Patents Examined by Tarifur R. Chowdhury
  • Patent number: 10895503
    Abstract: A bimodal optical spectroscopy device for producing spectra of autofluorescence and diffuse reflectance signals from a biological sample such as skin.
    Type: Grant
    Filed: November 30, 2016
    Date of Patent: January 19, 2021
    Assignees: UNIVERSITE DE LORRAINE, CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
    Inventors: Marine Amouroux, Walter Blondel, Alain Delconte
  • Patent number: 10895692
    Abstract: One or more fiber optic rotary joints (FORJ), free space beam combiners, OCT, SEE and/or fluorescence devices and systems for use therewith, methods of manufacturing same and storage mediums are provided. One or more embodiments of FORJs may be used with numerous applications in the optical field, including, but not limited to, OCT and fluorescence applications. Examples of such applications include imaging, evaluating and diagnosing biological objects, such as, but not limited to, for Gastro-intestinal, cardio and/or ophthalmic applications, and being obtained via one or more optical instruments.
    Type: Grant
    Filed: April 27, 2018
    Date of Patent: January 19, 2021
    Assignee: Canon U.S.A., Inc.
    Inventor: Daisuke Yamada
  • Patent number: 10890536
    Abstract: A gemstone cleaning and analysis system and a method for cleaning and analyzing one or more gemstones using the system. The system includes a platform and an automated positioning system connected to the platform. The automated positioning system selects a gemstone from a plurality of gemstones, deposits the gemstone onto a cleaning stand connected to the platform, cleans at least one side of the gemstone by rubbing at least one side of the gemstone with at least one cleaning tool, and moves the gemstone to a gemstone imaging device connected to the platform. The gemstone imaging device has a plate, and the automated positioning system deposits the gemstone onto the plate. The gemstone imaging device identifies the gemstone. The automated positioning system moves the gemstone to a holding plate that is connected to the platform and deposits the gemstone at a particular location of the holding plate.
    Type: Grant
    Filed: August 21, 2018
    Date of Patent: January 12, 2021
    Assignee: GemEx Systems, Inc.
    Inventors: Randall M. Wagner, Kurt P. Schoeckert
  • Patent number: 10890431
    Abstract: Disclosed is an optical probe system that is capable of high speed, high precision, and high resolution 3D digitalization of engineered objects. The 3D dimensional data of the engineered object is measured using a swept source optical coherence tomography system with improved speed, spatial resolutions, and depth range. Also disclosed is a type of coordinate measurement machine (CMM) that is capable of performing high speed, high resolution, and non-contact measurement of engineered objects. The mechanic stylus in the touch-trigger probe of a conventional CMM is replaced with an optical stylus with reconfigurable diameter and length. The distance from the center of the optical stylus to the measurement probe is optically adjusted to match the height of the object to be measured quickly, which eliminates one dimensional movement of the probe and greatly improves the productivity.
    Type: Grant
    Filed: December 10, 2019
    Date of Patent: January 12, 2021
    Assignee: Thorlabs, Inc.
    Inventors: James Jiang, Alex Cable
  • Patent number: 10890429
    Abstract: An automatic calibration optical interferometer comprises: a light source; an optical interference assembly, which divides a low coherent light into a first and a second incident light; an optical sampling assembly, with a first end receiving the first incident light and a partially reflective window at the second end being configured to divide the first incident light into a first reflected light and a first penetrating light configured to be emitted to the test sample; an optical reference assembly, with a reference mirror and an actuator, wherein the optical sampling assembly emits the second incident light to the reference mirror to generate a second reflected light, and the actuator moves the reference mirror; a polychromator, which outputs a displacement signal according to an optical path difference variation between the first and second reflected lights; and a displacement controller, which controls the actuator according to the displacement signal.
    Type: Grant
    Filed: April 9, 2019
    Date of Patent: January 12, 2021
    Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
    Inventors: Hung Chih Chiang, Cheng Yi Chang, Ting Wei Chang, Chi Shen Chang
  • Patent number: 10881288
    Abstract: An ophthalmic apparatus that includes a light source of wavelength sweeping type; a measurement optical system; a reference optical system; a light receiving element that receives interference light; a sample clock signal generator that generates a sample clock signal from the light from the light source, the sample clock signal cyclically changing at equal frequency intervals; a signal processor that samples an interference signal based on the sample clock signal, the interference signal being outputted from the light receiving element when the light receiving element receives the interference light. The ophthalmic apparatus generates period data based on the sample clock signal, the period data indicating a relationship between a period of the sample clock signal and time; and determines a processing duration of the interference signal sampled at the signal processor based on the period data.
