic lens including an entrance for receiving an ion beam and an exit for delivering the ion beam towards a target, the electrostatic lens including a first terminal electrode, a first suppression electrode, and a first ground electrode disposed along a first side of an ion beamline, wherein the first ground electrode is grounded and positioned adjacent the exit. The electrostatic lens may further include a second terminal electrode, a second suppression electrode, and a second ground electrode disposed along a second side of the ion beamline, wherein the second ground electrode is grounded and positioned adjacent the exit. The implantation system may further include a power supply operable to supply a voltage and a current to the electrostatic lens for controlling the ion beam.