Abstract: A method of measuring a flow rate of a fluid flowing along a path, the method comprising: transmitting successive pairs of periodic signals through the fluid, the respective signals of each pair being transmitted in opposite directions along, and from opposite ends of, the path; determining a difference in propagation times of each signal of each pair along the path; and determining a flow rate of fluid along the path based on the difference in propagation times of the signals of each pair along the path; wherein a phase of each signal is altered with respect to a phase of at least one other signal transmitted along the path.

Abstract: The disclosure is directed to an observation circuit for observing an input impedance at a high frequency connector of a mobile device terminal, the observation circuit comprising a measurement circuitry, wherein the measurement circuitry comprises the high frequency connector, a reference impedance, a voltage source, and a voltage meter. A first output electrode of the voltage source is connected to both a first electrode of the high frequency connector and a first input electrode of the voltage meter over the reference impedance, and a second output electrode of the voltage source is connected to both a second electrode of the high frequency connector and a second input electrode of the voltage meter.

Abstract: An apparatus and method for preparing Double Cantilever Beam (DCB) specimens are disclosed as an apparatus and method for conducting Mode I fracture resistance testing using the DCB specimens. In a first embodiment, a drill jig is used to locate the DCB specimen and guide a drilling process during creation of at least one through-hole in the DCB specimen. The drilling process may employ a traditional drill and drill bit, a laser drill, or a water jet. In another embodiment, a set of rotating pin blocks, each with a full-round or a half-round specimen pin at one end and a hanger full-round pin at the other end, engage the DCB specimen and facilitate the internal application of a fracturing load to the DCB specimen for the Mode I fracture resistance test. The present invention may significantly reduce the time and materials needed to prepare and test a DCB specimen.