Patents Examined by Shuan Campbell
  • Patent number: 9929217
    Abstract: A method of manufacturing an array substrate of a display is provided. The method includes forming a first bank material layer on a first substrate, wherein a material of the first bank material layer includes hydrophobic element; patterning the first bank material layer to form a first bank having at least one first concave; forming a first electrode on the first bank and in the first concave after the step of patterning the first bank material layer to form the first bank; and forming an color layer on the first electrode.
    Type: Grant
    Filed: January 27, 2016
    Date of Patent: March 27, 2018
    Assignee: AU OPTRONICS CORPORATION
    Inventors: Hong-Syu Chen, Wen-Pin Chen, Teng-Ke Chen, Tsu-Wei Chen, Kuo-Kuang Chen
  • Patent number: 9337041
    Abstract: Capacitive coupling between a gate electrode and underlying portions of the source and drain regions can be enhanced while suppressing capacitive coupling between the gate electrode and laterally spaced elements such as contact via structures for the source and drain regions. A transistor including a gate electrode and source and drain regions is formed employing a disposable gate spacer. The disposable gate spacer is removed to form a spacer cavity, which is filled with an anisotropic dielectric material to form an anisotropic gate spacer. The anisotropic dielectric material is aligned with an electrical field such that lengthwise directions of the molecules of the anisotropic dielectric material are aligned vertically within the spacer cavity. The anisotropic gate spacer provides a higher dielectric constant along the vertical direction and a lower dielectric constant along the horizontal direction.
    Type: Grant
    Filed: October 27, 2014
    Date of Patent: May 10, 2016
    Assignee: GLOBALFOUNDRIES INC.
    Inventors: Emre Alptekin, Hari V. Mallela, Reinaldo Vega
  • Patent number: 8013620
    Abstract: When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.
    Type: Grant
    Filed: December 10, 2009
    Date of Patent: September 6, 2011
    Assignee: TechWing Co. Ltd.
    Inventors: Jae-Gyun Shim, Yun-Sung Na, In-Gu Jeon, Tae-Hung Ku, Hyun-Jun Yoo