Abstract: A test method and system for cut-in voltage. The method comprises: coarse scanning of the cut-in voltage: a grid voltage, i.e., the cut-in voltage, is quickly determined when a drain terminal current is greater than a target current for the first time (100); accurate scanning of the cut-in voltage: a scanning step length is shortened continuously until the scanning step length is shorter than a preset step length, and each time the scanning step length is shortened, the scanning is conducted according to the current shortened scanning step length on the basis of the cut-in voltage determined in the former time, and then the cut-in voltage under the condition of the current shortened scanning step length is determined again (200). The scanning voltage is automatically increased or decreased by the test method and system through adding high resolution and high precision test conversion into a second scanning test, and therefore the testing of the cut-in voltage becomes more efficient and more accurate.

Abstract: A resistivity logging system includes a plurality of excitation electrodes, at least one return electrode, and a plurality of monitor electrodes. The resistivity logging system also includes a controller that determines a level of excitation current to be emitted by at least one of the plurality of excitation electrodes during a subsequent excitation cycle based on a comparison of measured downhole parameter values corresponding to excitation current emitted in two previous excitation cycles.

Abstract: An asset management system comprising an asset management server connected to a plurality of distributed HF sensitive measurement devices each having at least one inseparable asset tag being located outside a high frequency shield which shields an internal circuitry of the measurement device from external high frequency signals and being configured to provide asset data of the respective measurement device to be processed by the asset management server.

Abstract: A method and apparatus for measuring thickness of a film in a solar cell provides for directing light emitted at multiple emission wavelengths, to a surface of the solar cell. Each emission results in the generation of a responsive photo current. The photo currents are read by a current meter having one contact coupled to a surface of the solar cell and another contact coupled to another surface. The currents associated with each of the different light emissions are identified and the thickness of a film in the solar cell is calculated based on the two currents or associated quantum efficiencies, and associated absorption coefficients. In one embodiment, the film thickness is the thickness of a CdS or other buffer film in a thin film solar cell.

Abstract: An arc fault circuit interrupter test circuit is disclosed. The test circuit incorporates a controller along with at least one power transistor, a current sense circuit and a voltage sense circuit. When the power transistor is operated, the current flowing through the transistor is sensed, and if the current is not at least equal to a threshold value, the voltage at which the power transistor is operated is increased.

Abstract: A noise test apparatus includes a ground plate, a base plate including a ground plate, the ground plate being configured to support a display panel. A first antenna configured to receive electromagnetic waves irradiated by the display panel and disposed on the base plate adjacent to a first side of the ground plate. A second antenna configured to receive the electromagnetic waves irradiated by the display panel and disposed on the base plate adjacent to a second side of the ground plate, the second side extending substantially perpendicular to the first side.

Abstract: Disclosed is a magnetoresistive magnetic field gradient sensor, comprising a substrate, a magnetoresistive bridge and a permanent magnet respectively disposed on the substrate; the magnetoresistive bridge comprises two or more magnetoresistive arms; each magnetoresistive arm consists of one or more magnetoresistive elements; each magnetoresistive element is provided with a magnetic pinning layer; the magnetic pinning layers of all the magnetoresistive elements have the same magnetic moment direction; the permanent magnet is disposed adjacent to each magnetoresistive arm to provide a bias field, and to zero the offset of the response curve of the magnetoresistive element; the magnetoresistive gradiometer includes wire bonding pads that can be electrically interconnected using wire bonding to an ASIC or to the lead frame of a semiconductor chip package.

Abstract: A system for use in downhole detection comprises a downhole arrangement defining a throughbore and a tool deployable through the throughbore of the downhole arrangement. The system further comprises a primary electromagnetic element provided on one of the downhole arrangement and the deployable tool and a secondary electromagnetic element provided on the other of the downhole arrangement and the deployable tool, wherein the primary and secondary electromagnetic elements are configurable for electromagnetic coupling therebetween. Such a system may be used for determining a status and/or an identity of a downhole tool in an oil or gas well from a determined degree of electromagnetic coupling between the primary and secondary electromagnetic elements.

Abstract: A method of measuring semiconductor output characteristics is provided that includes connecting a pulse generator to the gate structure of a semiconductor device, and applying a plurality of voltage pulses at least some of which having a different pulse width to the gate structure of the semiconductor device. The average current is measured from the drain structure of the device for a duration of each pulse of the plurality of pulses. From the measured values for the average current, a self-heating curve of the average current divided by the pulse width is plotted as a function of the pulse width. The self-heating curve is then extrapolated to a pulse width substantially equal to zero to provide a value of drain current measurements without self-heating effects.

