Abstract: An imaging flow cytometry system and method which includes a flow chamber, light obscuration analysis and imaging optics, image capturing system, device to regulate fluid flow through the chamber, and backlighting generator. The flow cell is configured so that light obscuration signals can be detected from the same passing particles that are imaged.

Abstract: Disclosed is a system that includes a light source for generating an illumination beam and an illumination lens system for directing the illumination beam towards a sample. The system further includes a collection lens system for directing towards a detector output light from the sample in response to the illumination beam and a detector for receiving the output light from the sample. The collection lens system includes a fixed-design compensator plate having individually selectable filters with different configurations for correcting system aberration of the system under different operating conditions. The system also includes a controller operable for: (i) generating and directing the illumination beam towards the sample, (ii) selecting operating conditions and a filter for correcting the system aberration under such selected operating conditions, (iii) generating an image based on the output light, and (iv) determining whether the sample passes inspection or characterizing such sample based on the image.

Abstract: A compact inspection assembly comprising digital sensors and/or laser measurement systems to validate attributes of pipe and associated threaded connections. An elongate body member is partially inserted into a central bore of a pipe section. A stabilizing centralizer assembly is selectively expanded to engage against the inner surface of the pipe section and prevent axial and rotational movement of the body section relative to the pipe section. An automated sensor assembly, attached to the body member and positioned in proximity to a threaded connection, measures data regarding the pipe and associated threaded connections. The measured and recorded data can be compared to predetermined standards (such as, for example, original equipment manufacturer and/or end user specifications or requirements) to verify pipe/connection compliance with desired standards.

Abstract: A shape measuring device includes an optical-axis-direction driving section configured to minutely relatively displace a stage in an optical axis direction of a light receiving section with respect to a light projecting section and the light receiving section such that a phase of a projection pattern on the stage is shifted at a minute pitch finer than width of the phase of the projection pattern projected on the stage, the minute pitch being defined by controlling light projecting elements of a pattern generating section.

Abstract: A system includes a computing device including a memory configured to store instructions. The computing device also includes a processor to execute the instructions to perform operations including initiating transmission of incident light from one or more light sources to a sealed bottle containing liquid. The operations also include receiving scattered light from the liquid contained in the sealed bottle. The operations also include processing one or more signals representative of the scattered light to detect interactions of the incident light with a particular molecule.

Abstract: The present invention provides a system for measuring concentrations of trace gases in gas mixtures using the absorption spectroscopy method. The system comprising: a resonant optical cavity, a continuous-wave stepwise tunable external cavity laser having a DFB laser as a gain media; a detector system for measuring an 5 absorption of laser light by the gas in the resonant optical cavity, wherein the roundtrip optical cavity length of the external cavity laser are the roundtrip optical cavity length of the resonant cavity are close.

Abstract: A method and an apparatus for analyzing a component of an object are provided. The apparatus includes an image sensor including an optical module, and the optical module includes a light source configured to emit a source light, a first detector configured to detect a first light that is scattered or reflected from the object on which the emitted source light is incident, and a second detector configured to detect a second light that is emitted by the light source but is not incident on the object. The apparatus further includes a processor configured to calculate a scattering coefficient and an absorption coefficient, based on the detected first light and the detected second light, and analyze the component of the object, based on the calculated scattering coefficient and the calculated absorption coefficient.

Abstract: The present disclosure relates to an information processing apparatus and information processing method that are aimed at enabling arrangements of a plurality of photographing devices to be easily set to an optimum arrangement for generation of three-dimensional data. An evaluation section calculates an evaluation value of an arrangement for generation of the three-dimensional data on the basis of the arrangements of the plurality of photographing devices that photograph two-dimensional image data used to generate the three-dimensional data of a photographic object. For example, the present disclosure is applicable to the information processing apparatus etc. that display information indicating the arrangements of the plurality of photographing devices that photograph the two-dimensional image data used to generate the three-dimensional data of the photographic object.

Abstract: An optical sensing device configured to detect an object or features of the object is provided. The optical sensing device includes a structured light projector and a sensor. A structured light projector is configured to project a structured light to the object and includes a light source and at least one tunable liquid crystal diffractive optical element (LCDOE). The light source is configured to emit a light beam. The at least one tunable LCDOE is disposed on a path of the light beam and configured to convert the light beam into the structured light to form a structured light pattern on the object. The LCDOE is capable of controlling the structured light pattern by controlling voltage distribution to a liquid crystal layer in the LCDOE. The sensor is configured to sense a reflected light formed by the object reflecting the structured light. Besides, a structured light projector is also provided.

Abstract: A measuring device includes a light source that emits light of a plurality of wavelengths, in particular a continuous spectrum, a first confocal diaphragm, through which light from the light source passes, and an optical illuminating/imaging system having a first splitting optical element designed as a prism or grating. The optical illuminating/imaging system, which is designed such that the light enters the first splitting optical element collimated, includes a first lens system having at least one first lens that is spatially separated from the first splitting optical element, the effective focal length of the first lens system being significantly different for different wavelengths, and the optical illuminating/imaging system being designed such that focus points of different wavelengths are formed at different locations along a line segment. The measuring device is configured to measure an object that intersects with the line segment and reflects at least a part of the light.

