Patents Examined by Ronald L. Wibert
  • Patent number: 3982200
    Abstract: A two chamber electrically pumped electron beam stabilized gas discharge laser is enabled to operate at lower electron accelerating voltages for given power applications through provision of very thin separating diaphragms. The apparatus is controlled throughout initial pump down, laser gas filling, laser operation and air release phases to prevent occurrence of a diaphragm rupturing pressure differential between the two chambers or the inadvertent malsequencing of chamber evacuation and backfill.
    Type: Grant
    Filed: September 4, 1973
    Date of Patent: September 21, 1976
    Assignee: Avco Everett Research Laboratory, Inc.
    Inventors: Ethan D. Hoag, Henry E. Pease
  • Patent number: 3961841
    Abstract: An optical pulse position modulator is provided by a diffraction grating (or other optical spectrum resolution device) in combination with a suitable control device, such as a triangular electrooptic prism. This control device introduces a frequency dependent phase shift in the optical pulse which is proportional to the difference between the frequency of each Fourier component of the pulse and the central frequency. Thereby, upon reconstruction of the pulse by reflection back to the diffraction grating, the pulse position is shifted in time according to the controlled phase shift. Such a device has a relatively higher efficiency than conventional optical delay lines for picosecond pulses in the visible region of the spectrum, for example.
    Type: Grant
    Filed: September 23, 1970
    Date of Patent: June 8, 1976
    Inventor: Joseph Anthony Giordmaine
  • Patent number: 3951552
    Abstract: A long exposure photometer-digitizer operative in an integration mode to receive weak illumination as from celestial observations through a telescope or from field or laboratory observations of objects and to provide a recorded digital representation thereof. A silicon, vidicon illumination sensor is employed to provide a wide dynamic range, sensitive and linear response over a large spectral region. Cumulative photon interaction with the vidicon tube during a long exposure is achieved by operating the vidicon at a reduced temperature which minimizes dark current effects and promotes integration mode operation. After a predetermined vidicon exposure interval the image electrically stored in the target is read out by a scanning electron beam, digitized and recorded to provide an immediately available digital record of the object. The target is sensitized before each exposure.
    Type: Grant
    Filed: August 7, 1972
    Date of Patent: April 20, 1976
    Assignee: Massachusetts Institute of Technology
    Inventors: Thomas B. McCord, James A. Westphal
  • Patent number: 3937576
    Abstract: To compensate for the nonspecific absorption in an atomic absorption spectral photometer an auxiliary illuminating source is provided in addition to the principal illuminating source. The need for moving parts and mirrors is obviated by mounting the principal and auxiliary radiation sources in fixed positions along a common ray path. The auxiliary source is constructed so that it is optically transparent and mounted adjacent the optical input with the radiation concentrated in an emission center common to both sources coinciding with the emission center of the auxiliary source. The sources are pulsed so that they are energized alternately.
    Type: Grant
    Filed: April 8, 1974
    Date of Patent: February 10, 1976
    Assignee: Beckman Instruments G.m.b.H.
    Inventor: Paul Schmider
  • Patent number: 3936192
    Abstract: An optical oil monitor that measures particle contamination in oil by passing light through an oil sample and picking up the light that is scattered at 90.degree. by the particle contaminaton and measures chemical breakdown by the attenuation of the light passing substantially straight through the oil with a second sensor. Alternately a sample and a reference are passed between the light responsive sensors for error correction and calibration so that each sensor will have an output signal alternating between a sample signal and a reference signal. A control signal of the same frequency is provided in combination with a plurality of gates to separate the sample and reference signals. The attenuation reference signal is compared to a standard signal to produce an error output for regulating the intensity of the light source to compensate for power source fluctuations, lamp characteristic changes, window soiling and the like.
    Type: Grant
    Filed: April 19, 1973
    Date of Patent: February 3, 1976
    Assignee: Environment/One Corporation
    Inventor: George F. Skala
  • Patent number: 3930719
    Abstract: A dielectric anisotropic material provided in its optical uniaxial state is caused to alter its optical properties along electrode edges by shorting electrodes, changing potential or otherwise modifying the application of an applied electrical field parallel to the optical axis of the dielectric anisotropic material. Electro-optic cells and imaging systems are disclosed using the edge effect accompanying the modification of the applied electrical field.
    Type: Grant
    Filed: April 9, 1973
    Date of Patent: January 6, 1976
    Assignee: Xerox Corporation
    Inventors: Robert W. Madrid, Joseph J. Wysocki
  • Patent number: 3930715
    Abstract: Optical systems constructed of plasma matter.In particular optical systems such as radiation shields, reflectors, and shaped optical media in the form or function of optical lenses, optical polarizing devices, analogues to gratings and the like.Also disclosed are non-linear optical devices which function by a gradual, periodic, or abrupt change in optical properties of the optical medium. The said devices are constructed of plasma or other states matter, for example solid matter, semi-solid matter, fluids or combination thereof.
    Type: Grant
    Filed: May 24, 1973
    Date of Patent: January 6, 1976
    Inventor: George C. Brumlik
  • Patent number: 3930730
    Abstract: An interferometric device is provided for measurement of the variations in length of a sample under the influence of temperature, the length of the sample being within a plane of reference and a plane of measurement defined by two plane terminal faces of the sample.
    Type: Grant
    Filed: September 6, 1973
    Date of Patent: January 6, 1976
    Assignee: Republic of France
    Inventors: Albert Adelin Suffrein Laurens, Jean-Paul Christy, Jean-Pierre Durand