Abstract: A CCD area image sensor includes, on a single semiconductor chip, a matrix of imaging elements, a plurality of vertical shift registers formed in parallel with rows of the matrix, a first horizontal shift register formed on one side of the matrix, a plurality of lines of CCD memories formed on another side of the matrix opposite to the one side, a second horizontal shift register formed on the same side of the matrix as the lines of CCD memories and first and second charge detectors formed at ends of the first and second horizontal shift registers. The method for operating the CCD area image sensor to produce signals with interlace and line sequential scannings is also described.