Patents Examined by Tarifur R. Chowdhury
  • Patent number: 12292375
    Abstract: An analysis and observation device includes: an electromagnetic wave emitter that emits a primary electromagnetic wave; a reflective object lens having a primary mirror provided with a primary reflection surface reflecting a secondary electromagnetic wave and a secondary mirror provided with a secondary reflection surface receiving and further reflecting the secondary electromagnetic wave; first and second detectors that receive the secondary electromagnetic wave and generate an intensity distribution spectrum; and a controller that performs component analysis of a sample based on the intensity distribution spectrum. A transmissive region through which the primary electromagnetic wave is transmitted is provided at a center of the secondary mirror.
    Type: Grant
    Filed: May 9, 2023
    Date of Patent: May 6, 2025
    Assignee: KEYENCE CORPORATION
    Inventors: Ryosuke Imai, Kenichiro Hirose
  • Patent number: 12292382
    Abstract: A crystallinity measurement device includes a Raman spectroscopy unit configured to acquire a Raman spectrum of resin-containing material including crystalline thermoplastic resin; and an analysis unit configured to calculate crystallinity of the crystalline thermoplastic resin based on an intensity of a low-wavenumber spectrum that is a spectrum in a region of less than 600 cm?1, in the Raman spectrum.
    Type: Grant
    Filed: September 20, 2019
    Date of Patent: May 6, 2025
    Assignees: MITSUBISHI HEAVY INDUSTRIES, LTD., AKITA UNIVERSITY
    Inventors: Nobuyuki Kamihara, Naomoto Ishikawa, Kiyoka Takagi, Sota Kamo, Makoto Yamaguchi, Mitsutoshi Jikei, Kazuya Matsumoto, Mikio Muraoka
  • Patent number: 12292389
    Abstract: A defect inspection apparatus including a stand that supports a sample, an illumination optical system that irradiates the sample with illumination light, a scanning device that drives the sample stand to change position, detection optical systems that condense illumination scattered light from a surface of the sample, sensors that convert the condensed light into an electric signal and output a detection signal, a storage device that stores a plurality of feature vectors for each defect type, and a signal processing device that processes detection signals input from the plurality of sensors. The signal processing device calculates a measurement vector that is a feature vector of a defect on the surface of the sample, generates a feature vector of a virtual defect in which a form of the detection defect has been changed, from the actual measurement vector, and accumulates the feature vector of the virtual defect of one instruction defect.
    Type: Grant
    Filed: June 5, 2020
    Date of Patent: May 6, 2025
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventor: Toshifumi Honda
  • Patent number: 12292331
    Abstract: A diagnostic testing method for a detector of a spectrometer. The spectrometer comprises a source of line spectra configured to emit at least one branched pair of spectral lines from an excited species. The method comprises performing a plurality of detector diagnostic measurements and diagnosing a detector operating condition. Each detector diagnostic measurement comprises measuring an intensity of a first spectral line emitted by an excited species of the source of line spectra using the detector, and measuring an intensity of a second spectral line emitted by the excited species of the source of line spectra using the detector. The first and second spectral lines emitted by the excited species of the source of line spectra form a branched pair of spectral lines, and the spectrometer is controlled to vary the intensity of the first and second spectral lines incident on the detector for the plurality of detector diagnostic measurements.
    Type: Grant
    Filed: November 22, 2021
    Date of Patent: May 6, 2025
    Assignee: Thermo Fisher Scientific (Bremen) GmbH
    Inventors: Ayrat Murtazin, Sebastian Geisler
  • Patent number: 12287285
    Abstract: A sensor system, the manufacturing of such system, and the use of such system for optical detection of a target analyte in a gaseous medium are described. The sensor system includes a hollow waveguide that is provided with a reflective mirror layer along its inner wall and a concentrating coating of an inorganic sorption material. The mirror layer defines a light path for guiding light between a light inlet and a light outlet that are provided on opposing terminal ends of the hollow waveguide. The concentrating coating increases an effective concentration of target analytes, if present, and allows optical, preferably spectroscopic, analysis of the medium by recording transmission of light, preferably infrared light, guided through the hollow waveguide.
