Patents Examined by Stephanie Bloss
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Patent number: 9625288Abstract: A motion analysis system includes first to N-th (N is an integer of 2 or more) sensor units which is attached to an object, an analysis unit which obtains a plurality of items of sampling data output from the sensor units, to analyze a motion of the object, a synchronization signal sending unit which transmits a first synchronization signal group including N first synchronization signals in order from the first to the N-th sensor unit, and transmits a second synchronization signal group including N second synchronization signals in order from the N-th to the first sensor unit, with respect to sensor unit, and a reference synchronization signal generation unit which generates a reference synchronization signal which is to be a reference with respect to the first to N-th sensor units, based on the first and second synchronization signal groups received by sensor unit.Type: GrantFiled: January 15, 2013Date of Patent: April 18, 2017Assignee: Seiko Epson CorporationInventor: Kazuo Nomura
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Patent number: 9626943Abstract: One or more drumsticks may be optimally balanced using a grip point of the drumstick by calculating a radius of gyration. The radius of gyration is a controlling parameter wherein the radius of gyration correlates with the grip point, which is itself based on a particular gripping style and hand size. Given the radius of gyration, the center of gravity of the one or more drumsticks may be re-located at a point along the drumstick closely aligned to the radius of gyration. The re-location may be performed by adding a weight to the butt end of the drumstick. Balanced drumstick pairs provide optimum performance, control and handling characteristics for a drummer.Type: GrantFiled: February 25, 2014Date of Patent: April 18, 2017Inventor: David James Hughlett
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Patent number: 9620426Abstract: The present invention may include performing a first measurement on a wafer of a first lot of wafers via an omniscient sampling process, calculating a first set of process tool correctables utilizing one or more results of the measurement performed via an omniscient sampling process, randomly selecting a set of field sampling locations of the wafer of a first lot of wafers, calculating a second set of process tool correctables by applying an interpolation process to the randomly selected set of field sampling locations, wherein the interpolation process utilizes values from the first set of process tool correctables for the randomly selected set of field sampling locations in order to calculate correctables for fields of the wafer of the first lot not included in the set of randomly selected fields, and determining a sub-sampling scheme by comparing the first set of process tool correctables to the second set of correctables.Type: GrantFiled: February 1, 2011Date of Patent: April 11, 2017Assignee: KLA-Tencor CorporationInventors: Pavel Izikson, John Robinson, Daniel Kandel
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Patent number: 9606453Abstract: The present invention may include measuring tool induced shift (TIS) on at least one wafer of a lot of wafers via an omniscient sampling process, randomly generating a plurality of sub-sampling schemes, each of the set of randomly generated sub-sampling schemes having the same number of sampled fields, measuring TIS at each location of each of the randomly generated sub-sampling schemes, approximating a set of TIS values for each of the randomly generated sub-sampling schemes utilizing the TIS measurements from each of the randomly generated sub-sampling schemes, wherein each set of TIS values for each of the randomly generated sub-sampling schemes is calculated utilizing an interpolation process configured to approximate a TIS value for each location not included in a randomly generated sub-sampling scheme, and determining a selected sub-sampling scheme by comparing each of the calculated sets of TIS values to the measured TIS of the omniscient sampling process.Type: GrantFiled: September 13, 2011Date of Patent: March 28, 2017Assignee: KLA-Tencor CorporationInventors: Pavel Izikson, Guy Cohen
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Patent number: 9606257Abstract: A method for determining existence of a fracture in a formation surrounding a wellbore drilled through subsurface rock formations includes calculating vertical resistivity, horizontal resistivity, apparent formation dip, apparent formation azimuth and axial resistivity for a plurality of longitudinal instrument spacings using measurements from a triaxial induction well logging instrument disposed in the formation. A spread in the axial resistivity values is determined and the axial resistivity spread threshold therefrom. Fracture indicator values and fracture orientation values are calculated from transverse components of the triaxial induction measurements. Presence of a fracture is indicated when at least one of the fracture indicator value exceeds a selected threshold, the axial resistivity spread exceeds the spread threshold and when the apparent formation dip exceeds a selected threshold.Type: GrantFiled: August 25, 2011Date of Patent: March 28, 2017Assignee: SCHLUMBERGER TECHNOLOGY CORPORATIONInventors: Peter T. Wu, Dong Weixin, Thomas D. Barber, Dean Homan
