Abstract: The present disclosure relates to a method and system of developing and executing a test program for verifying a device under test (DUT).

Abstract: A magnetic field sensor for detecting a magnetic field. The sensor includes a magneto-optical material, an excitation light source configured to emit excitation radiation for exciting electronic states of the magneto-optical material, a microwave source configured to generate an electromagnetic field for feeding a resonator structure, a detector configured to detect fluorescent radiation that the magneto-optical material may emit as a result of irradiation with the excitation radiation, a magnetic field generating apparatus arranged and configured to generate a permanent magnetic field in the region of the magneto-optical material, a resonator structure, arranged on a dielectric, configured to shape the electromagnetic field emitted by the microwave source in such a way that a microwave field is created that is suitable for manipulating spin states of the magneto-optical material.

Abstract: In a method for determining a superconducting impedance matched parametric amplifier, a center wavelength parameter, a gain parameter, and a bandwidth parameter of the superconducting impedance matched parametric amplifier are determined. An impedance value of an impedance matching line of the superconducting impedance matched parametric amplifier and a capacitance value of the amplifier are determined based on the wavelength parameter, the gain parameter, and the bandwidth parameter. A line width dimension of a coplanar waveguide of the superconducting impedance matched parametric amplifier is calculated based on the impedance value of the impedance matching line. A stub dimension of the superconducting impedance matched parametric amplifier is calculated based on the impedance value of the impedance matching line and the capacitance value of the amplifier.

Abstract: A test and measurement instrument includes one or more processors to acquire first, second, and third phase drive signals applied to a three-phase motor. A motor drive analyzer performs a direct-quadrature-zero, DQZ, transformation on the acquired first, second, and third phase drive signals to produce direct (D), quadrature (Q), and zero (Z) components, and generates an overlapped DQ phasor plot illustrating the D and Q components along with frequency domain representations of the D and Q components. The motor driver analyzer displays, on a user interface, the generated overlapped DQ phasor plot and an overlapped DQ spectra plot from the frequency domain representations of the D and Q components to enable a user to detect motor defects through visual characteristics of the overlapped DQ phasor and DQ spectra plots. The motor driver analyzer removes an offset and filters the D and Q components prior generating the overlapped DQ phasor plot.

Abstract: A method, a battery management system, and an article of manufacture for testing a battery system are disclosed. The battery system can include a plurality of battery modules. A test process is performed with respect to the battery system via the battery management system that includes a controller device and a plurality of module interface devices. For each battery module of the plurality of battery modules, a respective module interface device of the plurality of module interface devices is operatively coupled to anode and cathode terminals of that battery module. Each module interface device can include a measurement circuit and a switching circuit. The test process can be used to independently connect, disconnect, and measure various operating conditions of the battery modules and load.

Abstract: One exemplary embodiment relates to a circuit which is integrated into a semiconductor substrate and which comprises a lateral field effect transistor having a drift region and a field plate electrode, which is isolated from the drift region by an isolation zone. The integrated circuit further comprises a first terminal, which is coupled to the field plate electrode, for applying a test voltage to the field plate electrode in a test operating mode. An electronic switch is configured to connect the field plate electrode to a circuit node that is at a reference voltage in a normal operating mode of the integrated circuit. The integrated circuit further comprises a second terminal, which is connected to a control terminal of the electronic switch and is configured to receive a control signal for switching on or off the electronic switch.

Abstract: [Problem] The purpose of the present invention is to facilitate the insertion of a probe into two or more guide plates. [Solution] The present invention is provided with: a probe body 600 accommodated in a guide unit 30 for a probe card 1, the guide unit 30 comprising a first guide plate 301 and a second guide plate 302 disposed with a gap therebetween, and supported by a first guide hole 311 of the first guide plate 301 and a second guide hole 312 of the second guide plate 302; and a leader rod 610 that has a substantially linear shape with one end thereof connected to the probe body 600, that is inserted into the first guide hole 301 earlier than the probe body 600, and that can be separated from the probe body 600 after passing through the second guide hole 302.

Abstract: A sensor integrated circuit includes a sensing circuit configured to generate the sensor output signal and a fault circuit to detect a fault and generate a fault signal indicative of the fault. A combined signal indicative of the fault signal when a fault is detected and indicative of a reference voltage associated with the sensor IC at other times is provided at a shared connection of the sensor IC. Embodiments include a current sensor IC and fault detectors configured to detect one or more faults.

Abstract: A testing device for testing a high or medium-voltage cable comprises a circuit arrangement with a test voltage generator, which comprises a low voltage-side earthing input and a high voltage-side output and is designed to provide a variable test voltage, a test specimen connection for connecting the high voltage-side output to a conductor of the cable, a protective earth connector for connecting to protective earth, a connecting conductor which electrically connects the low-voltage-side earth input to the protective earth connector, so that the connecting conductor represents a current collection point through which a measuring current flows during the test, and a high-frequency signal pick-up at the current collection point, at which a high-frequency pre-location signal is generated based on the measuring current.

