Patents Examined by Roberto Velez
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Patent number: 12644918Abstract: A testing device for testing a high or medium-voltage cable comprises a circuit arrangement with a test voltage generator, which comprises a low voltage-side earthing input and a high voltage-side output and is designed to provide a variable test voltage, a test specimen connection for connecting the high voltage-side output to a conductor of the cable, a protective earth connector for connecting to protective earth, a connecting conductor which electrically connects the low-voltage-side earth input to the protective earth connector, so that the connecting conductor represents a current collection point through which a measuring current flows during the test, and a high-frequency signal pick-up at the current collection point, at which a high-frequency pre-location signal is generated based on the measuring current.Type: GrantFiled: March 19, 2024Date of Patent: June 2, 2026Assignee: b2 electronics GMbHInventors: Stefan Baldauf, Christian Mathies, Joseph Kruijen
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Patent number: 12631781Abstract: A method and/or system comprising: disposing a bottom hole assembly into a wellbore, wherein the bottom hole assembly comprises: a transmitter sub comprising a transmitter coil; a first receiver sub comprising a first receiver coil; transmitting an electromagnetic wave into a subterranean formation with the transmitter coil; receiving a plurality of response signals with the first receiver coil, wherein the plurality of response signals are from two or more depths and are formed from the electromagnetic wave interacting with the subterranean formation. Additionally, the method and/or system may be configured to analyze a gradient of the response signals to determine if the gradient exceeds a threshold, wherein the threshold indicates a presence of a fracture or fault.Type: GrantFiled: December 27, 2023Date of Patent: May 19, 2026Assignee: Halliburton Energy Services, Inc.Inventors: Hsu-Hsiang Wu, Jin Ma, Yi Jing Fan
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Patent number: 12631680Abstract: This application discloses a testing structure for locating a source of a plasma damage. A testing substructure corresponding to a selected metal layer includes a first MOS transistor, a first gate lead, a first antenna and a monitoring gate pad. The first gate lead is composed of a metal wire of the selected metal layer. The first antenna is connected with the first gate lead. The first gate lead is connected with a first gate conductive material layer of the first MOS transistor. The first antenna, the first gate lead and the first gate conductive material layer form a first pathway for accumulating plasma charges towards a surface of a first gate dielectric layer. The monitoring gate pad is connected with the first gate lead. This application further discloses a testing method for locating a source of a plasma damage. This application can locate the source of the plasma damage.Type: GrantFiled: August 20, 2024Date of Patent: May 19, 2026Assignee: Shanghai Huali Microelectronics CorporationInventors: Yekai Zhu, Yueqin Zhu, Ke Zhou
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Patent number: 12625165Abstract: [Problem] The objective is to provide a probe card that are less prone to contact failure, with good high-frequency characteristics, current endurance, and good conductivity.Type: GrantFiled: December 6, 2021Date of Patent: May 12, 2026Assignee: JAPAN ELECTRONIC MATERIALS CORPORATIONInventor: Chikaomi Mori
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Patent number: 12625162Abstract: A test socket is provided and includes a base with a first surface, a second surface opposing the first surface and through holes, a conductive elastic sheet located on the first surface, and a plurality of elastic metal members with first contact ends facing toward the conductive elastic sheet. The first contact ends include bumps suitable for inserting into the conductive elastic sheet, and each elastic metal member may be prevented from being contaminated by covering the base with the conductive elastic sheet. When the elastic metal members are pressured to insert the bumps into the conductive elastic sheet, a low resistance better than the resistance of the elastic metal members without squeezing can be obtained. When the bumps are inserted into the conductive elastic sheet, the surface of the bumps can be cleaned and the elastic metal members are stably in contact with the conductive elastic sheet.Type: GrantFiled: February 15, 2024Date of Patent: May 12, 2026Assignee: WinWay Technology Co., Ltd.Inventors: Po-Han Yeh, Chia-Pin Sun
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Patent number: 12618869Abstract: Provided is a rotating body inspection apparatus for an electrification component, the rotating body inspection apparatus including a main sprocket on which a rotating body is seated and which is shaped as a disk and rotates, a sub sprocket shaped as a disk and rotating, a connection portion connecting the main sprocket to the sub sprocket, and a linear conversion portion which is connected to the sub sprocket and which converts a rotational movement into a linear movement, wherein a diameter of the sub sprocket is less than a diameter of the main sprocket.Type: GrantFiled: December 19, 2022Date of Patent: May 5, 2026Assignee: VIEWON CO., LTD.Inventors: Young Wook Yoon, Young Yeop Yoon
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Patent number: 12618870Abstract: Proposed is a vertical probe card capable of effectively testing the electrical characteristics of a test object without a body thereof being elastically bent or curved in a convex shape in the horizontal direction by pressure applied to opposite ends thereof.Type: GrantFiled: July 29, 2022Date of Patent: May 5, 2026Assignee: POINT ENGINEERING CO., LTD.Inventors: Bum Mo Ahn, Seung Ho Park, Sung Hyun Byun
