Patents Examined by Robert P Alejnikov
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Patent number: 11162985Abstract: An electronic measuring device includes a main printed circuit assembly and one or more channel modules. At least one channel module includes a channel printed circuit board and a first insulating housing that defines a cavity covering at least part of electrical elements mounted on the channel printed circuit board. A first conductive shielding frame is placed on the first insulating housing and is separated from the channel printed circuit board by the first insulating housing. The first conductive shielding frame covers the electrical elements mounted on the channel printed circuit board. A second insulating housing sandwiches the first conductive shielding frame between the second insulating housing and the first insulating housing which lengthens an electrical path from the first conductive shielding frame to the channel printed circuit board.Type: GrantFiled: January 24, 2020Date of Patent: November 2, 2021Assignee: Fluke CorporationInventors: Yinhong Yang, Jinbo He, Zhangyan Zhao
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Patent number: 11162982Abstract: A current detection device includes a plane-shaped first coil pattern having a winding number of at least two or more, a magnetic field detection element isolated from the first coil pattern in a direction orthogonal to a plane of the first coil pattern, and arranged to receive a magnetic field formed by the first coil pattern, a driving circuit configured to drive the magnetic field detection element and output an output signal, a second coil pattern, a first substrate on the first coil pattern, a second substrate on the second coil pattern, and a third substrate on the magnetic field detection element. The magnetic field detection element is provided between the first coil pattern and the second coil pattern.Type: GrantFiled: September 10, 2019Date of Patent: November 2, 2021Assignees: Kabushiki Kaisha Toshiba, Toshiba Electronic Devices & Storage CorporationInventors: Jia Liu, Toshihiro Tsujimura
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Patent number: 11156643Abstract: A current sensor including a measurement circuit and an electrical conductor having at least one first measurement path defined by a first pickup contact and a second pick-up contact at which a first voltage can be detected across the first measurement path, a first connection contact for electrically contacting a connection element, a second connection contact for electrically contacting a battery pole terminal, and a current feed contact for electrically contacting a device for providing a calibration current. The first measurement path is in series between the first connection contact and the second connection contact. A calibration current supplied at the current feed contact induces a current density distribution in the first measurement path, which converges with a current density distribution in the first measurement path, induced by a load current of equal current intensity supplied at the first connection contact.Type: GrantFiled: February 28, 2018Date of Patent: October 26, 2021Assignee: CONTINENTAL AUTOMOTIVE GMBHInventors: Martin Schramme, Ralf Schröppel, Andreas Aumer
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Patent number: 11131689Abstract: Embodiments herein describe structures of low-force wafer test probes and formation thereof. Structures of low-force wafer test probes and their formation via gray scale etch or electroplating is described. Structures are described that include a lower base structure on top of a substrate and an upper blade structure on top of the lower base structure. In various embodiments, a crown of a C4 bump is accommodated by one or both of: i) a cavity present in the lower base structure; and ii) a height of the upper blade structure. Processes for fabricating probe structures are described that include forming lower base structures upon a substrate and forming upper blade structures on top of the lower base structures. The upper blade structures include at least one blade. Each of the blade(s) include a cutting edge that points toward a center point within the probe structure.Type: GrantFiled: May 25, 2017Date of Patent: September 28, 2021Assignee: International Business Machines CorporationInventors: David M. Audette, S J. Chey, Doreen D. DiMilia, Sankeerth Rajalingam, Grant Wagner
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Patent number: 11131719Abstract: A method monitors an electrical assembly which contains a plurality of electrical coils connected in parallel. In the method, the difference in current between the current flowing through the coils and the mean value of the currents flowing through the coils is ascertained for each of the coils connected in parallel. The differences in current are used to identify when an inter-turn short circuit occurs in one of the coils.Type: GrantFiled: May 17, 2018Date of Patent: September 28, 2021Assignee: Siemens Energy Global GmbH & Co. KGInventors: Christoph Armschat, Klaus Pointner
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Patent number: 11125832Abstract: A Multi-Phase Simulation Environment (“MPSE”) is provided which simulates the conductor current and voltage or electric field of multiple phases of an electrical power distribution network to one or more sensing or measuring devices and includes independent control of wireless network connectivity for each sensing or measuring device, independent control of GPS RF to each device, and interface to a back-end analytics and management system.Type: GrantFiled: December 13, 2019Date of Patent: September 21, 2021Assignee: Sentient Technology Holdings, LLCInventor: Steven Charles Petit
