Patents Examined by Sean P. Shechtman
  • Patent number: 7577487
    Abstract: A band to band transfer module according to the present invention may be used with a substrate carrier transport system, or other systems, to transfer substrate carriers (e.g., small lot substrate carriers) from one conveyor to another conveyor or between two points on the same conveyor. The transfers (e.g., pick and place) of the substrate carriers may be made between conveyors traveling at different speeds. Numerous other aspects and features are disclosed.
    Type: Grant
    Filed: September 13, 2006
    Date of Patent: August 18, 2009
    Assignee: Applied Materials, Inc.
    Inventors: Robert B. Lowrance, Eric Andrew Englhardt, Michael R. Rice, Vinay Shah, Sushant S. Koshti, Jeffrey C. Hudgens
  • Patent number: 7577482
    Abstract: A system comprising an interchangeable electronic controller is provided with programming that allows the controller to adapt a behavior that is dependent upon the particular type of function performed by a system or subsystem component. The system reconfigures the controller when the controller is moved from one group of subsystem components to another. A plurality of application programs are provided by a server from which the application program for a particular electronic controller is selected. The selection is based on criteria such as a subsystem component group identifier that identifies the particular type of function associated with the system or subsystem group of components.
    Type: Grant
    Filed: March 8, 2007
    Date of Patent: August 18, 2009
    Assignee: The United States of America as represented by the Administrator of the National Aeronautics and Space Administration
    Inventors: Glen F. Steele, George A. Salazar
  • Patent number: 7571017
    Abstract: An Intelligent Data Multiplexer (“IDM”) can be used to interface a plurality of host computers with a semiconductor manufacturing tool. In one embodiment, the IDM has a plurality of host-side ports configured to receive messages from each of the host computers interfaced with the semiconductor manufacturing tool. The IDM also includes a multiplexer configured to multiplex the messages received from the host-side ports. To process possible conflict messages from the host computers, the IDM has a conflict resolve module. The messages are then delivered from the IDM to the semiconductor manufacturing tool through a tool-side port used to connect the semiconductor manufacturing tool to the IDM.
    Type: Grant
    Filed: November 7, 2003
    Date of Patent: August 4, 2009
    Assignee: Applied Materials, Inc.
    Inventor: Alexey G. Goder
  • Patent number: 7567850
    Abstract: A method and a system are disclosed for enabling an automatic creation of a parts list and 3-dimensional illustrations of a product based on 3-dimensional CAD or XVL data of an industrial product consisting of a plurality of parts. A method for generating a parts catalog consisting of a parts list and corresponding disassembly illustrations is provided. This method comprises the steps of (a) assigning reference numerals/symbols based on the parts list; (b) building a disassembly algorithm based on the parts list; and (c) generating disassembly illustrations based on the disassembly algorithm, wherein minimum disassembly units of the disassembly illustrations are parts and parts groups assigned with the reference numerals/symbols, and displaying the reference numeral/symbol for each of the parts and parts groups in the disassembly illustrations.
    Type: Grant
    Filed: June 3, 2004
    Date of Patent: July 28, 2009
    Assignee: Toyota Jidosha Kabushiki Kaisha
    Inventors: Tomohiro Yamada, Koji Tanaka, Tsuyoshi Harada
  • Patent number: 7567859
    Abstract: A control system and method for achieving economic operation of CHP systems. A plurality of factors, including power source prices and operational needs, are assessed using multiple strategies. The solutions achieved by each strategy are compared, and the best performing strategy is selected. The solution can then be implemented. The assessment of factors and strategies can be updated periodically. A further embodiment includes a method of designing a CHP system using similar methods applied to simulated or estimated future loads and costs.
    Type: Grant
    Filed: December 1, 2004
    Date of Patent: July 28, 2009
    Assignee: Honeywell International Inc.
    Inventors: Dharmashankar Subramanian, Anoop K. Mathur
  • Patent number: 7565224
    Abstract: A hydrogen fuel supply system includes a hydrogen generator for generating hydrogen from an energy source at an outlet pressure. An outlet conduit feeds the hydrogen to a user. A controller controls the hydrogen generator to produce hydrogen at the outlet pressure. An input interface receives user demand data and activates the controller in accordance with the user demand data.
    Type: Grant
    Filed: December 22, 2003
    Date of Patent: July 21, 2009
    Assignee: Stuart Energy Systems Corp.
    Inventors: Matthew J. Fairlie, William J. Stewart, Andrew T. B. Stuart, Steven J. Thorpe, Charlie Dong
  • Patent number: 7561940
    Abstract: A method for predictive maintenance of a cutting unit of an automatic machine; the method determining, with a given frequency, the value of a characteristic quantity of the cutting unit related to contact between a cutting member and a counter-member; determining a curve for extrapolating the time pattern of the characteristic quantity value, and programming maintenance work on the cutting unit when the curve is outside a given acceptance range.