    Type: Grant
    Filed: June 24, 2021
    Date of Patent: April 29, 2025
    Assignee: Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
    Inventors: Arjen Boersma, Javier Nunez Villanueva, Evert Jonathan Van Den Ham
  • Patent number: 12287241
    Abstract: Provided are a device (4) and a method for online measuring a spectrum for a laser device. The device (4) for online measuring a spectrum for a laser device includes: a first optical path assembly (G1) and a second optical path assembly (G2), and the second optical path assembly (G2) and the first optical path assembly (G1) constitute a measurement optical path. The second optical path assembly (G2) includes: an FP etalon (15) and a grating (18). The homogenized laser beam passes through the FP etalon (15) to generate an interference fringe. The grating (18) is arranged after the FP etalon (15), or is arranged before the FP etalon (15) in the measurement optical path, and is configured to disperse the laser beam passing through the FP etalon (15).
    Type: Grant
    Filed: December 16, 2020
    Date of Patent: April 29, 2025
    Assignee: Beijing RSLaser Opto-Electroncis Technology Co., Ltd.
    Inventors: Guangyi Liu, Rui Jiang, Xiaoquan Han, Jiangshan Zhao, Pengfei Sha, Qingqing Yin, Hua Zhang, Xinyue Hu
  • Patent number: 12287292
    Abstract: A method for detecting an analyte comprises the following steps: providing a SERS-active substrate and a Raman spectra database; applying a sample onto the SERS-active substrate; applying an incident light by a Raman spectrometer onto the SERS-active substrate to generate a Raman spectrum of the sample; and comparing the Raman spectrum of the sample with a Raman spectra database to identify an analyte in the sample. The SERS-active substrate comprises: a support; a first dielectric layer disposed on the support, wherein the first dielectric layer is formed by a plurality of first nanofibers; and a plurality of noble metal particles formed on the plurality of first nanofibers.
    Type: Grant
    Filed: June 8, 2023
    Date of Patent: April 29, 2025
    Assignee: National Cheng Kung University
    Inventors: Jiunn-Der Liao, Han Lee, Kuan-Hung Liu
  • Patent number: 12287191
    Abstract: Disclosed herein is a roundness measuring device and a roundness measuring method of a coating roll for battery manufacturing. The roundness measuring device of a coating roll that supports an electrode sheet when the electrode sheet is coated with an electrode slurry, the roundness measuring device comprising: a displacement sensor spaced apart from the coating roll and configured to measure roundness of the coating roll in a non-contact manner; and a support member on which the displacement sensor is installed and which extends in a length direction of the coating roll, wherein the displacement sensor is installed as a plurality of displacement sensors on the support member in the length direction of the coating roll.
    Type: Grant
    Filed: January 5, 2022
    Date of Patent: April 29, 2025
    Assignee: LG Energy Solution, Ltd.
    Inventors: Jae Young Sung, Joon Sun Park, Chae Gyu Lee, Duck Joong Yun, Jeong Yong Lee, Woo Jin An, Koo Youn Hwang, Won Hak Cho, Jin Ki Han
  • Patent number: 12281888
    Abstract: Optically computed phase imaging systems and methods are provided. An example system includes an interferometer configured to output 3D spatial-spectral data of a sample including an interferometric signal and an optical computation assembly having a spatial light modulator configured to modulate the 3D spatial-spectral data with a modulation pattern. The modulation pattern modulates the interferometric signal along a spectral dimension to select a depth to obtain a sample signal at the selected depth and modulates the interferometric signal along a first spatial dimension to create a waveform to facilitate phase extraction. The system further includes a detector configured to detect 2D spatial data of the sample. The system further includes a processor coupled to a memory, the processor configured to process the 2D spatial data to extract phase information of the sample.
    Type: Grant
    Filed: November 10, 2022
    Date of Patent: April 22, 2025
    Assignee: New Jersey Institute of Technology
    Inventors: Xuan Liu, Yuwei Liu, Yuanwei Zhang, Zhaoxiong Wan
  • Patent number: 12281992
    Abstract: An optical technique for voltage contrast imaging of the active electronic properties of semiconductors, including semiconductor surfaces, periodic structures, and electrically active defects, is disclosed. A pump laser beam is used to produce a modulated photovoltage in a semiconductor sample and a second probe laser beam is used to detect synchronous changes in the reflectance of the sample, resulting in a non-contact voltage contrast imaging capability. Exemplary optical configurations enabling high-throughput voltage contrast inspection of electrically active defects are discussed.
