Patents Examined by Tyler Dean Hedrick
  • Patent number: 11977358
    Abstract: Systems and methods of dynamic IoT device regulation and control can aid in shifting a user's emotional state from a first state of mind to a preferred second state of mind, using the user's biomarker response to device settings. Particularly, an IoT device controller may be embedded within a wearable device that is wirelessly connected to a computing device and one or more IoT devices. Initially, each wearable device can be calibrated, wherein a matrix of sensed user biomarker responses can be generated. In some embodiments, the system continuously monitors user biomarkers to detect which physiological state exists. When the user enters into the first physiological/psychological state, the system can adjust each IoT device to align with the second state. When the system detects that the user biomarker response has not shifted, the system can continuously adjust IoT settings based upon a learning algorithm having monitored user biomarkers as input.
    Type: Grant
    Filed: August 17, 2021
    Date of Patent: May 7, 2024
    Inventors: Robin H. Stewart, Qiliang Li
  • Patent number: 11947336
    Abstract: An apparatus for superimposing prints of a part for manufacture onto computer models of the part for manufacture is disclosed. The apparatus includes a processor and a memory communicatively connected to the processor. The memory containing instructions configuring the at least a processor to receive a computer model of the part for manufacture and a print of a part for manufacture. The processor decomposes a side view of the print, matches features of the part for manufacture in the side view to features of the part for manufacture in the computer model, superimposes a first plurality of object lines in the computing model onto a second plurality of object lines in the side view, and transfers the first semantic datum from the side view to the computer model.
    Type: Grant
    Filed: March 8, 2022
    Date of Patent: April 2, 2024
    Assignee: Proto Labs, Inc.
    Inventor: Shuji Usui
  • Patent number: 11947335
    Abstract: Aspects of methods, apparatuses, and computer-readable media for performing multi-material selection optimization (MMSO) to provide topologically and geometrically optimized multi-component structures (MCSs) across a plurality of design inputs and constraints are proposed. In some embodiments, a 3-D print model of an object based on load case criteria is obtained. A portion of the 3-D print model is determined that can be replaced with a commercial-off-the-shelf (COTS) part model such that the load case criteria remain satisfied. The portion or the 3-D print model can then be replaced with the COTS part model to determine the MCS model. In various embodiments, a mesh representation of the model can be generated, and plurality of optimization techniques can be used to determine the MCS model.
    Type: Grant
    Filed: November 9, 2021
    Date of Patent: April 2, 2024
    Assignee: DIVERGENT TECHNOLOGIES, INC.
    Inventors: Jinbo Chen, Michael Morgan
  • Patent number: 11921496
    Abstract: A collation section (14) extracts a difference between two pieces of operation setting data which are pieces of data each of which is for setting operation in a device, and generates difference information indicating the extracted difference, before a user requests. A collation result management section (15) stores in a storage device (150), the difference information generated by the collation section (14). A display section (16) acquires the difference information from the storage device (150) and outputs the acquired difference information to a display device when the user requests.
    Type: Grant
    Filed: July 27, 2021
    Date of Patent: March 5, 2024
    Assignee: MITSUBISHI ELECTRIC CORPORATION
    Inventors: Shun Shomura, Satoshi Noguchi
  • Patent number: 11914332
    Abstract: Systems and methods for adaptively tuning a Proportional, Integral and Derivative (PID) controller in a zero order industrial process are provided. A method and system can involve receiving input data at one or more inputs of the PID controller and generating output data at one or more outputs of the PID controller in response to processing the input data. Error(s) associated with the controller are determined based on an analysis of a measured parameter with respect to a desired setpoint. The measured parameter may be indicated in the output data. Adaptive gain may be applied to the PID controller in response to the absolute value of the controller error both exceeding a deadband and increasing. Additionally, normal gain, which is lower than the adaptive gain, may be applied to the PID controller in response to the absolute value of the controller error either being below the deadband or decreasing.
    Type: Grant
    Filed: October 12, 2021
    Date of Patent: February 27, 2024
    Assignee: Schneider Electric Systems USA, Inc.
