Patents Examined by Tyler Dean Hedrick
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Patent number: 11977358Abstract: Systems and methods of dynamic IoT device regulation and control can aid in shifting a user's emotional state from a first state of mind to a preferred second state of mind, using the user's biomarker response to device settings. Particularly, an IoT device controller may be embedded within a wearable device that is wirelessly connected to a computing device and one or more IoT devices. Initially, each wearable device can be calibrated, wherein a matrix of sensed user biomarker responses can be generated. In some embodiments, the system continuously monitors user biomarkers to detect which physiological state exists. When the user enters into the first physiological/psychological state, the system can adjust each IoT device to align with the second state. When the system detects that the user biomarker response has not shifted, the system can continuously adjust IoT settings based upon a learning algorithm having monitored user biomarkers as input.Type: GrantFiled: August 17, 2021Date of Patent: May 7, 2024Inventors: Robin H. Stewart, Qiliang Li
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Patent number: 11947336Abstract: An apparatus for superimposing prints of a part for manufacture onto computer models of the part for manufacture is disclosed. The apparatus includes a processor and a memory communicatively connected to the processor. The memory containing instructions configuring the at least a processor to receive a computer model of the part for manufacture and a print of a part for manufacture. The processor decomposes a side view of the print, matches features of the part for manufacture in the side view to features of the part for manufacture in the computer model, superimposes a first plurality of object lines in the computing model onto a second plurality of object lines in the side view, and transfers the first semantic datum from the side view to the computer model.Type: GrantFiled: March 8, 2022Date of Patent: April 2, 2024Assignee: Proto Labs, Inc.Inventor: Shuji Usui
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Patent number: 11947335Abstract: Aspects of methods, apparatuses, and computer-readable media for performing multi-material selection optimization (MMSO) to provide topologically and geometrically optimized multi-component structures (MCSs) across a plurality of design inputs and constraints are proposed. In some embodiments, a 3-D print model of an object based on load case criteria is obtained. A portion of the 3-D print model is determined that can be replaced with a commercial-off-the-shelf (COTS) part model such that the load case criteria remain satisfied. The portion or the 3-D print model can then be replaced with the COTS part model to determine the MCS model. In various embodiments, a mesh representation of the model can be generated, and plurality of optimization techniques can be used to determine the MCS model.Type: GrantFiled: November 9, 2021Date of Patent: April 2, 2024Assignee: DIVERGENT TECHNOLOGIES, INC.Inventors: Jinbo Chen, Michael Morgan
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Patent number: 11921496Abstract: A collation section (14) extracts a difference between two pieces of operation setting data which are pieces of data each of which is for setting operation in a device, and generates difference information indicating the extracted difference, before a user requests. A collation result management section (15) stores in a storage device (150), the difference information generated by the collation section (14). A display section (16) acquires the difference information from the storage device (150) and outputs the acquired difference information to a display device when the user requests.Type: GrantFiled: July 27, 2021Date of Patent: March 5, 2024Assignee: MITSUBISHI ELECTRIC CORPORATIONInventors: Shun Shomura, Satoshi Noguchi
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Patent number: 11914332Abstract: Systems and methods for adaptively tuning a Proportional, Integral and Derivative (PID) controller in a zero order industrial process are provided. A method and system can involve receiving input data at one or more inputs of the PID controller and generating output data at one or more outputs of the PID controller in response to processing the input data. Error(s) associated with the controller are determined based on an analysis of a measured parameter with respect to a desired setpoint. The measured parameter may be indicated in the output data. Adaptive gain may be applied to the PID controller in response to the absolute value of the controller error both exceeding a deadband and increasing. Additionally, normal gain, which is lower than the adaptive gain, may be applied to the PID controller in response to the absolute value of the controller error either being below the deadband or decreasing.Type: GrantFiled: October 12, 2021Date of Patent: February 27, 2024Assignee: Schneider Electric Systems USA, Inc.Inventors: William Brian Piercy, Randy Marvin Miller
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Patent number: 11906945Abstract: A method and device for generating control data for an additive manufacturing device are described, wherein build-up material is built up and selectively solidified. Irradiating the build-up material on a build field with at least one energy beam occurs An impingement surface of the energy beam is moved on the build field in order to melt the build-up material in a target area in and around the impingement surface. For generating the control data, optimization criteria and/or secondary and/or boundary conditions relating to a local target temperature distribution in the target area of the build-up material are defined so that melting of the build-up material is effected as heat conduction welding. Based on this, an optimized intensity profile of the energy beam is determined, which is substantially non-rotationally symmetric at the impingement surface on the build field.Type: GrantFiled: April 23, 2019Date of Patent: February 20, 2024Assignee: EOS GmbH Electro Optical SystemsInventors: Thomas Mattes, Peter Holfelder, Anoush Aghajani-Talesh
