Abstract: The invention relates to a device (1) for the light spectroscopic analysis of a small amount of a liquid sample, comprising a receiving point (3) for receiving small amounts of the liquid sample, and light conductors (5, 6) which guide light of a light source to the sample and guide signal light from the sample in the direction of a detector, and is characterised in that an illumination source (7) is arranged below the receiving point (3), and a region (8) below the receiving point (3) which is permeable for the light of the illumination source (7), is provided such that the illumination light illuminates the receiving point (3).

Abstract: A spectroscopic analysis device for analysis of a sample comprises an input for receiving light from the sample and a photonic integrated circuit. This photonic optical filter comprises one or more tunable bandpass filters arranged to filter the received light. Furthermore, the device comprises a controller that is arranged—to control the one or more tunable bandpass filters, to receive filter results obtained from the one or more tunable bandpass filters, and to provide spectroscopic analysis results based on the received filter results.

Abstract: A calibration pattern having a plurality of pattern regions for calibrating an imaging optical unit for metrological applications. At least one image of the calibration pattern is recorded using the imaging optical unit. The image is evaluated to quantify individual properties of the imaging optical unit. Depending on the quantified individual properties, correction values for a calculated correction of aberrations of the imaging optical unit are determined. The calibration pattern is provided on an electronic display having a plurality of display pixels arranged in the form of a matrix. In addition, a calibration body with at least one line having a defined dimension, is recorded using the imaging optical unit. A magnification factor of the imaging optical unit is determined on the basis of the at least one line. At least one further individual property of the imaging optical unit is quantified on the basis of the calibration pattern.

Abstract: A line scan wafer inspection system includes a confocal slit aperture filter to remove sidelobes and enhance resolution in the scanning direction. A position detector associated with the slit aperture filter monitors and corrects illumination line image positions relative to the slit aperture to keep image position variations within tolerable limits. Each detector measures a line position and then uses the line position signal to adjust optical, mechanical, and electronic components in the collection path in a feedback loop. The feedback loop may be employed in a runtime calibration process or during inspection to enhance stability.

Abstract: Disclosed is a method of predicting, calculating, or analyzing the sintered density of uranium oxide (UOx) before uranium oxide is added in the pelletizing process during a process of manufacturing nuclear fuel, the method including measuring the chromaticity of ammonium diuranate using a spectrophotometer. The present invention provides a simple and highly reliable method of predicting the sintered density of uranium oxide (UOx), which overcomes the problem with a conventional technology where the sintered density of uranium oxide (UOx) can be analyzed only in a pellet state and a subsequent treatment process needs to be performed according to the analysis result.

Abstract: An optical sensor system includes an optical sensor head having a light-emitting device and a detector which detects light emitted from the light-emitting device, and a calculator circuit. The light-emitting device includes a resonator which includes a first reflective surface, a second reflective surface facing the first reflective surface, and a waveguide provided between the first reflective surface and the second reflective surface. At least one metal microparticle capable of exciting surface plasmon is formed on the first reflective surface. The calculator circuit calculates an environment parameter at the first reflective surface on the basis of a detected value from the detector.

Abstract: A device includes one or more reflector components. Each reflector component comprises layer pairs of epitaxially grown reflective layers and layers of a non-epitaxial material, such as air. Vias extend through at least some of the layers of the reflector components. The device may include a light emitting layer.

Abstract: According to an aspect of an exemplary embodiment, an authentication apparatus for authenticating an object includes an input coupler configured to receive incident light and generate surface plasmons from the incident light; and an output coupler configured to output a speckle pattern based on the surface plasmons.

Abstract: Multiply patterned metrology targets and target design methods are provided to enable pitch walk measurements using overlay measurements. Multiply patterned structures having single features or spacers produced simultaneously and sharing a common pitch with the paired features or spacers are used to express pitch walk as a measurable overlay between the structures. For example, targets are provided which comprise a first multiply patterned structure having a single left-hand feature or spacer produced simultaneously and sharing a common pitch with the respective paired features or spacers, and a second multiply patterned structure having a single right-hand feature or spacer produced simultaneously and sharing a common pitch with the respective paired features or spacers.

Abstract: Optical reader systems and methods with accurate microplate position detection capability are disclosed. The optical reader systems having scanning optical systems that are configured to scan select position-detecting features on the microplate to accurately determine their respective positions. The measurement of the positions of the position-detecting features can also be used to calibrate the optical reader system to reduce or eliminate adverse positioning effects from system non-linearities that arise from one or more of the system components, including the scanning optical system.