    Inventors: William Brian Piercy, Randy Marvin Miller
  • Patent number: 11906945
    Abstract: A method and device for generating control data for an additive manufacturing device are described, wherein build-up material is built up and selectively solidified. Irradiating the build-up material on a build field with at least one energy beam occurs An impingement surface of the energy beam is moved on the build field in order to melt the build-up material in a target area in and around the impingement surface. For generating the control data, optimization criteria and/or secondary and/or boundary conditions relating to a local target temperature distribution in the target area of the build-up material are defined so that melting of the build-up material is effected as heat conduction welding. Based on this, an optimized intensity profile of the energy beam is determined, which is substantially non-rotationally symmetric at the impingement surface on the build field.
    Type: Grant
    Filed: April 23, 2019
    Date of Patent: February 20, 2024
    Assignee: EOS GmbH Electro Optical Systems
    Inventors: Thomas Mattes, Peter Holfelder, Anoush Aghajani-Talesh
  • Patent number: 11899419
    Abstract: An integrated control management system includes an input output device. The input output device includes a database, a memory module, a first processing module, and a second processing module. The memory module receives and stores a plurality of integrated control commands, and one of the integrated control commands is generated based on a hardware control command for setting a hardware control transmitted by another input and output device. The first processing module reads the integrated control command from the memory module and obtains the hardware control data from the integrated control command. The first processing module updates the hardware control data to the database. The second processing module reads the database and updates the hardware control data stored in the database to another database in another input output device. The second processing module sets the hardware control based on the hardware control data stored in the database.
    Type: Grant
    Filed: November 11, 2021
    Date of Patent: February 13, 2024
    Assignee: MITAC COMPUTING TECHNOLOGY CORPORATION
    Inventors: Heng-Chia Hsu, Chen-Yin Lin, Yu-Shu Yeh, Chien-Chung Wang, Chin-Hung Tan
  • Patent number: 11874649
    Abstract: Methods and systems for cleaning process sequence management are provided. An indication is received from a client device of a sequence of cleaning operations associated with a substrate process at a manufacturing system. An indication of one or more cleaning criteria that trigger initiation of the sequence of cleaning operations during a cleaning process at a process chamber of the manufacturing system is also received. A set of instructions corresponding to the sequence of cleaning operations is generated. In response to a detection that at least one of the one or more cleaning criteria is satisfied, the generated set of instructions are executed to initiate the sequence of cleaning operations at the process chamber.
    Type: Grant
    Filed: November 9, 2021
    Date of Patent: January 16, 2024
    Assignee: Applied Materials, Inc.
    Inventor: Chongyang C. Wang
  • Patent number: 11851793
    Abstract: A non-transitory computer-readable medium stores computer-readable instructions, when executed by a computer, causing the computer to execute a process. The process includes: obtaining image data; obtaining thread colors as available colors for sewing an embroidery pattern; setting a first color representing a target area; in a case where at least one color is assigned from the available colors as a color representing the target area, selecting a color close to the first color when combined with the at least one color assigned, from the available colors, as a candidate; determining whether a difference between color information representing the at least one color assigned and color information representing the candidate is smaller than a threshold value; in a case where the difference is smaller than the threshold value, adding the candidate to the at least one color assigned; and generating embroidery data associating thread color data with position data.
    Type: Grant
    Filed: September 4, 2020
    Date of Patent: December 26, 2023
    Assignee: BROTHER KOGYO KABUSHIKI KAISHA
    Inventors: Yuta Kamihira, Mayumi Nishizaki
  • Patent number: 11846933
    Abstract: An apparatus, system and method of providing industrial analytics. The apparatus, system and method include at least a plurality of sensors sensing performance indicators for an industrial process across multiple nodes, wherein ones of the multiple nodes are remote from each other; at least one machine learning module comprising non-transitory computing code executed by a processor. When executed by the processor, the code causes the steps of: receiving user input regarding at least the industrial process and a data set; selecting a model based on at least the user input, wherein the selected model comprises a plurality of learnings based on the performance indicators sensed by multiple sensors across at least multiple ones of the multiple nodes; applying the selected model to the data set; assessing at least the performance indicators for the data set upon application of the selected model; and outputting the assessed performance indicator.
