Abstract: An apparatus for detecting excessive chafing of a cable arrangement against an electrically grounded structure includes a layer of semiconductive material positioned in surrounding relation with an elongated member such as an electrical cable, tube or hose. A layer of electrically insulating material surrounds the layer of semiconductive material. A detector circuit is electrically connected with a reference end portion of the semiconductive layer. The detector circuit is operable to detect at least momentary contact between the layer of semiconductive material and an electrically grounded structure due to erosion of the layer of electrically insulating material surrounding the semiconductive layer caused by excessive chafing of the layer of electrically insulating material against the ground structure.

Abstract: An inflatable eddy current inspection probe having a molded central body embedding therein a plurality of eddy current coils and the leads therefore. The central body is expanded at will by introduction of water or air through a pressure hose connected to the central body to produce effective contact between the coils and the inside wall of a tube.