Patents Examined by Toniai M. Thomas
  • Patent number: 6531353
    Abstract: A method for fabricating a semiconductor device is disclosed, which reduces defects of a device by improving the process to improve the production yield.
    Type: Grant
    Filed: July 17, 2001
    Date of Patent: March 11, 2003
    Assignee: Hynix Semiconductor, Inc.
    Inventor: Ki Jik Lee