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Patent number: 12618873Abstract: Systems and Methods for capacitance testing of a unit under test with parasitic capacitance directed to a guard rail. The system includes test points, wherein the plurality of test points are divided into at least two groups; a stimulus source; a first group guard relay electrically connected to each of the test points in a first; a second group guard relay electrically connected to each of the test points in a second; a guard rail coupled to the first group guard relay and the second group guard relay; a first group return relay electrically connected to each of the test points in a first group; a second group return relay electrically connected to each of the test points in a second group; a current measurement rail coupled to the first group return relay and the second group return relay; a current meter coupled to the measurement rail; and a controller.Type: GrantFiled: November 6, 2025Date of Patent: May 5, 2026Assignee: DIT-MCO International LLCInventors: David Alan Shier, Patrick Noll
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Patent number: 12613258Abstract: A housing part (10) for a sensor has a transparent, hollow base body which has a toothing (14) in the form of a straight-toothed gearwheel in a circular-cylindrical emission region on its lateral surface. A circuit board of the sensor is partially arranged in the housing part (10). The circuit board has at least one light source which faces the emission region.Type: GrantFiled: December 12, 2023Date of Patent: April 28, 2026Assignee: BALLUFF GMBHInventors: Thorsten Krayer, Paul Ludyga, Peter Petrovics, Lukas Foll, Holger Haupt, Jurgen Schiller, Matthias Hofmann
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Patent number: 12607692Abstract: The system disclosed comprises an apparatus and a method for the detection and quantification of targeted molecules in vivo. The apparatus comprises an implantable biosensor and an AC magnetic detection device. The implantable biosensor includes functionalized nanoparticles functionalized with one or more moieties that bind to a molecular target of interest. The nanoparticles are retained in a biocompatible container which allows the molecular target of interest to enter the biosensor, for example through a semipermeable port. The biosensor can be implanted minimally-invasively into humans or animals. Upon exposure of the nanoparticles to the molecular target, a change in Neel relaxation time can be externally detected and correlated to the target analytes concentration.Type: GrantFiled: November 1, 2022Date of Patent: April 21, 2026Assignee: Lodestone Biomedical Inc.Inventors: Christian Knopke, Solomon G. Diamond
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Patent number: 12584950Abstract: The present invention relates to a positioning apparatus for positioning a device under test—DUT—, the positioning apparatus comprising: a support structure extending over an horizontal plane, and a mast structure, which is elongated in shape and configured to contact the support structure, wherein the mast structure is movable along a pivoting axis between a first position, where the mast structure is perpendicular to the horizontal plane, and a second position, where the mast structure is parallel to the horizontal plane.Type: GrantFiled: December 7, 2023Date of Patent: March 24, 2026Assignee: Rohde & Schwarz GmbH & Co. KGInventors: Constantin Schwerdtfeger, Stefan Schoetz, Stefan Apfelbeck
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Patent number: 12578407Abstract: Techniques, systems and apparatus are described for magnetic resonance imaging. A method includes applying a radio frequency (RF) signal of a predetermined time duration towards a target, wherein the RF signal comprises a composite pulse that includes a velocity-selective pulse comprising RF pulses whose phase shift is modulated over the predetermined time duration, acquiring a magnetic resonance signal from the target resulting from the application of the RF signal, and generating an MRI image of the target from the magnetic resonance signal.Type: GrantFiled: April 1, 2022Date of Patent: March 17, 2026Assignee: The Regents of the University of CaliforniaInventor: Jia Guo
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Patent number: 12578290Abstract: Systems and techniques are provided for determining a time zero echo of a nuclear magnetic resonance (NMR) sequence. An example method includes obtaining, via an NMR tool in a borehole, echo waveforms associated with refocusing pulses and a free induction decay (FID) waveform associated with an excitation pulse; determining echo values based on the echo waveforms and an apparent time-zero echo value based on the FID waveform, the apparent time-zero echo value representing a time zero echo; applying a correction factor to the apparent time-zero echo value to yield a corrected time zero echo value; and determining a spectrum associated with a sample based on an inversion performed on the corrected time zero echo values and the set of echo values before or after a conversion of the corrected time zero echo value and the set of echo values to porosity units, the conversion of the corrected time zero echo value and the set of echo values being based on one or more conversion factors.Type: GrantFiled: April 25, 2024Date of Patent: March 17, 2026Assignee: HALLIBURTON ENERGY SERVICES, INC.Inventors: Jie Yang, Rebecca Jachmann, Boguslaw Wiecek
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Patent number: 12578377Abstract: According to an embodiment, a circuit for transistor gate stress testing is proposed. The circuit includes a first p-channel MOSFET with its drain linked to the transistor's gate; a second p-channel MOSFET coupling its source to the first p-channel MOSFET's source at a node and its drain to a supply voltage; a first n-channel MOSFET with its source to ground and drain to the transistor's gate; a second n-channel MOSFET with its source to ground and drain to the second p-channel MOSFET's gate; a third p-channel MOSFET with its source and drain bridging the node to the second n-channel MOSFET's drain; a fourth p-channel MOSFET in trans-diode setup, its gate to the third p-channel MOSFET's gate and source to the supply rail; plus a current source placed between the fourth p-channel MOSFET's drain and ground.Type: GrantFiled: April 8, 2024Date of Patent: March 17, 2026Assignee: STMicroelectronics International N.V.Inventors: Sandro Rossi, Niccolò Brambilla, Francesco Franco, Valeria Bottarel