    Type: Grant
    Filed: July 30, 2022
    Date of Patent: April 22, 2025
    Inventor: William W. Chism, II
  • Patent number: 12281987
    Abstract: The invention provides a method for homogenized coherent excitation of a sample for determining molecular structure. The method includes selecting a monochromatic coherent light, homogenizing the monochromatic coherent light; irradiating the sample with the homogenized monochromatic light; collecting the Raman scattered light to obtain a profile and analyzing the profile to obtain chemical specific signature of the sample. The invention also provides a method for obtaining two dimensional imaging of a sample using irradiation of large sample area by homogenized monochromatic light without compromise in spatial resolution. A system for homogenized coherent excitation of a sample for determining molecular structure is also provided.
    Type: Grant
    Filed: December 22, 2021
    Date of Patent: April 22, 2025
    Assignee: INDIAN INSTITUTE OF SCIENCE
    Inventors: Siva Umapathy, Sanchita Sil, Dipak Kumbhar, Srividya Kumar
  • Patent number: 12276599
    Abstract: A temporal magnification spectrometer includes a dual-chirp comb source, a signal leg, a local oscillator leg, an optical detector, and a temporal magnification analyzer. The dual-chirp comb source produces optical carrier laser light. A signal comb having signal linearly chirped waveforms interacts with a sample to produce a transmitted signal comb. The local oscillator leg produces a local oscillator comb having local oscillator linearly chirped waveforms. The optical detector receives the transmitted signal and local oscillator combs and produces an RF domain signal. The analyzer receives and Fourier transforms the RF domain signal to produce an RF comb, which is sampled to produce sampled RF comb lines, which are normalized to produce temporally magnified sample frequency domain data. Intermediate sample temporal data are normalized to produce a steady-state sample spectral response.
    Type: Grant
    Filed: May 2, 2023
    Date of Patent: April 15, 2025
    Assignee: GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
    Inventors: David Francis Plusquellic, Jasper Rose Stroud
  • Patent number: 12276525
    Abstract: A multifunctional ranging telescope includes a main body, a wind direction and wind speed sensing device, a display device and a power source. The wind direction and wind speed sensing device is movably connected to the main body and includes a sensing element. When the wind direction and wind speed sensing device moves to a sensing position, the sensing element is located outside the main body. The display device is located on a surface of the main body and electrically connected to the wind direction and wind speed sensing device to display a wind direction and wind speed information. The power source is configured to supply power to the wind direction and wind speed sensing device and the display device.
    Type: Grant
    Filed: December 27, 2022
    Date of Patent: April 15, 2025
    Assignee: Shenzhen Mileseey Technology Co., Ltd.
    Inventors: Jiefeng Huang, Jingzhuo Huang, Huiyuan Jian, Jianjie Yang, Zhi Chou
  • Patent number: 12276548
    Abstract: Embodiments of the present invention relate to apparatus and methods for dual comb spectroscopy with deterministic stepping and scanning of temporal pulse offset. In one embodiment, the present invention relates to a novel dual-comb spectroscopy including mode locked robust Er-combs and digital phase-locking electronics for step scanning between the two frequency combs and applicable to any phase-locked dual-comb system. The tight phase control of the DCS source allows for the control of temporal offset between the two comb pulses during measurements.
    Type: Grant
    Filed: May 1, 2023
    Date of Patent: April 15, 2025
    Assignee: GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE
    Inventors: Ian Robert Coddington, Nathan Reynolds Newbury, Jean-Daniel Deschenes, Fabrizio Raphael Giorgetta, Esther Baumann
  • Patent number: 12276543
    Abstract: A readout circuit for an amplitude modulating sensor includes a first and second wavelength light source; an optical coupler coupled to receive a first light signal from the first wavelength light source and a second light signal from the second wavelength light source; a frequency selector that allows for the first light signal to pass to the amplitude modulating sensor; and a detector system coupled to the optical coupler to receive the first light signal and the second light signal after the first light signal is modulated by the amplitude modulating sensor and independently detect the two signals. The detector system generates electronic signals representing the modulated first light signal and the second light signal and removes a common mode signal of the modulated first light signal and the second light signal, removing common mode noise or attenuation in the modulated first light signal.
