Patents Examined by Thomas Valone
  • Patent number: 7746079
    Abstract: An ion current detecting apparatus includes a capacitor C that is charged as a spark plug 3 discharges, a Zener diode ZD that limits a maximum voltage of the capacitor C while charging, a detection resistor R2 through which a discharge current of the capacitor C flows, and a comparator circuit 5 that compares a current value of the detection resistor R2 with a predetermined value. A charge quantity Q of the capacitor C at discharge start is set so that, as a consequence of a discharging operation of the capacitor C, discharge duration required until the current value of the detection resistor R2 falls below the predetermined value becomes longer than time duration in which the ion current generated by fuel combustion in the engine combustion chamber lasts. The ion current detecting apparatus automatically detects degradation in an insulation resistance in the spark plug, ensuring normal operation in engine control.
    Type: Grant
    Filed: August 9, 2005
    Date of Patent: June 29, 2010
    Assignee: Diamond Electric MFG. Co., Ltd.
    Inventors: Yoshiyuki Fukumura, Mitsuhiro Izumi, Shinobu Sugisaki, Tsutomu Kusuhara
  • Patent number: 7746052
    Abstract: A spectrum analyzer is provided with frequency-scalable circuit architectures that extend the bandwidth of the spectrum analyzer using an array of couplers. The array of couplers is distributed along the RF signal path at one end, and interfaced to one or more frequency-translation devices such as mixers or samplers at the other. In a first architecture, a single mixer is employed with an LO signal applied to one input and coupler outputs providing RF signals to another input, with switching controlled to select one coupler's RF output to provide to the mixer. In a second architecture, a separate mixer is used, one for each coupler RF signal, with switches selecting one of the mixer IF outputs to select a desired output frequency. Both the first and second embodiments eliminate switching and its associated loss and frequency limitations from the main RF signal path to enable wideband high-dynamic-range spectrum analysis.
    Type: Grant
    Filed: October 16, 2007
    Date of Patent: June 29, 2010
    Assignee: Anritsu Company
    Inventor: Karam Michael Noujeim
  • Patent number: 7746083
    Abstract: A communications connector tester for quickly and accurately analyzing communications connectors at production to determine whether the connectors are fit for use in certain communications applications is disclosed. Test signals at several discrete frequencies are sequentially inputted into pairs of conductors in the communications connector under test, and output signals are detected for the pairs under test. The output signals are compared to acceptable ranges for certain applications of the communications connector and the connector is passed or failed for certain applications based on the output signal values. Near-end crosstalk, far-end crosstalk, return loss, insertion loss, and other communications connector qualities may be measured using the present invention.
    Type: Grant
    Filed: November 29, 2006
    Date of Patent: June 29, 2010
    Assignee: Panduit Corp.
    Inventors: Masud Bolouri-Saransar, Michael V. Doorhy
  • Patent number: 7746085
    Abstract: A micromechanical sensor having an analyzer circuit and at least two detecting elements, each of the two detecting elements being connected to the analyzer circuit by at least one signal line. At least one signal line is connected to both detecting elements.
    Type: Grant
    Filed: January 20, 2005
    Date of Patent: June 29, 2010
    Assignee: Robert Bosch GmbH
    Inventors: Gerald Hopf, Oliver Kohn, Thomas Walker
  • Patent number: 7746084
    Abstract: An unbalanced line-to-line current is injected at an injected frequency in a three-phase ac circuit. A first set of voltages and currents are obtained. A first set of transformed voltages and transformed currents are produced. The circuit is injected with a second unbalanced line-to-line current at a frequency linearly independent of the injected frequency. A second set of voltages and current are obtained. A second set of transformed voltages and transformed currents are produced The impedance of a source portion and a load portion of the circuit are calculated using the first and second set of transformed voltages, and the first and second set of transformed currents.
    Type: Grant
    Filed: October 5, 2007
    Date of Patent: June 29, 2010
    Assignees: Newport News Shipbuilding and Dry Dock Company, The Curators of the University of Missouri
    Inventors: Mohamed Belkhayat, Jing Huang, Keith Corzine
  • Patent number: 7746081
    Abstract: A cable detection apparatus includes; a plurality of conductors which transmit signal information, a detection control circuit operably connected to a first conductor of the plurality of conductors, wherein the detection control circuit outputs an output signal as a first detection signal when a predetermined signal level is detected from the first conductor and outputs a second detection signal when the predetermined signal level is not detected from the first conductor, and a multiplexer operably connected to the detection control circuit which receives one of the first and second detection signals and selects between a digital signal input and an analog signal input based on the output signal of the detection control circuit and outputs the selected signal input to a conductor of the plurality of conductors.