    Type: Grant
    Filed: November 23, 2004
    Date of Patent: July 14, 2009
    Assignee: G.D. Societa' per Azioni
    Inventor: Francesco Nicastro
  • Patent number: 7558641
    Abstract: A computer-implemented method for performing recipe evaluation is provided. The computer-implemented method includes integrating a plurality of data sources into a single recipe report card framework. The recipe report card framework includes an editor for interacting with the plurality of data sources. The computer-implemented method also includes displaying a plurality of graphical displays. Each graphical display of the plurality of graphical displays is configured to present a signal parameter of a set of signal parameters for at least a substrate. The computer-implemented method further includes providing a plurality of criteria for each of the set of signal parameters. The computer-implemented method yet also includes providing a plurality of ranges for the each of the set of signal parameters. The computer-implemented method yet further includes providing an expert guide, which is configured to provide guidance in analyzing a recipe.
    Type: Grant
    Filed: March 29, 2007
    Date of Patent: July 7, 2009
    Assignee: Lam Research Corporation
    Inventors: Chung-Ho Huang, Robert Hefty, Andrew Lui, Dave Humbird, Charles Potter
  • Patent number: 7555366
    Abstract: A thermal overload protection for an electrical device, particularly an electric motor (M), measures a load current supplied to the electrical device (M), and calculates the thermal load on the electrical device on the basis of the measured load current, and shuts off (S2) a current supply (L1, L2, L3) when the thermal load reaches a given threshold level. The protection comprises a processor system employing X-bit, preferably X=32, fixed-point arithmetic, wherein the thermal load is calculated by a mathematic equation programmed into the microprocessor system structured such that a result or a provisional result never exceeds the X-bit value.
    Type: Grant
    Filed: February 1, 2005
    Date of Patent: June 30, 2009
    Assignee: ABB Oy
    Inventors: Janne Kuivalainen, Peter Österback
  • Patent number: 7551974
    Abstract: Plural combined processing machines perform various processes to workpieces W. The combined processing machines are arranged in a processing line according to a volume of products of the workpieces, operating time of the combined processing machines and a tact time to complete processing one of the workpieces. Each combined processing machine is determined to share one or more processes according to the volume of the products, the operating time and the tact time. The workpieces are transferred among the combined processing machines to be processed.
    Type: Grant
    Filed: September 15, 2006
    Date of Patent: June 23, 2009
    Assignee: JTEKT Corporation
    Inventor: Yoshio Wakazono
  • Patent number: 7551971
    Abstract: A movable data center is disclosed that comprises a portable container in which an operable computer system is assembled. A data link, power supply link and cooling system are provided through ports on the exterior of the container. The computer system is assembled to a rack that is secured to the container with a shock absorbing mechanism.
    Type: Grant
    Filed: September 13, 2006
    Date of Patent: June 23, 2009
    Assignee: Sun Microsystems, Inc.
    Inventor: W. Daniel Hillis
  • Patent number: 7548795
    Abstract: A numerical control system using converted data is provided in which changes can be made quickly to the feed rate by speed override and the like, the operation of the machine according to the content of variable data, and workpiece offset data during machining operation. The numerical control system includes a machining-program/internal-processing conversion module for allocating during conversion a command in a machining program to an application program for the numerical control apparatus, a variable/offset conversion module for storing during conversion, with respect to a command such as a variable command and a tool offset command in the machining program, only referencing information for the command, and a conversion data executing module for directly executing, during machining program execution, the internal processing sequentially based on data allocated by the conversion module.
    Type: Grant
    Filed: March 17, 2003
    Date of Patent: June 16, 2009
    Assignee: Mitsubishi Denki Kabushiki Kaisha
    Inventors: Masakazu Sagasaki, Hirohusa Kamiya, Toru Takeyama
  • Patent number: 7536237
    Abstract: A system and method are provided for real-time measurement of tool forces. A relationship between a sensor characteristic and tool forces is determined by directly measuring tool forces for a standard tool, work piece, and part program. The sensor characteristic for a CNC machine at the user facility is then measured for the standard tool, work piece, and part program, providing a relationship between the sensor characteristic at the user facility and tool forces. If the sensor is not conveniently attached to the work piece or the part program is not sufficiently robust in cutting conditions, the work piece and part program are replaced by a sacrificial work piece and sacrificial part program. The sacrificial work piece and sacrificial part program are selected to accommodate the sensors and to provide sufficient robustness in cutting conditions to accurately determine the process model parameters for the sacrificial work piece.
    Type: Grant
    Filed: July 12, 2006
    Date of Patent: May 19, 2009
    Inventor: Donald M. Esterling
  • Patent number: 7532956
    Abstract: A power distribution and protection system and method where an electrical power source distributes power to different load circuits and provides protection that changes on the fly as required by sensing the characteristics of the loads. This is accomplished by a central processing node that is connected to multiple point of use nodes. The characteristics over an initial period of time of the current drawn by the loads are detected and compared to references that determine whether a load is inductive, resistive or is in arcing condition. One of the techniques used involves counting the zero crossings over a predetermined period of time. If the voltage applied to the loads is AC, a high pass filter is used to extract the ringing characteristics to be compared.