Abstract: A device includes a processor, a light emitter coupled to the processor, and a memory. The light emitter is configured to generate a first light to be provided to an optical fiber at a first time when a portion of the optical fiber has a first physical configuration and to generate a second light to be provided to the optical fiber at a second time when the portion of the optical fiber has a second physical configuration. The memory stores instructions executable by the processor to determine a first estimated distance associated with a first location of the optical fiber based on the first light, determine a second estimated distance associated with a second location of the optical fiber based on the second light, determine a third estimated distance associated with a third location of the optical fiber based on the first estimated distance and the second estimated distance.

Abstract: In some embodiments, a system and/or method may include assessing surface cleanliness. In some embodiments, the system may include a dispensing device. The dispensing device may dispense, during use, a measured amount of liquid on a surface forming a drop. In some embodiments, the system may include a stage. The stage may support, during use, a digital imaging device. In some embodiments, the system may include a calibration feature. The calibration feature may be of known dimension. The calibration feature may be coupled to the stage. The calibration feature may facilitate assessment, during use, of a dimension of the drop. The dimension may include a diameter of the drop. In some embodiments, the system is configured to assess a contact angle of the drop with the surface.

Abstract: Various systems and methods of analyzing one or more properties of a sample are provided. The system includes a self-contained purging device having a sample holder and one or more analyzers for analyzing one or more properties of the sample. The purging device is configured to remove sample contained within the sample holder when an analysis is complete. In one embodiment the purging device is configured via an air pump having a tube in fluid communication with an air inlet of the sample holder, wherein the air pump is configured to deliver pressurized air to the air inlet and thereby purge the sample. The pressurized air is localized ambient air, and substantially free of contaminants. Methods and other systems are also described and illustrated.

Abstract: A manufacturing method comprises collecting a sample from a cell culture used by a manufacturing application, and controlling a Raman spectrometer to collect a Raman spectrum of a targeted volume within the sample. The method further comprises obtaining reference spectra uniquely associated with a known cell line, which comprise at least two of: spectral measurements of mycoplasma by itself, a contaminated cell line, and a pure cell line. Moreover, the method comprises comparing the reference spectra to the collected spectrum, and identifying whether there is at least one unnatural molecular composition within the collected spectrum based upon the comparison of the reference spectra to the collected spectrum. An indication is provided as to whether mycoplasma is detected in the collected Raman spectrum where at least one unnatural molecular composition is identified within the collected spectrum, and the manufacturing application is stopped where mycoplasma is detected in the collected Raman spectrum.

Abstract: The invention relates to a device for verifying documents (100) having a light-transparent document support (101) for the receiving a document and a light non-transparent covering (103) for covering the light-transparent document support (101), the light non-transparent covering (103) comprises a lighting device (105) for screening the document.

Abstract: An optical sensor including a MEMS structure, and a grating coupled resonating structure positioned adjacent to the MEMS structure, the grating coupled resonating structure comprising an interrogating grating coupler configured to direct light towards the MEMS structure. The interrogating grating coupler is two dimensional, and the interrogating grating coupler and the MEMS structure form an optical resonant cavity.

Abstract: The arrangement comprises an installation platform movable upwards and downwards in the elevator shaft, at least one light source arranged at a predetermined position in the elevator shaft below the installation platform and producing a vertically upwards directed collimated light beam, at least one primary digital imaging device positioned on the installation platform and being arranged to take electronic images of the light beam hitting the photosensitive sensor of the at least one primary digital imaging device or of a pattern created by the light beam on a reflective or transparent screen positioned at a distance in front of the photosensitive sensor of the at least one primary digital imaging device, whereby the horizontal position of the installation platform in relation to the elevator shaft can be measured from the electronic images taken by the at least one primary digital imaging device.

Abstract: A light radiating portion radiates light with wavelength ?1 having predetermined absorptivity for an object and light with wavelength ?2 having smaller absorptivity for the object than the wavelength ?1, to a target, so as to scan in 2-dimensional directions. A light receiving portion receives scattered lights reflected by the target based on light with wavelength ?1 and light with wavelength ?2. A measuring portion generates information used for detection of the object at the target, based on difference between the two scattered lights with wavelength ?1 and wavelength ?2 received by the light receiving portion. An output portion outputs whether or not the object is present at the target, by 2-dimensional area information, based on scanning by the light radiating portion and information generated by the measuring portion.

Abstract: A plasma spectrometry method with high reproducibility of plasma light emission is described, wherein the method comprises: a detection step of applying a voltage, thereby detecting the resulting plasma light emission; and non-detection step of detecting no plasma light emission.

Abstract: Systems and methods for generating a three-dimensional gas map includes a remote vehicle including reflective material. A positioning stage including multidimensional movement to track the remote vehicle. A light head to reflect light off of the remote vehicle. A controller to analyze received light to determine gas content and generate a three-dimensional gas map.