    Type: Grant
    Filed: December 20, 2019
    Date of Patent: January 5, 2021
    Assignee: TOMEY CORPORATION
    Inventors: Yuji Nozawa, Takashi Sugaya, Chihiro Kato
  • Patent number: 10883931
    Abstract: Provided are an optical measuring instrument, a flow cytometer, and a radiation counter which reduces a size and a weight of a photodetector, and enables detection of weak pulsed light with a high degree of accuracy and at a high speed. A laser beam source irradiates a specimen to be measured with a laser beam and generates a light pulse of intensity corresponding to the irradiation. An imaging element provided with a pixel including a photoelectric conversion element and an amplification element which sequentially accumulates charges subjected to photoelectric conversion by the photoelectric conversion element for a predetermined period and outputs a voltage as a pixel signal according to an accumulated charge amount after the accumulation is completed through the amplification element, and detects a light amount of the light pulse on the basis of a pixel signals of a pixel group.
    Type: Grant
    Filed: February 10, 2017
    Date of Patent: January 5, 2021
    Assignee: SONY CORPORATION
    Inventors: Toshiyuki Nishihara, Kenichi Okumura
  • Patent number: 10883873
    Abstract: A rotating sample platform for SERS detection having sample holders for presenting a plurality of samples to a SERS laser at a speed and dwell time related to the Raman spectra. The sample holder may be designed to hold either slides or cuvettes, each of which contains either gold or silver nanoparticles. The sample holder for slides is configured for tilting each slide. The degree of tilt is captured by a wireless read head. A controller is configured to receive the wireless read head signals and the Raman spectra for each sample, correct the speed and dwell time and actuate a motor to rotate the sample platform at the corrected speed and dwell time. The rotating sample platform allows a set of slides or cuvettes in a sample holder to be presented to the SERS detector in a continuous manner, minimizing background corrections and sample adjustment time.
    Type: Grant
    Filed: October 17, 2019
    Date of Patent: January 5, 2021
    Assignee: KING FAHD UNIVERSITY OF PETROLEUM AND MINERALS
    Inventors: Tawfik Abdo Saleh Awadh, Abdulaziz Al-Saadi
  • Patent number: 10883880
    Abstract: An optical characteristic evaluation method evaluates unevenness of an optical characteristic in an optical film based on analysis of a polarized state of light transmitting through an optical film and an analyzer. The method includes the following, measuring a phase difference and an orientation angle in a plurality of positions; and quantifying and evaluating the unevenness of the optical characteristic based on a parameter of a vector of output light calculated by a formula 1 using a vector showing a polarized state of input light and a matrix showing a polarizing characteristic of the optical film and the analyzer. The formula 1 is as follows, formula 1: F2=M×F1, F1: Stokes vector or Jones vector of input light, F2: Stokes vector or Jones vector of output light, M: Mueller matrix or Jones matrix of the optical film as the evaluation target and the analyzer.
    Type: Grant
    Filed: October 15, 2019
    Date of Patent: January 5, 2021
    Assignee: KONICA MINOLTA, INC.
    Inventors: Osamu Masuda, Kazuhiko Hirabayashi, Hirofumi Tanaka, Koji Nakashima
  • Patent number: 10876832
    Abstract: A flexible apparatus is provided. The flexible apparatus includes a plurality of motion sensors mounted on different locations of the flexible apparatus, a storage configured to store operation information of the flexible apparatus corresponding to a bending shape, and a controller configured to determine a bending shape of the flexible apparatus based on a sensing value of each of the plurality of motion sensors, and to perform an operation corresponding to the determined bending shape based on the operation information stored in the storage.
    Type: Grant
    Filed: October 25, 2019
    Date of Patent: December 29, 2020
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Han-sung Lee, Geun-ho Lee
  • Patent number: 10876967
    Abstract: To acquire both excellent spectrum and sample image reflecting actual conditions of a sample, and to increase convenience of measurement, provided is a display device for a photometric analyzer, which is configured to irradiate a sample with light to analyze the sample, the display device being configured to display a measurement result of the photometric analyzer, and including: a controller; and a display, which is configured to display an image based on measurement data processed by the controller. The measurement data at least contains a spectrum indicating an intensity of emitted light, which is emitted by the sample irradiated with the light, and a sample image of the sample, which is taken by an imaging device. The display is configured to display the spectrum and the sample image in an arrangement in the same screen.
