Abstract: A chemical mechanical polishing composition useful for chemical mechanical polishing of a patterned semiconductor wafer containing a nonferrous metal. The chemical mechanical polishing composition comprises an inhibitor for the nonferrous metal; a copolymer of poly(ethylene glycol)methyl ether (meth)acrylate and 1-vinylimidazole; and water.
Type:
Grant
Filed:
August 4, 2008
Date of Patent:
September 24, 2013
Assignee:
Rohm and Haas Electronic Materials CMP Holdings, Inc.
Inventors:
Tirthankar Ghosh, Terence M. Thomas, Hongyu Wang, Scott A. Ibbitson