Abstract: According to one embodiment, a tester includes a magnetic shield portion having a space which is shielded from an external magnetic field, a controller generating a test signal for testing a magnetic memory having a magnetoresistive element provided in the space, an interface portion in the space, the interface portion which functions as an interface between the controller and the magnetic memory, and a magnetic field generating portion in the space, the magnetic field generating portion generating a test magnetic field while the magnetic memory is tested by the test signal.

Abstract: Devices and methods are provided that facilitate improved input device performance. The devices and methods utilize a first substrate with proximity sensor electrodes and at least a first force sensor electrode disposed on the first substrate. A second substrate is physically coupled to the first substrate, where the second substrate comprises a spring feature and an electrode component. The electrode component at least partially overlaps the first force sensor electrode to define a variable capacitance between the first force sensor electrode and the electrode component. The spring feature is configured to facilitate deflection of the electrode component relative to the first force sensor electrode to change the variable capacitance. A measure of the variable capacitance may be calculated and used to determine force information regarding the force biasing the input device.

Abstract: A built-in test system includes a control circuit, a transient voltage suppressor circuit, and a test switch. The control circuit is configured to receive a signal, and the transient voltage suppressor circuit includes first and second transient voltage suppressors connected in series between the signal and ground. The test switch is connected to selectively conduct current between the signal and a node between the first and second transient voltage suppressors. The control circuit is configured to control the test switch to test the first and second transient voltage suppressors.

Abstract: A method for performing diagnostics on a transformer includes generating, by a voltage generator, an AC voltage and applying the AC voltage to a winding or phase of the transformer. Current flowing from the generator to the winding or phase is decomposed into a plurality of harmonic components. Respective magnitudes of the plurality of harmonic components are compared with corresponding magnitudes of harmonic components associated with one or more benchmark transformers of a known condition to determine whether the condition of the transformer matches the condition of one or more benchmark transformers.

Abstract: A test apparatus that is usable with a switchgear cabinet is structured to mimic the operation of a circuit interruption device being received in the interior of the switchgear cabinet by providing a number of structures such as an engagement wall that engages a shutter assembly and moves it from a deployed state to an undeployed state. The engagement wall in the test apparatus has a number of openings formed therein that permit a number of electrical conductors and the relevant portions of the shutter assembly to be viewed from the exterior of the switchgear cabinet.

Abstract: There is described a device for removing an offset from a signal, the device comprising (a) a frequency estimation unit (260) for estimating a frequency of the signal, (b) an offset estimation unit (222) for estimating the offset in the signal by applying an adaptive low pass filter to the signal, wherein a cut-off frequency of the adaptive low pass filter is determined based on the frequency of the signal estimated by the frequency estimation unit (260), and (c) a subtraction unit (230) adapted to subtract the offset estimated by the offset estimation unit (222) from the signal. There is also described a filter unit comprising the device. Furthermore, there is described a corresponding method of removing an offset from a signal as well as a computer program and a computer program product for performing the method by means of a computer.

Abstract: A handler apparatus adjusts a position of an actuator and enhances positional accuracy of a device under test. Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and an actuator adjusting section that adjusts an amount of driving of the actuator by causing the actuator to fit an actuator fitting unit.

Abstract: An apparatus includes three components. The first component includes a first transmission line; the second component is coupled with the first component and includes a second transmission line; and the third component electrically coupled with the first component and/or the second component. The transmission lines each include a substrate with a p-well or n-well within the substrate and a shielding layer over the p-well or n-well. The transmission lines also each include a plurality of intermediate conducting layers over the shielding layer, the plurality of intermediate conducting layers coupled by a plurality of vias. The transmission lines further each include a top conducting layer over the plurality of intermediate conducting layers.

Abstract: Techniques for detecting noise with a capacitive sensing device. The includes driving a set of one or more sensor electrodes of a plurality of sensor electrodes with a sensing signal at a first frequency, receiving resulting signals based on the sensing signal for each of the one or more sensor electrodes driven, probing the set of one or more sensor electrodes to obtain a set of probing signals, and summing the probing signals of the set of probing signals to generate a noise-analysis signal.

Abstract: An antenna 3 of an electromagnetic probe used in investigation of geological formations GF surrounding a borehole WBH comprises a conductive base 31 and an antenna element 32. The conductive base 31 comprises an opened non-resonant cavity 33. The antenna element 32 is embedded in the cavity 33 and goes right through the cavity. The antenna element 32 is isolated from the conductive base 31. The antenna element 32 is coupled to at least one electronic module via a first 34A and a second 34B port, respectively. The electronic module operates the antenna so as to define either a substantially pure magnetic dipole, or a substantially pure electric dipole.

Abstract: The disclosure describes techniques for determining an ion concentration in a sample. According to these techniques of this disclosure, an ion concentration of a sample is determined based on detecting at least one change in an electrical characteristic of a semiconductor device due to a gate insulation layer of the semiconductor device placed in contact with the sample.