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Patent number: 9606050Abstract: Compensating for amplitude drift in a spectrometer may include making successive performances of a standardization process to generate, at each performance, a mathematical transform to compensate for amplitude drift for application by an arithmetic unit to a spectrum obtained by the spectrometer in an interval between the performances. The compensating may include modifying the mathematical transform with a function dependent on spectral data from a zero material measured in association with the standardization process and the single beam zero spectrum measured in an interval between performances. The compensating may include applying the modified mathematical transform to a spectrum from an unknown sample.Type: GrantFiled: August 19, 2011Date of Patent: March 28, 2017Assignee: FOSS ANALYTICAL A/BInventor: Henrik Vilstrup Juhl
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Patent number: 9607525Abstract: Golf performance and equipment characteristics may be determined by analyzing the impact between a golf ball and an impacting surface. In some examples, the impacting surface may be a golf club face. The impact between the golf ball and the surface may be measured based on sound and/or motion sensors (e.g., gyroscopes, accelerometers, etc.). Based on motion and/or sound data, various equipment-related information including golf ball compression, club head speed and impact location may be derived. Such information and/or other types of data may be conveyed to a user to help improve performance, aid in selecting golf equipment and/or to insure quality of golfing products.Type: GrantFiled: March 15, 2013Date of Patent: March 28, 2017Assignee: NIKE, Inc.Inventors: Nicholas A. Leech, Arthur Molinari
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Patent number: 9600443Abstract: Mechanisms for tracking an entity are provided. A time is determined by a sensor having a clock, the time being within a time slot in a series of time slots. First data of the time slot is provided and shared between a plurality of sensors. The sensor receives data from the movable entity. The sensor calculates identifying data from the received data for identifying the entity. Derivative identifying data is calculated by applying a modifying function using the provided first data for modifying the identifying data. The sensor calculates a hash value by taking the derivative identifying data as input. The sensor sends a message to a central server for determining the position of the entity, the message comprising the hash value and an identifier of the sensor.Type: GrantFiled: January 14, 2013Date of Patent: March 21, 2017Assignee: International Business Machines CorporationInventors: Gherardo Albano, Dario De Judicibus
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Patent number: 9582741Abstract: There is provided a method and system evaluating performance of a printing device. In accordance with the method a diagnostic routine is executed on the printing device. The diagnostic routine evaluates performance of the printing device using a set of instructions stored on a computer-readable medium. The set of instructions are configured to identify a fault in the performance of the printing device based on an artifact identifiable on at least one diagnostic output. The diagnostic output is generated by the printing device with the identifiable artifact in accordance with the diagnostic routine for identifying the artifact and associated fault of the printing device.Type: GrantFiled: December 1, 2011Date of Patent: February 28, 2017Assignee: Xerox CorporationInventors: David Bradley Montfort, Eliud Robles Flores, John R. Falvo
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Patent number: 9562985Abstract: In some embodiments, an apparatus and a system, as well as a method and an article, may operate to acquire multiple output values provided by at least one elongated, unitary acoustic sensor operating as a secondary propagation medium. The sensor has multiple mechanical-to-electrical conversion probe points along its length, to provide corresponding multiple output values proportional to mechanical movement along the length of the sensor, the mechanical movement being induced by acoustic waves in a primary propagation medium comprising a geological formation and borehole fluid. Further activity may include processing the output values to determine slowness in an acoustic wave propagating between at least two of the probe points. Additional apparatus, systems, and methods are disclosed.Type: GrantFiled: September 26, 2011Date of Patent: February 7, 2017Assignee: Halliburton Energy Services, Inc.Inventors: Burkay Donderici, Baris Guner