    Type: Grant
    Filed: August 31, 2022
    Date of Patent: April 15, 2025
    Assignee: INTERDISCIPLINARY CONSULTING CORPORATION
    Inventors: David Alan Mills, William C. Patterson
  • Patent number: 12276490
    Abstract: Implementations disclosed describe, among other things, a system and a method of scanning a substrate with a beam of light and detecting for each of a set of locations of the substrate, a respective one of a set of intensity values associated with a beam of light reflected from (or transmitted through) the substrate. The detected intensity values are used to determine a profile of a thickness of the substrate.
    Type: Grant
    Filed: July 8, 2022
    Date of Patent: April 15, 2025
    Assignee: Applied Materials, Inc.
    Inventors: Mehdi Vaez-Iravani, Todd J. Egan, Gopalakrishna B. Prabhu
  • Patent number: 12270729
    Abstract: A crossbeam for measuring deformation velocities of a surface of a material under a dynamic load includes a crossbeam body, a first type of velocimeter and a second type of velocimeter-mounted on the crossbeam body. The crossbeam body is mounted on a measurement carrier. The measurement carrier is configured to move along the surface of the material and apply a dynamic load to the surface. The first type of velocimeter is configured to measure the vertically resilient deformation velocity of the surface behind an action force of the dynamic load. The second type of velocimeter is configured to measure the vertical downward deformation velocity of the surface in front of the action force of the dynamic load. The vertically resilient deformation velocity and the vertically downward deformation velocity of the surface can be simultaneously and quickly obtained by the first and second types of velocimeters.
    Type: Grant
    Filed: March 8, 2019
    Date of Patent: April 8, 2025
    Assignee: WUHAN OPTICS VALLEY ZOYON SCIENCE AND TECHNOLOGY CO., LTD.
    Inventors: Min Cao, Dejin Zhang, Hong Lin, Xinlin Wang, Yi Lu
  • Patent number: 12270705
    Abstract: In an embodiment, an apparatus includes a meta-optics lens having a point spread function. The meta-optics lens is configured to receive light associated with a scene and output transformed light. At least one value of at least one mathematical property of the transformed light is dependent upon a set of wavelengths associated with the transformed light. The apparatus further includes a processor configured to receive a representation of the transformed light. The processor is further configured to determine the at least one value of the at least one mathematical property of the transformed light using the representation of the transformed light. The processor is further configured to determine spectrum information associated with the scene based on the at least one value and the point spread function.
    Type: Grant
    Filed: September 9, 2022
    Date of Patent: April 8, 2025
    Assignee: Tunoptix, Inc.
    Inventors: Alan Zhan, Shane Alexander Colburn, Arka Majumdar
  • Patent number: 12269032
    Abstract: The single-use disposable spectrophotometer described herein can measure one or more blood chemistry analytes from a drop of whole blood. A passive filtration system takes whole blood and delivers plasma along with a dissolved reporter molecule to one or more spectrophotometers which can operate with narrow band optical spectrum centered on an optical detection frequency. The spectrophotometer detects the changes in absorption of the plasma as a result of a chemistry reaction to determine the concentration or activity of one or more analytes.
    Type: Grant
    Filed: September 1, 2022
    Date of Patent: April 8, 2025
    Assignee: In Diagnostics, Inc.
    Inventor: Octavian Florescu
  • Patent number: 12270903
    Abstract: Disclosed herein are methods, devices, modules, and systems which may be employed for accurate targeting of objects. A method of point-to-point targeting may be implemented by systems with two or more sensors to locate an object and coordinate a handoff between the two or more sensors. These methods, devices, modules, and systems may be used for automated crop cultivation or maintenance. Devices disclosed herein may be configured to locate, identify, and autonomously target a weed with a beam, such as a laser beam, which may burn or irradiate the weed. The methods, devices, modules, and systems may be used for agricultural crop management or for at-home weed control.
    Type: Grant
    Filed: January 14, 2022
    Date of Patent: April 8, 2025
    Assignee: Carbon Autonomous Robotic Systems Inc.
    Inventor: Alexander Igorevich Sergeev