Abstract: A method and/or system comprising: disposing a bottom hole assembly into a wellbore, wherein the bottom hole assembly comprises: a transmitter sub comprising a transmitter coil; a first receiver sub comprising a first receiver coil; transmitting an electromagnetic wave into a subterranean formation with the transmitter coil; receiving a plurality of response signals with the first receiver coil, wherein the plurality of response signals are from two or more depths and are formed from the electromagnetic wave interacting with the subterranean formation. Additionally, the method and/or system may be configured to analyze a gradient of the response signals to determine if the gradient exceeds a threshold, wherein the threshold indicates a presence of a fracture or fault.

Abstract: This application discloses a testing structure for locating a source of a plasma damage. A testing substructure corresponding to a selected metal layer includes a first MOS transistor, a first gate lead, a first antenna and a monitoring gate pad. The first gate lead is composed of a metal wire of the selected metal layer. The first antenna is connected with the first gate lead. The first gate lead is connected with a first gate conductive material layer of the first MOS transistor. The first antenna, the first gate lead and the first gate conductive material layer form a first pathway for accumulating plasma charges towards a surface of a first gate dielectric layer. The monitoring gate pad is connected with the first gate lead. This application further discloses a testing method for locating a source of a plasma damage. This application can locate the source of the plasma damage.

Abstract: [Problem] The objective is to provide a probe card that are less prone to contact failure, with good high-frequency characteristics, current endurance, and good conductivity.

Abstract: A test socket is provided and includes a base with a first surface, a second surface opposing the first surface and through holes, a conductive elastic sheet located on the first surface, and a plurality of elastic metal members with first contact ends facing toward the conductive elastic sheet. The first contact ends include bumps suitable for inserting into the conductive elastic sheet, and each elastic metal member may be prevented from being contaminated by covering the base with the conductive elastic sheet. When the elastic metal members are pressured to insert the bumps into the conductive elastic sheet, a low resistance better than the resistance of the elastic metal members without squeezing can be obtained. When the bumps are inserted into the conductive elastic sheet, the surface of the bumps can be cleaned and the elastic metal members are stably in contact with the conductive elastic sheet.

Abstract: Provided is a rotating body inspection apparatus for an electrification component, the rotating body inspection apparatus including a main sprocket on which a rotating body is seated and which is shaped as a disk and rotates, a sub sprocket shaped as a disk and rotating, a connection portion connecting the main sprocket to the sub sprocket, and a linear conversion portion which is connected to the sub sprocket and which converts a rotational movement into a linear movement, wherein a diameter of the sub sprocket is less than a diameter of the main sprocket.

Abstract: Proposed is a vertical probe card capable of effectively testing the electrical characteristics of a test object without a body thereof being elastically bent or curved in a convex shape in the horizontal direction by pressure applied to opposite ends thereof.

Abstract: Systems and Methods for capacitance testing of a unit under test with parasitic capacitance directed to a guard rail. The system includes test points, wherein the plurality of test points are divided into at least two groups; a stimulus source; a first group guard relay electrically connected to each of the test points in a first; a second group guard relay electrically connected to each of the test points in a second; a guard rail coupled to the first group guard relay and the second group guard relay; a first group return relay electrically connected to each of the test points in a first group; a second group return relay electrically connected to each of the test points in a second group; a current measurement rail coupled to the first group return relay and the second group return relay; a current meter coupled to the measurement rail; and a controller.

Abstract: A housing part (10) for a sensor has a transparent, hollow base body which has a toothing (14) in the form of a straight-toothed gearwheel in a circular-cylindrical emission region on its lateral surface. A circuit board of the sensor is partially arranged in the housing part (10). The circuit board has at least one light source which faces the emission region.

Abstract: The system disclosed comprises an apparatus and a method for the detection and quantification of targeted molecules in vivo. The apparatus comprises an implantable biosensor and an AC magnetic detection device. The implantable biosensor includes functionalized nanoparticles functionalized with one or more moieties that bind to a molecular target of interest. The nanoparticles are retained in a biocompatible container which allows the molecular target of interest to enter the biosensor, for example through a semipermeable port. The biosensor can be implanted minimally-invasively into humans or animals. Upon exposure of the nanoparticles to the molecular target, a change in Neel relaxation time can be externally detected and correlated to the target analytes concentration.

Abstract: The present invention relates to a positioning apparatus for positioning a device under test—DUT—, the positioning apparatus comprising: a support structure extending over an horizontal plane, and a mast structure, which is elongated in shape and configured to contact the support structure, wherein the mast structure is movable along a pivoting axis between a first position, where the mast structure is perpendicular to the horizontal plane, and a second position, where the mast structure is parallel to the horizontal plane.

Abstract: Techniques, systems and apparatus are described for magnetic resonance imaging. A method includes applying a radio frequency (RF) signal of a predetermined time duration towards a target, wherein the RF signal comprises a composite pulse that includes a velocity-selective pulse comprising RF pulses whose phase shift is modulated over the predetermined time duration, acquiring a magnetic resonance signal from the target resulting from the application of the RF signal, and generating an MRI image of the target from the magnetic resonance signal.