    Type: Grant
    Filed: December 8, 2006
    Date of Patent: June 29, 2010
    Assignee: General Electric Company
    Inventor: David Shannon Slaton
  • Patent number: 7741856
    Abstract: In an immunity test system of the present invention, a boundary point detection device changes a signal level of a transmission signal input to an antenna through a level adjusting device while monitoring an operation of an electronic equipment, and thereby detects a signal level of the transmission signal at a boundary point, at which the electronic equipment is changed from a normal operation state to an abnormal operation state, or vice versa, due to the test wave; and a test result storing device calculates an electric field strength of the test wave at the boundary point by using conversion data based on the signal level of the transmission signal at the boundary point detected by the boundary point detection device, and stores in a storage device a calculation result of the electric field strength as well as a test condition used for obtaining the electric field strength.
    Type: Grant
    Filed: May 26, 2006
    Date of Patent: June 22, 2010
    Assignee: Masprodenkoh KabushikiKaisha
    Inventor: Toshihiro Sugiura
  • Patent number: 7741850
    Abstract: An electric potential measuring apparatus including a substrate disposed facing a measurement object, a detecting electrode provided insulated from the substrate, and a capacity modulating unit for modulating a coupling capacity between the detecting electrode and the measurement object. In the electric potential measuring apparatus, a region with a dielectric constant less than a dielectric constant of the substrate is formed in the substrate to achieve an increase in resistivity of a portion of the substrate between detecting electrodes, or a decrease in a stray capacity between the detecting electrode and the substrate.
    Type: Grant
    Filed: March 21, 2006
    Date of Patent: June 22, 2010
    Assignee: Canon Kabushiki Kaisha
    Inventors: Yoshikatsu Ichimura, Yoshitaka Zaitsu, Takashi Ushijima, Atsushi Kandori
  • Patent number: 7714591
    Abstract: A pressure sensing apparatus including: at least one deflectable diaphragm having a center, wherein each diaphragm supports: at least one positive piezoresistive gauge and at least one negative piezoresistive gauge coupled in series across a voltage differential in a half-Wheatstone bridge configuration having an output between the positive and negative piezoresistive gauges; and, a compensating piezoresistive gauge coupled in series with the half-Wheatstone bridge configuration across the voltage differential; wherein, the compensating piezoresistive gauge is nearer the center of the diaphragm than the negative piezoresitive gauge, the negative piezoresitive gauge is nearer the center of the diaphragm than the positive piezoresitive gauge, and the compensating piezoresistive gauge linearizes the half-Wheatstone bridge output.
    Type: Grant
    Filed: August 30, 2006
    Date of Patent: May 11, 2010
    Assignee: Kulite Semiconductor Products, Inc.
    Inventors: Anthony D. Kurtz, Joseph R. Van DeWeert
  • Patent number: 7646190
    Abstract: A stress measurement device includes a current supply portion; a series circuit which is connected to the current supply portion and has a piezoresistive element that forms a single gauge resistance and a compensating diode that is connected in series to the piezoresistive element; and a voltage measuring portion that measures voltage between both ends of the series circuit. The single gauge resistance has a piezoresistive effect in which a resistance value changes according to applied stress, and a positive temperature characteristic in which the resistance value increases depending on an increase in temperature. The compensating diode is provided in a forward direction with respect to the current supply portion and has a negative temperature characteristic in which a voltage between an anode and a cathode of the compensating diode decreases depending on the increase in temperature.
    Type: Grant
    Filed: March 23, 2007
    Date of Patent: January 12, 2010
    Assignee: Toyota Jidosha Kabushiki Kaisha
    Inventors: Kentaro Mizuno, Shoji Hashimoto, Hidenori Moriya, Hiromichi Yasuda
  • Patent number: 7495447
    Abstract: A method and system for evaluating the durability of spark plugs. A test system simulates the pressure, temperature, and exhaust flow of an internal combustion engine, and has a test chamber in which these simulated conditions exist. A number of spark plugs are installed in the test chamber and are cycled through a desired ignition cycle. The test chamber temperature and pressure may be precisely controlled, as well as the duty cycle of spark events.