    Type: Grant
    Filed: January 11, 2019
    Date of Patent: December 19, 2023
    Assignee: General Electric Company
    Inventors: Mustafa Gokhan Uzunbas, Ser Nam Lim, Ashish Jain, Vladimir Shapiro, Weiwei Qian, Mohamad Bagheri Esfe
  • Patent number: 11822319
    Abstract: A semiconductor system shares information on a semiconductor manufacturing apparatus between first and second semiconductor manufacturing apparatuses through direct communication. The first semiconductor manufacturing apparatus includes a first acquisition unit acquiring first information on the first semiconductor manufacturing apparatus, a first storage unit storing the acquired first information, and a first communication unit sending the stored first information to the second semiconductor manufacturing apparatus.
    Type: Grant
    Filed: September 9, 2020
    Date of Patent: November 21, 2023
    Assignee: TOKYO ELECTRON LIMITED
    Inventors: Noriaki Koyama, Kazushi Shoji, Motokatsu Miyazaki
  • Patent number: 11815876
    Abstract: The invention relates to method and system for automatic identification of a primary manufacturing process (PMP) from a three-dimensional (3D) model of a product. The method includes generating a plurality of images corresponding to a plurality of views of the product based on the 3D model of the product; determining a plurality of confidence score vectors, based on the plurality of images, using a first Artificial Neural Network (ANN) model; determining an aggregate confidence score vector, representing a pre-defined PMP category with maximum frequency, based on the plurality of confidence score vectors; extracting a set of manufacturing parameters associated with the product, based on the 3D model of the product; and identifying the PMP based on the aggregate confidence score vector and the set of manufacturing parameters, using a second ANN model.
    Type: Grant
    Filed: August 2, 2021
    Date of Patent: November 14, 2023
    Assignee: HCL Technologies Limited
    Inventors: Dhiraj Suvarna, Christine Zuzart
  • Patent number: 11815882
    Abstract: The present invention includes: (a) a method for improving data to be processed for bottleneck detection, by cleaning corrupt or outlier data; (b) a method for improved analysis of bottleneck data using a plurality of rules for categorization; and (c) a method for improved display and/or allowing improved user feedback for bottleneck data using multivariate analysis and display. These methods can be used alone, or preferably be combined in whole or in part together to improve performance of an industrial process. A system is also provided.
    Type: Grant
    Filed: September 10, 2019
    Date of Patent: November 14, 2023
    Assignee: THROUGHPUT, INC.
    Inventors: Ali Hussan Raza, Bhaskar Subbarao Ballapragada, Seth Rom Page, Anzar Kamdar
  • Patent number: 11809246
    Abstract: A computing device of an information handling system includes a hardware component. The hardware component is also connected to a trace. The computing device also includes a corrosion management component that is physically connected to the trace. The corrosion management component reduces a rate of corrosion of the trace due to an ambient environment in which the trace resides. The corrosion management component reduces the rate of corrosion by applying an electrical potential to the trace.
    Type: Grant
    Filed: July 24, 2020
    Date of Patent: November 7, 2023
    Assignee: DELL PRODUCTS L.P.
    Inventors: Steven Embleton, Jon Taylor Fitch, Sandor T. Farkas, Joseph Danny King
  • Patent number: 11803127
    Abstract: A method for determining a root cause affecting yield in a process for manufacturing devices on a substrate, the method including: obtaining yield distribution data including a distribution of a yield parameter across the substrate or part thereof; obtaining sets of metrology data, each set including a spatial variation of a process parameter over the substrate or part thereof corresponding to a different layer of the substrate; comparing the yield distribution data and metrology data based on a similarity metric describing a spatial similarity between the yield distribution data and an individual set out of the sets of the metrology data; and determining a first similar set of metrology data out of the sets of metrology data, being the first set of metrology data in terms of processing order for the corresponding layers, which is determined to be similar to the yield distribution data.
