Patents Examined by Roshni Kurian
  • Patent number: 6529010
    Abstract: The present invention relates to a method for locating a fault on a power transmission line which is series-compensated with capacitors. The site of the fault is determined with the aid of measured currents and voltages at one of the two ends of the power transmission line before and after the occurrence of the fault and a calculating algorithm based on impedance models of the power transmission line before and after the occurrence of the fault.
    Type: Grant
    Filed: September 5, 2000
    Date of Patent: March 4, 2003
    Assignee: ABB AB
    Inventors: Murari Saha, Jan Izykowski, Eugeniusz Rosolowski, Bogdan Kasztenny
  • Patent number: 6486688
    Abstract: A semiconductor device testing apparatus that has a laminate structure composed of a contact sheet having a first opening, an elastic sheet having a second opening and a base plate having a third opening. A supply voltage is applied to an external terminal located on a peripheral portion of the contact sheet. A probe of a probe portion is contacted to a signal electrode of a semiconductor device through the third, second and first openings.
    Type: Grant
    Filed: September 20, 2001
    Date of Patent: November 26, 2002
    Assignee: NEC Corporation
    Inventors: Toru Taura, Hirobumi Inoue, Michinobu Tanioka, Takahiro Kimura, Kouji Matsunaga
  • Patent number: 6445173
    Abstract: A printed circuit board tester includes an electronic analyzer and a grid pattern of contact points arranged in a regular pattern in a grid pattern plane. The contact points of the grid pattern are electrically connected to the electronic analyzer such that test points of a circuit board can be electrically scanned, whereby several contact points of the grid pattern are electrically interconnected. The circuit board is connectable to the contact points of the grid pattern by an adapter and/or a translator. The tester includes several grid bases, each of which comprises a contact point narrow side surface at which the contact points are arranged. The grid bases are provided with tracks, each of which is electrically connected to several contact points. Each track includes an electrical terminal connection leading to a terminal contact for connecting the electronic analyzer such that several contact points are electrically connected to a terminal contact.
    Type: Grant
    Filed: September 6, 2000
    Date of Patent: September 3, 2002
    Assignee: atg Test Systems GmbH & Co. KG
    Inventor: Stefan Weiss
  • Patent number: 6414476
    Abstract: To perform broadband current detection. The current detector of the present invention comprises first terminal, which receives power source current; second terminal, which feeds output current to an outside current; third terminal, which outputs pilot current having a predefined relationship with this output current; and fourth terminal, which has reference potential; as well as first component connected between the first and second terminals; vertical connection of first and second baluns and coupled with the first component; grounded capacitive component at the connecting part of the first and second baluns; and grounded capacitive component at the output part of the second balun. The properties of the instrument for measuring impedance and the apparatus for measuring power are improved by using the current detector of the present invention.
    Type: Grant
    Filed: January 17, 2001
    Date of Patent: July 2, 2002
    Assignee: Agilent Technologies, Inc.
    Inventor: Kazuyuki Yagi