    Type: Grant
    Filed: August 31, 2006
    Date of Patent: February 24, 2009
    Assignee: Southwest Research Institute
    Inventors: Terrence Francis Alger, II, Darius Mehta, Charles Edward Roberts, Jr.
  • Patent number: 7403020
    Abstract: For measuring unknown capacitances, which exist in capacitive sensors, such as pressure, moisture, inclination sensors and the like, the invention proposes a capacitance measurement method, in which a capacitance to be measured is charged and discharged across a resistor and the charging or discharging time up to a preset voltage value is measured and in which the charging/discharging times of a known reference capacitance and stray capacitances are measured across a resistor. The invention also proposes a circuit for measuring an unknown capacitance to be measured and having a voltage source, a resistor for charging or discharging at least the measuring capacitor, at least one switch for connecting and disconnecting the measuring capacitor with respect to the voltage supply and a time measuring device, in which switches are provided for connecting and disconnecting the measuring capacitor and at least one reference capacitor with respect to the circuit.
    Type: Grant
    Filed: May 5, 2006
    Date of Patent: July 22, 2008
    Assignee: acam-messelectronic GmbH
    Inventors: Augustin Braun, Friedrich Bohnmüller
  • Patent number: 7362109
    Abstract: Diamond look-alikes like cubic zirconium, moissanite and other synthetic stones, are distinguishable from nature diamonds based on their thermal and/or electrical conductivities. Germ testers that are on the market are capable of evaluating these two parameters as is the present invention. Electrical resistance of moissanites reaches hundreds of thousands megohms. Existing gem esters use test voltage of 1000 volts, to be able to detect electrical conductivity in most moissanites. Still, reliable detection of high resistance moissanites is difficult. Proposed invention uses significant photo conductivity of moissanites, which was observed by the inventors, to facilitate measurement of electrical conductivity in the toughest gems, to reduce test voltage applied to gems to 300 volts, and to limit electrical test current through a gem to no more than a few micro-amps.
    Type: Grant
    Filed: October 18, 2005
    Date of Patent: April 22, 2008
    Inventor: Boris Zolotar Loginov
  • Patent number: 7345500
    Abstract: A system and method for testing devices. The system includes a plurality of pads and a decoder coupled to a plurality of devices. The decoder is configured to receive a plurality of selection signals from the plurality of pads and select a device from the plurality of devices based on at least information associated with the plurality of selection signals. Additionally, the system includes one or more pads connected to the selected device. At least one of the one or more pads is not connected to any of the plurality of devices other than the selected device. The one or more pads are used for testing the selected device.
    Type: Grant
    Filed: January 24, 2006
    Date of Patent: March 18, 2008
    Assignee: Semiconductor Manufacturing International (Shanghai) Corporation
    Inventor: Gong Bin
  • Patent number: 7304484
    Abstract: A method for the temperature compensation of a resistance measuring bridge, such as in particular a Wheatstone bridge, is characterized in that a capacitor positioned between the input circuit and a resistance switching circuit of the Wheatstone bridge is successively discharge by means of at least one Wheatstone bridge resistor. In a device for the temperature compensation of a measuring bridge, particularly a Wheatstone bridge, having a measuring bridge and a compensating resistor in the input circuit, one or two switches are located in the resistance switching circuit branch of the measuring bridge as a contact point with the latter and a capacitor is located between the input circuit and the resistance switching circuit branch.
    Type: Grant
    Filed: April 27, 2006
    Date of Patent: December 4, 2007
    Assignee: acam-messelectronic GmbH
    Inventors: Augustin Braun, Friedrich Bahnmüller
  • Patent number: 7271574
    Abstract: Novel systems of an evanescent microwave probe (EWP) are disclosed, which enable measurements of physical properties of a sample with enhanced sensitivity and resolution, simultaneously. In one embodiment, new shielding features are added to the probe (which may be of either a sharpened tip or loop configuration) to reduce the effects of residual far field radiation, while maintaining the probe section that extends beyond the shielding aperture of the resonator. To further increase the sensitivity of the instrument, an automatic gain-controlled active feedback loop system may be added to the probe resonator to form a self-oscillator. This new active circuit feature significantly increases the effective Q of the resonator probe, enhancing the sensitivity of both the frequency and Q measurement.