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Patent number: 11119143Abstract: A device and method for measuring the internal impedance of an electronic sensor uses configurable gain stages to selectively apply different excitation signals to the sensor under test in order to ensure adequate signal-to-noise ratio to provide accurate measurement of the internal impedance over a broader range of internal impedances than the prior art.Type: GrantFiled: September 26, 2019Date of Patent: September 14, 2021Assignee: Analog Devices International Unlimited CompanyInventors: GuangYang Qu, Yincai Tony Liu, Baotian Hao, Hanqing Wang, Hengfang Mei, Rengui Luo, Yimiao Zhao, Junbiao Ding
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Patent number: 11112522Abstract: Self-testing proximity testing systems and corresponding methods are discussed herein and can include a proximity probe and controller in electrical communication via a cable. A self-testing subsystem can be in communication with the controller and configured to determine whether proximity probes and cables assembled with a controller are compatible or incompatible. The self-testing subsystem can place a known impedance in electrical communication with the controller, modifying a proximity signal output by the controller. When the modified proximity signal differs from a predicted proximity signal by greater than or equal to a threshold amount, the self-testing subsystem can output a first indication indicating that incompatible proximity probes and cables are assembled with a controller.Type: GrantFiled: November 15, 2019Date of Patent: September 7, 2021Assignee: Bendy Nevada, LLCInventors: Dan Tho Lu, David Lopez
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Patent number: 11112435Abstract: An electrical current transducer including a housing, a magnetic core comprising a central passage and a magnetic circuit gap, a magnetic field detector positioned in the magnetic circuit gap, and a leadframe conductor arrangement comprising a primary conductor for carrying the current to be measured and magnetic field detector conductors for connecting the magnetic field detector to an external circuit.Type: GrantFiled: October 14, 2016Date of Patent: September 7, 2021Assignee: LEM International SAInventors: Jean Marc Peccoux, David Barbagallo, Pascal Morel
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Patent number: 11105863Abstract: A method and system for re-using the electrical energy of an electronic component under test. The method and system includes combining a first direct current voltage output of an electronic component under test with a second direct current voltage of a device. The combined first direct current voltage and second direct current voltage are regulated to create a power. The power functions a system application. At least one metric of the electronic component under test is monitored.Type: GrantFiled: January 9, 2019Date of Patent: August 31, 2021Assignee: International Business Machines CorporationInventors: Marc Coq, Randhir S. Malik
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Patent number: 11105844Abstract: Power control arrangements for integrated circuit devices are discussed herein. In one example, an assembly includes an integrated circuit device comprising one or more processing cores and a power domain configured to distribute a supply voltage to the one or more processing cores. The assembly also includes a charge injection circuit coupled to the power domain of the integrated circuit device, and configured to selectively couple electric charge into the power domain to predictively offset at least portions of voltage transients in the power domain.Type: GrantFiled: June 28, 2019Date of Patent: August 31, 2021Assignee: Microsoft Technology Licensing, LLCInventors: William Paul Hovis, Gregory M. Daly, Rich Tat An, Andres Felipe Hernandez Mojica, Garrett Douglas Blankenburg
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Patent number: 11105875Abstract: A method for a NMR device to determine NMR measurement results of a sample from a set of RF signals emitted by the sample and received by the NMR device is disclosed. The method can include: receiving a plurality of RF signals emitted by the sample; determining a phase shift of each signal of the plurality of RF signals; correcting a phase of each signal of the plurality of RF signals; determining a frequency shift of each signal of the plurality of RF signals; shifting each signal of the plurality of RF signals to the predetermined; correcting an additional phase shift of each signal of the shifted plurality of RF signals to generate corresponding plurality of corrected RF signals; and averaging the corrected RF signals to determine the NMR measurement result. In some embodiments, the receiving, determining, correcting, shifting and/or averaging is done by the NMR device.Type: GrantFiled: April 7, 2017Date of Patent: August 31, 2021Assignees: Aspect Imaging Ltd., Aspect AI Ltd.Inventors: Itai Cohen, Yoram Cohen, Tal Cohen
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Patent number: 11099216Abstract: Circuits and methods relating to shunt current sensing are provided. A shunt current sensing circuit comprises a shunt resistor for receiving a shunt current. A filtering stage is connected to the shunt resistor and is configured to filter the shunt current. A current sense amplifier is connected to the filtering stage and is configured to receive the filtered shunt current from the filtering stage. The current sense amplifier is configured to sense the filtered shunt current to produce an output voltage. The filtering stage is configured to filter the shunt current such that the output voltage produced by the current sense amplifier (U2) is substantially proportional to the shunt current.Type: GrantFiled: March 3, 2016Date of Patent: August 24, 2021Assignee: Kongsberg Inc.Inventor: Nikolai Panine