    Type: Grant
    Filed: July 20, 2018
    Date of Patent: December 29, 2020
    Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
    Inventors: Jun Horigome, Rino Nakajima, Yoichi Sato
  • Patent number: 10866082
    Abstract: A method for adjusting a measuring device having an interferometer unit with an optical axis, an optical distance measuring device with a measuring axis and a support slide that is moveable along a slide axis. The measuring axis is first aligned parallel to the slide axis. An adjustment body with a first spherical reflection and/or diffraction surface and a retro reflector at the back side is arranged at the support slide. It is brought into a first confocal position, in which a first center point of the first spherical reflection/diffraction surface coincides with the focus of the spherical wavefront that is emitted from the interferometer unit. The retro reflector defines a vertex that is located close to the first center point, such that the measuring axis of the distance measuring device extends close to the focus of the emitted spherical wavefront. In doing so, Abbe-faults can be reduced or eliminated.
    Type: Grant
    Filed: May 13, 2019
    Date of Patent: December 15, 2020
    Assignee: Carl Mahr Holding GmbH
    Inventors: Axel Wiegmann, Markus Lotz
  • Patent number: 10867828
    Abstract: Provided is an apparatus and method for correcting a marking position, in which, by measuring and correcting a marking position by using a processing film for position correction, marking may be accurately performed on a position on a semiconductor chip during a marking operation, before a marking operation is performed on semiconductor chips provided on a wafer. The apparatus for correcting a marking position of a wafer includes a support configured to support a processing film for position correction, a laser head configured to emit a laser beam to the processing film for position correction to form a pattern, a vision camera configured to obtain pattern position information, a movable table configured to move the support in a horizontal direction, and a controller configured to compare and match the pattern position information and marking position information set in the laser head.
    Type: Grant
    Filed: April 27, 2016
    Date of Patent: December 15, 2020
    Assignee: EO TECHNICS CO., LTD.
    Inventors: Sang Chul Choi, Soo Young Kim, Sun Youp Lee, Sung Beom Jung, Seung Kwan Choi
  • Patent number: 10866140
    Abstract: Provided is a spectrophotometer having a positional relationship between the spectroscope and a PDA that is set to have a distance between a reflection position of light reflected on a light receiving surface of a corresponding one of PDs constituting the PDA, being configured to receive at least light having a wavelength of from 200 nm to 300 nm, and an incident position at which light reflected at the reflection position is incident on a light receiving surface of the PDA after being re-reflected on the protective plate, the distance being equal to or less than a width dimension of any one of the PDs constituting the PDA.
    Type: Grant
    Filed: April 20, 2017
    Date of Patent: December 15, 2020
    Assignee: Shimadzu Corporation
    Inventors: Masato Watanabe, Masahide Gunji
  • Patent number: 10859440
    Abstract: A spectrometer engine and an adjustment method thereof are provided. The spectrometer engine includes a connector, a light sensor, a variable gain amplifier, a variable reference voltage generation circuit, an analog-to-digital converter and a control circuit. The light sensor senses a light to be measured coming from an object to be measured to generate a sensing signal. The variable gain amplifier amplifies the sensing signal according to a first setting parameter to generate an amplified signal. The variable reference voltage generation circuit provides a reference voltage according to a second setting parameter. The analog-to-digital converter converts the amplified signal to a digital signal according to the reference voltage. The control circuit reads the digital signal and adjusts at least one of the first to third setting parameters according to the digital signal for the spectrometer engine to measure the object to be measured again to generate another digital signal.
    Type: Grant
    Filed: July 17, 2019
    Date of Patent: December 8, 2020
    Assignee: InnoSpectra Corporation
    Inventors: Cheng-Hsiung Chen, Yung-Yu Huang, Ming-Hui Lin, He-Yi Hsieh, Hsi-Pin Li
  • Patent number: 10856739
    Abstract: A system for monitoring parameters of an object is described. The system comprising: a monitoring unit configured for performing one or more monitoring sessions on an object and collecting data from an inspection region on the object over time and generating monitored data indicative of the inspected region, a stimulation unit configured and operable for applying at least one selected external stimulation field on the object during said one or more monitoring sessions, and a control unit configured for receiving the monitored data from the monitoring unit and determining one or more selected parameters. The stimulation unit is configured for providing said at least one selected external stimulation field directed toward said inspection region from two or more different directions.