    Type: Grant
    Filed: July 11, 2005
    Date of Patent: September 18, 2007
    Assignee: Intematix Corporation
    Inventors: Xiao-Dong Xiang, Haitao Yang, Gang Wang
  • Patent number: 7268563
    Abstract: An apparatus for measuring spin polarization via Point Contact Andreev Reflection (PCAR) at a magnet-superconductor junction, with variable magnetic fields and temperature control. A cryostat probe investigates superconducting energy gap and Andreev reflection in superconductor-half metal junctions, in a wide range of magnetic fields and temperature from 2K-300K. The cryostat probe is integrated with a commercial physical properties measurement system. The measurement probe includes a rotary-translation stage with coarse and fine screws that enable a user to make point contacts in a cryogenic, evacuated environment where the point contact junction can be controlled at room temperature by turning a knob. Copper wires are connected as electrical leads from an aluminum housing, descend down to a copper housing, for measurement, when contact is made by tip with a half-metal sample, such as CrO2.
    Type: Grant
    Filed: August 26, 2005
    Date of Patent: September 11, 2007
    Assignee: University of South Florida
    Inventors: Srikanth Hariharan, Jeff T. Sanders
  • Patent number: 7262603
    Abstract: A system and method for sensing the formation of tin whiskers is presented. An assembly substrate includes whisker detectors at various locations for detecting tin whiskers in an X direction, a Y direction, and a Z direction relative to the assembly substrate. Each whisker detector includes sense traces and a trace bridge that produce “planar gaps” and “orthogonal gaps” that are smaller than trace gaps produced by other traces on the assembly substrate. As such, tin whiskers short across the planar gaps and orthogonal gaps before they short across trace gaps. When the assembly substrate is finished with processing steps, a system tester performs a continuity test on the whisker detectors. When the continuity test fails, an operator is notified to check for tin whiskers on the assembly substrate. Once shipped, a processor monitors the whisker detectors for shorts throughout the product's lifecycle.
    Type: Grant
    Filed: June 28, 2006
    Date of Patent: August 28, 2007
    Assignee: Lenovo (Singapore) Pte. Ltd
    Inventors: Farrel David Benton, Shane Christopher Branch, Robert J. Kapinos, Alberto Jose Rojas, James Stephen Rutledge, James C. Salembier, Simon David Nicholas Taylor, Sean Michael Ulrich
  • Patent number: 7239150
    Abstract: A method of obtaining a material property of a pavement material from a microwave field generally includes generating a microwave frequency electromagnetic field of a first mode about the pavement material. The frequency response of the pavement material in the electromagnetic field can be measured, such as by a network analyzer. The measurement of the frequency response permits correlating the frequency response to a material property of the pavement material sample, such as the density. A method of correcting for the roughness of a pavement material divides the pavement into a shallow layer and a deep layer. Two planar microwave circuits measure the permittivity of the shallow and deep layer. The permittivities are correlated to correct for roughness. An apparatus for obtaining the density of a pavement sample includes a microwave circuit and a network analyzer. The network analyzer measures the frequency response to determine the density of the pavement material.
    Type: Grant
    Filed: October 22, 2004
    Date of Patent: July 3, 2007
    Assignee: Troxler Electronic Laboratories, Inc.
    Inventors: Robert Ernest Troxler, William T. Joines
  • Patent number: 7221166
    Abstract: The present invention relates to a method to locate a fault in a section of a transmission line using measurements of current, voltage and angles between the phases at a first (A) and a second (B) end of said section. The invention is characterised by the steps of, after the occurrence of a fault along the section, calculating a distance (dA, dB) to a fault dependent on a fault current measured at one of said first and second ends and phase voltages measured at both of said first and second ends (A, B), where the distance to fault is calculated from the end (A or B) where the fault current is measured. The invention is particularly suitable when a current transformer at either of the first or second ends (A, B) is saturated. If so, then, a distance (d) to a fault is calculated dependent on a fault current measured at the non-affected end and phase voltages measured at both the affected end and the non-affected end.
    Type: Grant
    Filed: November 22, 2002
    Date of Patent: May 22, 2007
    Assignee: ABB AB
    Inventors: Murari Mohan Saha, Eugeniusz Rosolowski, Jan Izykowski