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Patent number: 9562812Abstract: A temperature measuring device of a power semiconductor apparatus that accurately detects chip temperature even where a gradient of the measured characteristic line segment is different from a designed gradient, including a chip temperature detecting circuit that includes an A/D converter delivering a measurement value of a digital converted forward voltage across a temperature detecting diode and an operational processing unit for calibration and chip temperature calculation. In calibration processing, different known reference voltages are applied by a reference connected in place of the diode and a gradient of the line segment connecting the measurement values is calculated. The gradient is stored in a memory with an offset correction value that is one of the measurement values. A chip temperature is calculated based on a forward voltage across the diode calculated based on the measurement value and the stored values of the gradient and the offset correction value.Type: GrantFiled: September 7, 2012Date of Patent: February 7, 2017Assignee: FUJI ELECTRIC CO., LTD.Inventor: Hiroyuki Yoshimura
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Patent number: 9557170Abstract: A method of determining the angular position of a roll includes: (a) detecting signals generated by an accelerometer attached to an end of a rotating roll; (b) determining whether a signal generated in step (a) has reached a pre-trigger threshold, and repeating step (a) if the signal has not reached the pre-trigger threshold; (c) if the signal is determined in step (b) to have reached the pre-trigger threshold, detecting a subsequent signal generated by the accelerometer; (d) determining whether the signal detected in step (c) has reached a trigger threshold, and repeating step (c) if the signal has not reached the trigger threshold; and (e) if the signal has reached the trigger threshold, establishing the angular position of the roll based on the signal that has reached the trigger threshold.Type: GrantFiled: January 16, 2013Date of Patent: January 31, 2017Assignee: Stowe Woodward Licensco, LLCInventor: Clifford Bruce Cantrell
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Patent number: 9541489Abstract: The invention provides an optical measuring apparatus having a plurality of measuring sections each having a light irradiating section for irradiating light to specimens and a light receiving section for receiving optical data acquired by irradiating the light to the specimens and a flow rate calculating section for calculating flow rate values of the specimens based on a difference of measured times of the optical data measured by the plurality of measuring sections with respect to the specimens and a distance between the plurality of measuring sections. The optical measuring apparatus measures the optical data of the specimens by irradiating light to the specimens, i.e., the objects to be measured, dispersed within a sample fluid flowing through a flow passage.Type: GrantFiled: July 6, 2011Date of Patent: January 10, 2017Assignee: FURUKAWA ELECTRIC CO., LTD.Inventors: Ken Tsukii, Toru Takahashi, Jie Xu
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Patent number: 9524372Abstract: A system and method for augmenting or adding to the information used by an in-vitro diagnostic or other diagnostic device to generate results of a test is disclosed. A diagnostic device is capable of generating test results based on a sample, such as a sample provided by a patient, and is also capable of receiving additional information to enhance the results providable by the device. For example, an in-vitro diagnostic device is configured to read a lateral flow assay test, and is configured to receive additional diagnostic, network, test identification, or environmental information over a network. Using both the result of the diagnostic test and the additional information, the disclosed device provides more thorough, accurate, and reliable diagnostic information. The results generated by the device may be communicated to an appropriate remote device to enhance the results obtainable by such tests.Type: GrantFiled: September 9, 2011Date of Patent: December 20, 2016Assignee: Alverix, Inc.Inventors: Stephan Hengstler, Tong Xie
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Patent number: 9507036Abstract: A method is provided for inspecting a zone, termed the zone of interest, whose characteristics are known at least partially, to detect at least one element included in the zone of interest, the method including: a first detection providing, through a time reversal method, a first signal relating to the position of the element for a first emission point, and at least one second detection providing, through a time reversal method, at least one second signal relating to the position of the element for a second emission point different from the first emission point. The method furthermore includes a multiplication of the first detection signal with the second detection signal to provide a third detection signal which is more accurate than the first and the second detection signal. A system implementing this method is also provided.Type: GrantFiled: July 10, 2013Date of Patent: November 29, 2016Assignees: UNIVERSITE PIERRE ET MARIE CURIE (PARIS 6), CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, ARIEL—UNIVERSITY RESEARCH AND DEVELOPMENT COMPANYInventors: Frederic Nataf, Franck Assous, Marie Kray