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Patent number: 11092632Abstract: A resistance-measuring device mountable to a component of a current-carrying transmission line. The device includes a body having a base and two arms with interconnected first ends and spaced-apart second ends. The arms define a gap therebetween. Each arm has an inner portion facing the gap. The body is displaceable to mount the body about the component and position the component within the gap. The body has an abrading mechanism mounted to the arms. The abrading mechanism has an electrically-conductive abrading element disposed along the arm and facing inwardly toward the gap. The abrading element rubs against an outer surface of the component upon displacing the body to mount the body about the component. A method is also disclosed.Type: GrantFiled: September 29, 2017Date of Patent: August 17, 2021Assignee: HYDRO-QUEBECInventors: Samuel Lavoie, Ghislain Lambert
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Patent number: 11092654Abstract: The systems determine the parasitic capacitance of a signal path. That parasitic capacitance is then used to determine a leakage characteristic of the signal path, such as leakage current or leakage resistance. The capability of ATE channels to force current accurately, and to measure time intervals at prescribed voltages, can be used to multiply the accuracy of the force current function. Using these resources, small leakage currents—for example, on the order of 10 nA or less—can be measured.Type: GrantFiled: June 28, 2019Date of Patent: August 17, 2021Assignee: Teradyne, Inc.Inventor: Marc Spehlmann
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Patent number: 11067657Abstract: Methods for operating a magnetic resonance apparatus and systems therefrom are provided. A method includes generating, via a coil former surrounding a subject or object of interest and disposed in the magnetic resonance apparatus, a plurality of field modes external to the subject or object, measuring for each of the plurality of external field modes, an associated internal field produced within the subject or object, generating, via the coil former a combination of external modes to produce a target internal field in the subject or object, and measuring nuclear magnetic resonance signals due to the resulting field from the combination to acquire an image or spectrum of the subject or object.Type: GrantFiled: April 18, 2017Date of Patent: July 20, 2021Assignee: VANDERBILT UNIVERSITYInventors: Adam W. Anderson, John Gore
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Patent number: 11061100Abstract: A system comprises a calibration current generator, which provides a calibration current to a first and a second Hall channel, and a bias current generator, which determines a difference between a calibration signal from the Hall channels and a threshold and adjusts a biasing current for the Hall channels based on the difference. In some embodiments, the bias current generator comprises a subtractor coupled to an ADC and a controller coupled between the ADC and a DAC. The subtractor obtains a first and a second signal from the first and second Hall channels, respectively, and subtracts the first from the second to obtain the calibration signal. The controller determines the difference between a sampled signal from the ADC and the threshold and an adjustment to the biasing current based on the difference. The DAC adjusts the biasing current based on a control signal from the controller indicating the adjustment.Type: GrantFiled: September 20, 2019Date of Patent: July 13, 2021Assignee: TEXAS INSTRUMENTS INCORPORATEDInventors: Tony Ray Larson, Dimitar Trifonov, Chao-Hsiuan Tsay, Partha Sarathi Basu
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Patent number: 11054485Abstract: A power supply monitoring apparatus includes dual supply path controllers. The controllers continuously test the power supply and the supply paths by alternating power states and monitoring the response from the supply path. If an interruption in normal operation is sensed in one supply path, information regarding the abnormality can be sent to the other controller, thereby allowing for continued operation and monitoring despite the failure of a supply path.Type: GrantFiled: July 29, 2019Date of Patent: July 6, 2021Assignee: JTEKT CorporationInventor: Takanori Ito
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Patent number: 11047883Abstract: A current sensor is disclosed. The current sensor is substantially immune to stray fields due to the orientation of at least two magnetic field sensors and their respective axes of maximum sensitivity, as well as a total current sensor output that is a weighted difference of the individual magnetic field sensor outputs. The specific orientation of the magnetic field sensors allows for the current sensor to be smaller than known sensors of similar sensitivity.Type: GrantFiled: December 12, 2019Date of Patent: June 29, 2021Assignee: MELEXIS TECHNOLOGIES SAInventor: Javier Bilbao de Mendizabal
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Patent number: 11047903Abstract: A display panel and a method for testing for an occurrence of a crack in a display panel are provided. The display panel includes a panel body, a ground line, a first ground connecting portion, a first testing portion, a second ground connecting portion, a second testing portion, and a switch. By measuring a voltage, a resistance, or a current between the first testing portion and the second testing portion, an open circuit in the ground line and a crack in a non-display area can be detected. Therefore, difficulty of confirming if a crack occurs in the display panel is reduced.Type: GrantFiled: April 26, 2019Date of Patent: June 29, 2021Assignee: Wuhan China Star Optoelectronics Technology Co., Ltd.Inventors: Xin Zhang, Jingfeng Xue, Siwen Miao