    Type: Grant
    Filed: August 24, 2004
    Date of Patent: May 12, 2009
    Inventors: Pedro Pelaez, Jr., Mel Sequeira, Mark Gropper
  • Patent number: 7526360
    Abstract: A design apparatus for efficiently designing a mold that has improved quality. The mold is manufactured by removing cutting area from a mold material. The apparatus includes a database for storing geometry data, which represents a shape of the mold, and a further database for storing process data, which represents the shape of the cutting area, in association with the geometry data.
    Type: Grant
    Filed: April 19, 2002
    Date of Patent: April 28, 2009
    Assignees: Fujitsu Limited, Shimizu Industry Co., Ltd.
    Inventors: Akira Oshitani, Hatsuko Kouroku, Takahisa Yamada, Tadashi Shimizu, Chiharu Kamiya, Yutaka Takamatsu
  • Patent number: 7526358
    Abstract: An object of the present invention is to provide a three-dimensional CAD-system for adding data about a drafting direction of a die to three-dimensional data about the part to be formed by that die, and a cost calculation system for calculating the cost of the part based on that drafting direction data. A three-dimensional model generation unit of a CAD system generates: a three-dimensional shaped model of a given part based on information coming from an input operation unit. A drafting direction data setting unit establishes drafting direction data when the input operation unit is operated to designate the drafting direction of the die for press molding, injection molding or the like of the part in question. A projected area calculation unit calculates a projected area S of the part on a plane perpendicular to the drafting direction of the applicable die on the basis of the three-dimensional model of that part and the drafting direction data involved.
    Type: Grant
    Filed: April 23, 2002
    Date of Patent: April 28, 2009
    Assignee: Honda Giken Kogyo Kabushiki Kaisha
    Inventors: Akio Kawano, Kazuhiro Iwai, Masakatsu Shimizu, Eiji Yamamoto
  • Patent number: 7526352
    Abstract: A semiconductor production system has a semiconductor manufacturing apparatus having an exposure unit, a control unit for controlling the exposure unit and a storage device; a semiconductor inspection apparatus having an observation unit, a control unit for controlling the observation unit and a storage device; and a storage device commonly used by the semiconductor manufacturing apparatus and the semiconductor inspection apparatus. The manufacturing apparatus, the inspection apparatus and the commonly used storage device are interconnected via a storage area network. With the semiconductor manufacturing apparatus and the storage device linked together via the storage area network, a large volume of image data or design data can be communicated at high speed, thus improving the system throughput.
    Type: Grant
    Filed: January 23, 2008
    Date of Patent: April 28, 2009
    Assignee: Hitachi, Ltd.
    Inventors: Hidemitsu Naya, Rikio Tomiyoshi, Shigeo Moriyama, Mutsumi Kikuchi, Kotaro Shimamura
  • Patent number: 7519453
    Abstract: A hydrogen energy system for a facility that is disposed off-board a vehicle. The system includes a hydrogen generator disposed at the facility for generating hydrogen by water electrolysis, a hydrogen storage apparatus for storing at least some of the hydrogen generated by the hydrogen generator, and a controller having a computer processor for receiving and processing certain control inputs. The controller is operatively connected to the hydrogen generator for controlling the generation of hydrogen based on the control inputs.
    Type: Grant
    Filed: February 15, 2007
    Date of Patent: April 14, 2009
    Assignee: Stuart Energy Systems Corp.
    Inventors: Matthew J. Fairlie, William J. Stewart, Andrew T. B. Stuart, Steven J. Thorpe, Charlie Dong
  • Patent number: 7519448
    Abstract: A light source emits light toward a semiconductor wafer, and a light receiving sensor detects light passing a peripheral edge of the semiconductor wafer. Each coordinates of the peripheral edge of the semiconductor wafer is obtained from a result of the detection. Further, a center of the semiconductor wafer is obtained from a group of the coordinates. Then, an illumination device emits light toward the peripheral edge of the semiconductor wafer and an optical camera detects light reflected from the peripheral edge of the semiconductor wafer. A position of a “V”-shaped notch formed on the peripheral edge of the semiconductor wafer is obtained from a result of the detection. A handling position of the semiconductor wafer is determined based on the center of the semiconductor wafer and the position of the “V”-shaped notch.
    Type: Grant
    Filed: November 27, 2006
    Date of Patent: April 14, 2009
    Assignee: Nitto Denko Corporation
    Inventors: Satoshi Ikeda, Masayuki Yamamoto
  • Patent number: 7502663
    Abstract: A method for determining a deviation of at least one regulating variable on chip removal machines with a mechanical drive for a tool and/or a workpiece, regulated by a control system, wherein the regulation comprises a plurality of values of at least three spatial axes for the control system and for the drive, and the values have a functional relation with the axes. A protocol is prepared from a plurality of control system actual values detected by measuring devices and/or selected drive actual values and a control system nominal value and/or a drive nominal value is calculated at least in relation to an axis, and a control system differential value and/or a drive differential value is calculated at least in relation to the axis. A chip removal machine which implements such a method is disclosed.
    Type: Grant
    Filed: April 20, 2005
    Date of Patent: March 10, 2009
    Assignee: Schneider GmbH & Co. KG
    Inventors: Christoph Weber, Gunter Schneider