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Patent number: 12566121Abstract: A system may analyze agricultural materials. The system may include one or more inlets receiving the agricultural materials. The agricultural materials may be a slurry (e.g., soil slurry) including at least one solid and at least one liquid. The system may include a chamber configured to house the agricultural materials. The chamber may include a mixing device configured to mix the agricultural materials. The system may include a flow control device configured to stop the flow of the agricultural materials in a first state, or move the flow of the agricultural materials in a second state. The system may include an agricultural materials density device configured to determine the density of the agricultural materials when the flow of the agricultural materials is stopped in the first state and when the flow of the agricultural materials is moving in the second state.Type: GrantFiled: May 13, 2022Date of Patent: March 3, 2026Assignee: Precision Planting LLCInventors: Kent Levy, Reid Harman, Joshua Seelye, Adam Vaccari, Riley Litwiller, Dale M. Koch
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Patent number: 12566210Abstract: Testing a gasket within a groove formed around a top of an enclosure and covered by a lid, including steps of: positioning a needle of a probe within a notch formed in an outer wall that surrounds the groove; and: injecting input current through the probe; comparing input voltage from the probe in the notch and an output voltage induced in conductive fasteners that secure the lid to the enclosure, to determine that a difference in the voltages is within a predetermined range, where voltage at the fasteners is measured with another probe; or injecting the input current into the fasteners; and comparing the input voltage at the fasteners with the output voltage induced in the gasket and measured via the probe in the notch, to determine that the difference in the voltages is within the predetermined range, where voltage at the fasteners is measured with the another probe.Type: GrantFiled: October 5, 2023Date of Patent: March 3, 2026Assignee: HAMILTON SUNDSTRAND CORPORATIONInventors: Rajkumar Sengodan, Debasis Rout
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Patent number: 12566192Abstract: Multi-band remotely configurable tuning probes for slide screw impedance tuners allow instantaneous larger frequency coverage beyond the capacity of existing tuning probes using the single horizontal and vertical axis mechanism of a prior art single probe, single band tuner. This is done by carving multiple slugs of different length and frequency coverage as segments of a disc-shaped revolving slab, which rotates inside the legs of a captive unit and locks at distinct angles. The captive unit is attached to the vertical control mechanism of the tuner and rotation is ensured using multiple traverse lateral studs on the disc unit and a set of vertical studs on the slabline close to the idle port of the tuner. An automated procedure ensures remote switching between tuning slugs. Calibration and tuning is as in prior art single probe tuners.Type: GrantFiled: March 26, 2024Date of Patent: March 3, 2026Inventor: Christos Tsironis
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Patent number: 12566233Abstract: The present disclosure relates to a calibration system for a vector network analyzer (VNA), having a plurality of N ports. The calibration system comprises a distribution unit having a plurality of D?N ports; and a plurality of D?N calibration units, respectively comprising a calibration circuit having first, second and third ports and an isolation circuit having first, second and third ports.Type: GrantFiled: October 10, 2023Date of Patent: March 3, 2026Assignee: ROHDE & SCHWARZ GMBH & CO. KGInventors: Maximilian Friesinger, Thilo Bednorz
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Patent number: 12560629Abstract: A method of manufacturing a contact probe includes: forming external shapes of a plurality of main body part base materials on a plate material, each of the plurality of main body part base materials being connected to a base part via a connection part and used for forming a main body part of a pipe member; forming a plurality of protrusions on each of the plurality of main body part base materials; forming the pipe member by bending each of the plurality of main body part base materials into a C-shape such that the protrusions protrude toward an inner side of the pipe member; assembling the contact probe by inserting first and second plungers and a coil spring into the pipe member connected to the connection part; and cutting the pipe member from the connection part.Type: GrantFiled: February 5, 2024Date of Patent: February 24, 2026Assignee: NHK Spring Co., Ltd.Inventors: Yoshio Yamada, Shuji Takahashi, Jun Kinoshita
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Patent number: 12553848Abstract: A system for monitoring the quality of electrolyte for a battery cell includes a reservoir configured to receive electrolyte, a capacitive sensor disposed in the reservoir, and a control module in communication with the capacitive sensor. The capacitive sensor is configured to sense a capacitance of the electrolyte when received in the reservoir. The control module is configured to receive a signal from the capacitive sensor indicative of the capacitance of the electrolyte, and determine whether the received electrolyte is contaminated based on the capacitance of the electrolyte and a defined threshold. Other example systems and methods for monitoring the quality of electrolyte for battery cells are also disclosed.Type: GrantFiled: January 17, 2024Date of Patent: February 17, 2026Assignee: GM GLOBAL TECHNOLOGY OPERATIONS LLCInventors: Chuanlong Wang, Xiaosong Huang