Abstract: A water analysis device having a light source and a light detector for detecting an optical parameter of a water sample in a transparent measuring cell is disclosed. A ventilation circuit for ventilating a cell chamber is provided, wherein there is a differential pressure of at least 2.0 mbar between the cell chamber and the atmosphere when a ventilation pump is operated. The device housing forms the cell chamber which is fluidically sealed by a cover assembly. The cover assembly and the device housing have a mechanism that mimics the sealing action of a turn-lock fastener, such that the cover assembly can be secured to and/or released from the device housing by means of a rotational movement. The cover assembly and the device housing form an annular ring seal which is coaxial with the rotational movement and which is formed by an elastic sealing body having a circular sealing lip and a correspondingly circular shoulder seat on which the sealing lip is pressed due to the atmospheric differential pressure.

Abstract: A method of evaluating a semiconductor wafer, which has a polished surface, by using a laser surface-inspection device including light-incident and light-receiving systems, includes evaluating the semiconductor wafer by detecting, as a light point defect, an abnormality of a process-induced defect and a surface-adhered foreign matter present on the polished surface of the semiconductor wafer, on the basis of measurement result obtained by directing incident light to the polished surface of the semiconductor wafer from one light-incident system and receiving, with a first light-receiving system, radiation light which has been radiated by the incident light being reflected or scattered by the polished surface, measurement result obtained by receiving the radiation light with a second light-receiving system, and measurement result obtained by receiving the radiation light with a third light-receiving system, and at least one of a light-receiving angle and polarization selectivity differs among the first, second

Abstract: An inspection device includes a wearable camera attached to a worker that images an inspection object, and a laser pointer that indicates an imaging region of the wearable camera to the worker. The laser pointer is attached to the worker to emit a laser beam in a direction parallel to a line of sight of the wearable camera such that a relative distance between a light point of the laser beam and the imaging region of the wearable camera is constant and does not vary depending on a distance between the laser pointer and the workpiece.

Abstract: Methods described herein, in some embodiments, permit extraction of particle structural and/or surface charge data from gradient induced particle motion in channels. In one aspect, a method of manipulating particle motion comprises introducing a fluid into a channel, the fluid comprising particles, and driving particle accumulation to a preselected location in the channel by setting advective velocity of the fluid to offset diffusiophoretic mobility of the particles at the preselected location.

Abstract: A portable articulated arm coordinate measuring machine (AACMM) for measuring the coordinates of an object in space and a method of operating the AACMM is provided. The AACMM includes a laser line probe is having a projector and a camera, the projector projecting a line of light, the camera having a lens assembly and a sensor assembly. The sensor assembly having a filter disposed between a photosensitive array and the lens assembly. The filter has a plurality of red, green and blue pixels in a predetermined arrangement. A controller causes the camera to acquire a metrology image and a color image. 3D coordinates of points on a surface are determined based on the metrology image and a color is assigned to the points based on the color image. The exposure time for the color image is adjusted based on an Exposure To The Right or a Mid-gray color model.

Abstract: An image processing system comprises: a projector for projecting pattern light whose coordinate component at least in one direction is determinable; an imaging apparatus for imaging an object illuminated with the pattern light to acquire a pattern image; and a controller including a calculator for calculating the 3D coordinates of a point on the object based on the pattern light and the pattern image. The calculator determines a first point on the pattern image; calculates a second point corresponding to the first point in a pattern-light projection plane; calculates a third point based on the second point in the projection plane, a nonlinear line in the projection plane calculated by analyzing the pattern image, and an epipolar line in the projection plane calculated based on the first point; and calculates the three-dimensional coordinates of the point on the object based on the first point and the third point.

Abstract: The present invention discloses a structural light parameter calibration device and method based on a front-coating plane mirror. The calibration device includes a camera, a laser, a front-coating plane mirror, a flat glass target, and white printing paper. The white printing paper receives a laser beam and presents a real light strip image, and the camera captures the real light stripe image and a mirror light stripe image on the front-coating plane mirror. Feature points are used to determine a rotation matrix, a translation vector, and a vanishing point for the image. The present invention achieves better quality of light stripe and better extraction accuracy, provides feature points with micron-level positional accuracy and more calibration points, and features higher calibration accuracy and more stable calibration results.

Abstract: An inspection system with radiation-induced false count mitigation includes an illumination source configured to illuminate a sample and a liquid-cooling coincidence detector, which includes an illumination detector to detect illumination from the sample, a liquid-cooling device for regulating a temperature of the illumination detector via a liquid, and photodetectors to detect light generated in the liquid in response to particle radiation. The liquid-cooling coincidence detector may also include controllers to identify a set of illumination detection events based on an illumination signal received from the illumination detector, identify a set of radiation detection events based on radiation signals received from the photodetectors, compare the set of radiation detection events to the set of illumination detection events to identify a set of coincidence events, and exclude the set of coincidence events from the set of illumination detection events to generate a set of identified features on the sample.

Abstract: A focus metrology target includes one or more periodic arrays of features. A measurement of focus performance of a lithographic apparatus is based at least in part on diffraction signals obtained from the focus metrology target. Each periodic array of features includes a repeating arrangement of first zones interleaved with second zones, a feature density being different in the first zones and the second zones. Each first zone includes a repeating arrangement of first features. A minimum dimension of each first feature is close to but not less than a resolution limit of the printing by the lithographic apparatus, so as to comply with a design rule in a given a process environment. A region of high feature density may further include a repeating arrangement of larger features.

Abstract: The present invention provides a system for measuring concentrations of trace gases in gas mixtures using the absorption spectroscopy method. The system comprising an optical cell containing a gas mixture, a continuous-wave stepwise tunable external cavity laser, a detector system for measuring an absorption of laser light by the gas in the optical cell, and a processor to conduct an absorption spectroscopy analysis of the gas mixture based on light intensity measured by the detector system at one or more laser frequencies.