    Type: Grant
    Filed: November 21, 2017
    Date of Patent: December 8, 2020
    Assignee: CONTINUSE BIOMETRICS LTD.
    Inventors: Zeev Zalevsky, Nisim Nisan Ozana
  • Patent number: 10852238
    Abstract: A fluorescence image analyzer, analyzing method, and pretreatment evaluation method capable of determining with high accuracy whether a sample is positive or negative are provided. A pretreatment part performs pretreatment including a step of labeling a target site with a fluorescent dye to prepare a sample. A fluorescence image analyzer measures and analyzes the sample. The fluorescent image analyzer includes light sources to irradiate light on the sample, imaging part to capture the fluorescent light given off from the sample irradiated by light, and processing part for processing the fluorescence image captured by the imaging part. The processing part extracts the bright spot of fluorescence generated from the fluorescent dye that labels the target site from the fluorescence image for each of a plurality of cells included in the sample, and generates information used for determining whether the sample is positive or negative based on the bright spots extracted for each of the plurality of cells.
    Type: Grant
    Filed: July 17, 2019
    Date of Patent: December 1, 2020
    Assignee: SYSMEX CORPORATION
    Inventor: Kazuhiro Yamada
  • Patent number: 10852244
    Abstract: An image processing apparatus, an image processing method and a recording medium capable of detecting a plurality of breaks in a coating material and an inclined break of the coating material are provided. The image processing apparatus includes a grouping unit for extracting coating areas representing a coating material from an input image acquired by imaging an inspection object linearly coated with the coating material and grouping the coating areas for each sequence of linear parts, a calculation unit for calculating a line width in an orthogonal direction of a linear part for each of the linear parts in a plurality of portions of the coating area including end portions of the linear parts, a break detecting unit for detecting a break in the coating material based on the calculated line widths, and an output unit for outputting an indication representing occurrence of the break when the break is detected.
    Type: Grant
    Filed: September 17, 2018
    Date of Patent: December 1, 2020
    Assignee: OMRON Corporation
    Inventors: Yutaka Kiuchi, Yukihiro Komatsu
  • Patent number: 10852247
    Abstract: An optical inspection apparatus, including: an optical metrology tool configured to measure structures, the optical metrology tool including: an electromagnetic (EM) radiation source configured to direct a beam of EM radiation along an EM radiation path; and an adaptive optical system disposed in a portion of the EM radiation path and configured to adjust a shape of a wave front of the beam of EM radiation, the adaptive optical system including: a first aspherical optical element; a second aspherical optical element adjacent the first aspherical optical element; and an actuator configured to cause relative movement between the first optical element and the second optical element in a direction different from a beam axis of the portion of the EM radiation path.
    Type: Grant
    Filed: July 31, 2017
    Date of Patent: December 1, 2020
    Assignees: ASML Holding N.V., ASML Netherlands B.V.
    Inventors: Stanislav Smirnov, Johannes Matheus Marie De Wit, Teunis Willem Tukker, Armand Eugene Albert Koolen
  • Patent number: 10852241
    Abstract: A method for detecting molecular is related. The method includes providing a sample, in which a sample surface is distributed with analyte molecules; providing a carrier including a substrate, a middle layer and a metal layer, in which the middle layer is sandwiched between the substrate and the metal layer, the middle layer includes a base and a patterned bulge on a surface of the base, the patterned bulge includes a plurality of strip-shaped bulges intersected with each other to form a net and define a number of holes, and the metal layer is on the patterned bulge; placing the carrier on the sample surface to make the metal layer being attached to the sample surface, in which parts of the analyte molecules are formed on the metal layer; detecting the analyte molecules on the metal layer with a detector.
    Type: Grant
    Filed: August 31, 2018
    Date of Patent: December 1, 2020
    Assignees: Tsinghua University, HON HAI PRECISION INDUSTRY CO., LTD.
    Inventors: Ying-Cheng Wang, Yuan-Hao Jin, Qun-Qing Li, Shou-Shan Fan