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Patent number: 9501113Abstract: There is a need to solve a possible system malfunction when a power supply voltage decreases steeply. To solve this problem, a control method is provided for a voltage detection system having an interrupt mode and a reset mode. First and second detection levels are configured. When a power supply voltage is higher than the first detection level, a latch circuit is placed in a first state to enable the interrupt mode. When the power supply voltage becomes lower than or equal to the first detection level, an interrupt signal is generated to change the latch circuit from the first state to a second state and enable the reset mode. A system reset is issued when the power supply voltage becomes lower than or equal to the second detection level in the reset mode.Type: GrantFiled: June 20, 2011Date of Patent: November 22, 2016Assignee: RENESAS ELECTRONICS CORPORATIONInventors: Kyouhei Kouno, Shinichi Nakatsu, Kazuyo Yamaguchi, Kimiharu Eto, Kuniyasu Ishihara, Hirotaka Shimoda, Yuusuke Urakawa, Seiya Indo
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Patent number: 9495280Abstract: An operation verifying apparatus of a first embodiment acquires a log indicating the content of a sequence of operations performed on a predetermined device, identifies corresponding functions from the log, and automatically generates a program based on the identified functions. Input data, which is to serve as an argument of each of these functions, is set. Execution sets as well as test scenarios are each structured by combining a program and input data. Then each execution set is continuously executed. As a result, an operation test using a test program is executed.Type: GrantFiled: May 2, 2011Date of Patent: November 15, 2016Assignee: NOMURA RESEARCH INSTITUTE, LTD.Inventors: Mamoru Yasuda, Shunichi Matsumoto, Takaya Higashino, Eiji Nabika, Hayato Takabatake, Takuma Ishibashi, Takuharu Mizoguchi
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Patent number: 9488667Abstract: To change a photometric time for each item or to change a measurement time for each specimen so that time required for biochemical measurement can be reduced, an index that indicates an end of a reaction is required. Unfortunately, however, no methods have been available for determining the end of the reaction. In measuring a substance to be measured contained in a sample, a parameter in an approximate expression is calculated using a measured value that changes with time, a degree of convergence of a reaction is determined according to a degree of convergence of the parameter, and a measured value at the end of the reaction is calculated using the parameter at a point in time at which it is determined that the reaction has converged.Type: GrantFiled: April 12, 2010Date of Patent: November 8, 2016Assignee: Hitachi High-Technologies CorporationInventors: Kumiko Kamihara, Satoshi Mitsuyama, Tomonori Mimura, Chihiro Manri
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Patent number: 9482573Abstract: A sensing system comprising a radar-based vibration sensor and processing unit used to collect and process vibration information from a machine of interest. The radar-based vibration sensor obtains vibration data from mechanical operation of a component or series of components in the machine, and may be steered toward specific regions of interest of the machine. The processing unit analyzes the data, and may fuse data from a plurality of vibration sensors, such as radar-based vibration sensors and multiple machine-mounted sensors such as accelerometers. From this analysis, indications related to a status of the mechanical operation of the components in the machine of interest may be provided to relevant users.Type: GrantFiled: April 28, 2011Date of Patent: November 1, 2016Assignee: Honeywell International Inc.Inventors: Andy Peczalski, Dinkar Mylaraswamy
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Patent number: 9445164Abstract: According to one embodiment, an existent person count estimation apparatus includes motion sensors and following units. The collection unit generates human sensing information. The instance prediction unit predicts second instances from the first instances by using the transition matrix. The likelihood calculation unit calculates likelihoods of the second instances using the time information items. The instance selection unit selects one or more third instances having likelihoods higher than a threshold. The output unit generates output information including estimate values of existent person counts for the first areas included in the third instances.Type: GrantFiled: March 2, 2012Date of Patent: September 13, 2016Assignee: Kabushiki Kaisha ToshibaInventors: Shuichiro Imahara, Kazuto Kubota, Toshimitsu Kumazawa, Yoshiyuki Hondo