    Type: Grant
    Filed: November 4, 2019
    Date of Patent: October 31, 2023
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Chenxi Lin, Cyrus Emil Tabery, Hakki Ergün Cekli, Simon Philip Spencer Hastings, Boris Menchtchikov, Yi Zou, Yana Cheng, Maxime Philippe Frederic Genin, Tzu-Chao Chen, Davit Harutyunyan, Youping Zhang
  • Patent number: 11794414
    Abstract: A method and apparatus is described in which a signal indicative of an operation of a energy source of a 3D printer during a second predetermined time period commencing with the end of a first predetermined time period is obtained, the first predetermined time period commencing with an activation of the energy source, wherein the energy source is active throughout the first and second time periods; the obtained signal is compared with a reference signal; and it is determined, based on the comparison, whether the energy source is operating according to predetermined characteristics.
    Type: Grant
    Filed: January 29, 2018
    Date of Patent: October 24, 2023
    Assignee: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
    Inventors: Nicola Baldo, David Pinheiro, Albert Trenchs Magana, Esteve Comas Cespedes
  • Patent number: 11796978
    Abstract: A user interface for designing, configuring and/or editing a control flow representing a control strategy associated with a semiconductor manufacturing process, the user interface including: a library of control elements having at least a control element representing a task of simulation and each control element being selectable by a user; a control flow editor configured to organize the control elements into a control flow representing the control strategy; and a communication interface for communicating the control flow to a calculation engine configured to evaluate the control flow.
    Type: Grant
    Filed: October 21, 2019
    Date of Patent: October 24, 2023
    Assignee: ASML NETHERLANDS B.V.
    Inventors: Chang-Wei Chen, Si-Han Zeng
  • Patent number: 11785749
    Abstract: A method of controlling the cooling of servers in a data center including a plurality of server racks each including a plurality of servers, the cooling being provided by aisle cooling units via a cold isle and by server fans, wherein the method includes: obtaining temperature measurements from temperature sensors in the data center, performing an optimization of the total power consumption of the aisle cooling units and of the servers based on the temperature measurements, with constraints on a cold aisle temperature and on an air flow level of the aisle cooling units, and controlling the aisle cooling units based on the optimization.
    Type: Grant
    Filed: August 13, 2019
    Date of Patent: October 10, 2023
    Assignee: ABB Schweiz AG
    Inventors: Winston Garcia-Gabin, Kateryna Mishchenko
  • Patent number: 11772222
    Abstract: A machine tool system is equipped with a machine tool and a controller. The machine tool is equipped with a machine tool body and at least one temperature sensor that acquires temperature data of the machine tool body. The controller is equipped with a storage that stores the temperature data acquired in time-series by the temperature sensor, and an auxiliary power supply that supplies power to the temperature sensor and the storage when the supply of power to the machine tool body is stopped. The controller controls the machine tool by using the temperature data over a predetermined time range stored in the storage, and selects, in response to a charge state of the auxiliary power supply, the temperature data to be used in first control after the supply of power to the machine tool body is resumed.
    Type: Grant
    Filed: July 28, 2020
    Date of Patent: October 3, 2023
    Assignee: FANUC CORPORATION
    Inventors: Hitoshi Izumi, Kenichiro Kurihara
  • Patent number: 11762367
    Abstract: A visual prototyping and assembly system includes a work surface configured to hold one or more work-in-progress units during an assembly operation. The visual prototyping and assembly system may receive the one or more images of the work-in-progress units; determine a current assembly state of the work-in-progress units based on the one or more images of the work-in-progress units; generate a current digital twin model of the -in-progress units corresponding to the current assembly state of the work-in-progress units and display the current digital twin model a user interface; determine a subsequent assembly state of the work-in-progress units; and generate a subsequent digital twin model of the work-in-progress units corresponding to the subsequent assembly state of the work-in-progress units and display the subsequent digital twin model on the user interface.
    Type: Grant
    Filed: May 7, 2021
    Date of Patent: September 19, 2023
    Assignee: Rockwell Collins, Inc.
    Inventor: Ryan Wheeler