Abstract: A semiconductor substrate has a peculiar crystal defect. Crystal defects in a fixed area of a substrate can be treated as data acquired by coding the distribution of the crystal defects. The coded data is utilized for certificate data of an IC card by identifying a semiconductor substrate itself.

Abstract: A machine vision inspection system and method that increase the resolution of object image-data without physically manipulating the physical optics of cameras used during inspection. The exemplary embodiment of the invention provides a system and method that perform what may be characterized as a digital zoom. Using this digital zoom, the resolution of object image-data provided by a camera may be artificially increased. Moreover, in accordance with the exemplary embodiment of the invention, a determination may be made regarding whether portions of the object image-data are under-resolved, and based on that determination, a local digital zoom may be performed on that under-resolved portion of object image-data to increase the resolution of that portion of object image-data.

Abstract: An input subject pattern is compared with a good product pattern that is registered beforehand, and a different portion of these is detected as a defect pattern. The detected defect pattern is classified in accordance with the features of the contour of the defect pattern.

Abstract: An improved method and computer program product for detecting an amount of rotation or magnification in a modified image, of the type including the steps of: a) embedding a marker image having a pair of identical features separated by a distance d and oriented at an angle &agr; in an original image to produce a marked image, the marked image having been rotated and/or magnified to produce the modified image; b) performing an autocorrelation on the modified image to produce a pair of autocorrelation peaks corresponding to the location of the features of the marker image in the modified image; and c) comparing the separation d and orientation &agr; of the autocorrelation peaks with the separation d and orientation &agr; of the features in the marker image to determine the amount of rotation and magnification in the modified image, wherein the improvement comprises the step of: d) preprocessing the modified image to have a constant standard deviation over all local regions in the image.

Abstract: A quadrature mirror filter is applied to decompose an image into at least two sub-images each having a different resolution. These decomposed sub-images pass through self-organizing map neural networks for performing a non-supervisory classification learning. In a testing stage, the recognition process is performed from sub-images having a lower resolution. If the image can not be identified in this low resolution, the possible candidates are further recognized in a higher level of resolution.

Abstract: A method of providing a representation of image data is disclosed. The method accesses a plurality of discrete sample values of the image data and calculates kernel values for each of the discrete sample values using a scaled kernel. The scaled kernel is constructed by transforming a kernel from a first range to a second range. In order to provide a representation of the image data, the kernel values are convolved with the discrete sample values.

Abstract: An angular orientation of a lattice image pattern is found by forming a composite image of superimposed portions of a lattice image by aligning centroids of a lattice element in each portion, and determining a lattice axis from a line fit through centroids of lattice elements in the composite image. The composite image is formed by selecting a seed pixel, finding a local minimum near the seed pixel and then finding a centroid based on the local minimum. From the centroid, it is determined whether the glyph centroid has sufficient contrast to be included in the composite image. The composite image is formed by superimposing subsamples of the lattice image based on glyph centroids. The composite image is then analyzed to determine a lattice axis through centroids in the composite image, and determining a quadrant image based on the lattice axis.

Abstract: An automatic inspecting apparatus has a function for generating a discharge signal for discharging a defective object at a predetermined position. The automatic inspecting apparatus comprises an imaging device for imaging a moving object, a sensor for detecting the arrival of the object, an image processing unit for processing images produced by the imaging device to detect defective objects, and a discharge signal generating unit for discharging defective objects at a predetermined position. An ID number is assigned to each image produced by the imaging device, and pulses generated by an encoder start to be counted when each ID number is assigned. If the object is determined to be defective after image processing by the image processing unit, the discharge signal generating unit generates a discharge signal when the number of pulses counted for the corresponding ID number reaches a pulse number equivalent to the distance between the sensor position and the discharge position.

Abstract: A method for obtaining image information, for example, about the surface structure of the inside surface of a hand, the edge of a hand, the extended four fingers or an extended thumb with high image quality. The surface to be recorded is placed on a scanning surface and an image of this surface is recorded by means of a beam path. The scanning surface has an aspect ratio BA:HA<1. The aspect ratio of the image is changed during optical transmission from the scanning surface to the optoelectronic image converter, wherein the height is compressed in such a way and/or the width is expanded in such a way that an image which is optically distorted to the aspect ratio of BE:HE>1 reaches the reception surface of the image converter, wherein the optically distorted image is then rectified by a computational operation. An arrangement for carrying out the method is also disclosed.

Abstract: A method for determining a value for an unknown picture element (pixel) T based on neighboring pixel values of a checkerboard decimated color plane. Immediate and extended neighborhood pixel values are selected. In one configuration, immediate neighborhood pixel values are averaged. In another configuration, all neighborhood pixels are averaged. A binary pattern is determined by comparing the average with each immediate and extended neighborhood pixel values. The binary pattern is reduced to identify a set of coefficients for the binary pattern. A summed cross-product is computed for the set of coefficients and each pixel value of the immediate and extended neighborhoods. In one configuration, coefficients are stored in look up tables, where different tables correspond to different input image types. In another configuration, multiple lookup tables are stored within input images, allowing different image reconstruction options based on the embedded tables.

Abstract: There is disclosed a technology of measuring three-dimensional geometric information on a plane and position information on a point from an image such as the optical flow pattern and a stereo image.