Patents Examined by Sarah J. Chisdes
  • Patent number: 7019831
    Abstract: A device is provided for the analysis of samples. The device includes a plurality of sample-containment features and a non-fluorescent quenching material for minimizing cross-talk between optical signals emitted from or directed toward the sample-containment features.
    Type: Grant
    Filed: July 21, 2003
    Date of Patent: March 28, 2006
    Assignee: Applera Corporation
    Inventors: Paul D. Grossman, Jeffery D. Frazier, Ian Harding
  • Patent number: 7009713
    Abstract: A position measuring system including a laser light source for radiating a laser beam, an optical lens system for generating an interference pattern on the basis of the laser beam having passed through different optical paths, a detector for detecting the interference pattern, and an arithmetic unit for calculating the position of at least one of the light source and the detector on the basis of a detection signal issued from the detector. For example, a spherical lens can be used as the optical lens system. In this case, the interference pattern is formed on the basis of spherical aberration of the lens. Alternatively, a multifocal lens may be used as the optical lens system.
    Type: Grant
    Filed: May 1, 2003
    Date of Patent: March 7, 2006
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Yasuji Seko, Hiroyuki Hotta
  • Patent number: 6995839
    Abstract: A scanner employs Raman spectroscopy for on site automated materials authenticity verification and identification. A technology developed so that operators with little or no technical expertise can perform on site fast nondestructive materials analyses. Automated generation of Raman signatures, and subsequent correlation to spectral fingerprints of known materials provides an ideal means for documentation verification or materials identification in settings like airport ticket counters, U.S. Customs gates, law enforcement vehicles and business offices (such as a physician's examination room). Computer controlled moveable optics provides for a scanning capability to automatically and precisely analyze several locations on a sample. The Raman scanner also provides for on site materials analysis requiring a high level of technical expertise to be done by transmission of the spectral data to a remote location via modem or wireless communications using a transmitter and receiver.
    Type: Grant
    Filed: October 8, 2003
    Date of Patent: February 7, 2006
    Inventor: Frederick W. Shapiro
  • Patent number: 6985236
    Abstract: A position measurement system optically measures a position of an object in a simple manner at low cost. The position measurement system includes: a light source; an optical lens with a large spherical aberration which transmits light from the light source and forms a light ring due to its spherical aberration; a light receiving device (CCD sensor) which detects the light ring as formed by the optical lens; and a calculator which measures a position of the light source according to detected information on the light ring as detected by the CCD sensor. An optical mirror with a large spherical aberration may be used instead of the optical lens.
    Type: Grant
    Filed: September 12, 2003
    Date of Patent: January 10, 2006
    Assignee: Fuji Xerox Co., Ltd.
    Inventors: Yasuji Seko, Kazumasa Murai, Jun Miyazaki, Hiroyuki Hotta
  • Patent number: 6961126
    Abstract: Preferential optical splitters are used in a multichannel wavelength measurement device. The optical splitters preferentially provide light at a certain wavelength to a detector. Preferentially providing light to the detectors allows for increased optical efficiencies.
    Type: Grant
    Filed: October 23, 2003
    Date of Patent: November 1, 2005
    Assignee: Honeywell International Inc.
    Inventors: Edward Belotserkovsky, Steve Axelrod, Igor N. Germanenko, Jenson Luis
  • Patent number: 6950178
    Abstract: A method and system are presented for monitoring the optical emissions associated with a plasma used in integrated circuit fabrication. The optical emissions are processed by an optical spectrometer to obtain a spectrum. The spectrum is analyzed to determine the presence of particular disassociated species which are indicative of the presence of a suitable plasma and which are desired for a deposition, etching, or cleaning process.
    Type: Grant
    Filed: October 9, 2003
    Date of Patent: September 27, 2005
    Assignee: Micron Technology, Inc.
    Inventors: Neal R. Rueger, Kevin T. Hamer