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Patent number: 11899419Abstract: An integrated control management system includes an input output device. The input output device includes a database, a memory module, a first processing module, and a second processing module. The memory module receives and stores a plurality of integrated control commands, and one of the integrated control commands is generated based on a hardware control command for setting a hardware control transmitted by another input and output device. The first processing module reads the integrated control command from the memory module and obtains the hardware control data from the integrated control command. The first processing module updates the hardware control data to the database. The second processing module reads the database and updates the hardware control data stored in the database to another database in another input output device. The second processing module sets the hardware control based on the hardware control data stored in the database.Type: GrantFiled: November 11, 2021Date of Patent: February 13, 2024Assignee: MITAC COMPUTING TECHNOLOGY CORPORATIONInventors: Heng-Chia Hsu, Chen-Yin Lin, Yu-Shu Yeh, Chien-Chung Wang, Chin-Hung Tan
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Patent number: 11874649Abstract: Methods and systems for cleaning process sequence management are provided. An indication is received from a client device of a sequence of cleaning operations associated with a substrate process at a manufacturing system. An indication of one or more cleaning criteria that trigger initiation of the sequence of cleaning operations during a cleaning process at a process chamber of the manufacturing system is also received. A set of instructions corresponding to the sequence of cleaning operations is generated. In response to a detection that at least one of the one or more cleaning criteria is satisfied, the generated set of instructions are executed to initiate the sequence of cleaning operations at the process chamber.Type: GrantFiled: November 9, 2021Date of Patent: January 16, 2024Assignee: Applied Materials, Inc.Inventor: Chongyang C. Wang
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Patent number: 11851793Abstract: A non-transitory computer-readable medium stores computer-readable instructions, when executed by a computer, causing the computer to execute a process. The process includes: obtaining image data; obtaining thread colors as available colors for sewing an embroidery pattern; setting a first color representing a target area; in a case where at least one color is assigned from the available colors as a color representing the target area, selecting a color close to the first color when combined with the at least one color assigned, from the available colors, as a candidate; determining whether a difference between color information representing the at least one color assigned and color information representing the candidate is smaller than a threshold value; in a case where the difference is smaller than the threshold value, adding the candidate to the at least one color assigned; and generating embroidery data associating thread color data with position data.Type: GrantFiled: September 4, 2020Date of Patent: December 26, 2023Assignee: BROTHER KOGYO KABUSHIKI KAISHAInventors: Yuta Kamihira, Mayumi Nishizaki
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Patent number: 11846933Abstract: An apparatus, system and method of providing industrial analytics. The apparatus, system and method include at least a plurality of sensors sensing performance indicators for an industrial process across multiple nodes, wherein ones of the multiple nodes are remote from each other; at least one machine learning module comprising non-transitory computing code executed by a processor. When executed by the processor, the code causes the steps of: receiving user input regarding at least the industrial process and a data set; selecting a model based on at least the user input, wherein the selected model comprises a plurality of learnings based on the performance indicators sensed by multiple sensors across at least multiple ones of the multiple nodes; applying the selected model to the data set; assessing at least the performance indicators for the data set upon application of the selected model; and outputting the assessed performance indicator.Type: GrantFiled: January 11, 2019Date of Patent: December 19, 2023Assignee: General Electric CompanyInventors: Mustafa Gokhan Uzunbas, Ser Nam Lim, Ashish Jain, Vladimir Shapiro, Weiwei Qian, Mohamad Bagheri Esfe
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Patent number: 11822319Abstract: A semiconductor system shares information on a semiconductor manufacturing apparatus between first and second semiconductor manufacturing apparatuses through direct communication. The first semiconductor manufacturing apparatus includes a first acquisition unit acquiring first information on the first semiconductor manufacturing apparatus, a first storage unit storing the acquired first information, and a first communication unit sending the stored first information to the second semiconductor manufacturing apparatus.Type: GrantFiled: September 9, 2020Date of Patent: November 21, 2023Assignee: TOKYO ELECTRON LIMITEDInventors: Noriaki Koyama, Kazushi Shoji, Motokatsu Miyazaki
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Patent number: 11815876Abstract: The invention relates to method and system for automatic identification of a primary manufacturing process (PMP) from a three-dimensional (3D) model of a product. The method includes generating a plurality of images corresponding to a plurality of views of the product based on the 3D model of the product; determining a plurality of confidence score vectors, based on the plurality of images, using a first Artificial Neural Network (ANN) model; determining an aggregate confidence score vector, representing a pre-defined PMP category with maximum frequency, based on the plurality of confidence score vectors; extracting a set of manufacturing parameters associated with the product, based on the 3D model of the product; and identifying the PMP based on the aggregate confidence score vector and the set of manufacturing parameters, using a second ANN model.Type: GrantFiled: August 2, 2021Date of Patent: November 14, 2023Assignee: HCL Technologies LimitedInventors: Dhiraj Suvarna, Christine Zuzart
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Patent number: 11815882Abstract: The present invention includes: (a) a method for improving data to be processed for bottleneck detection, by cleaning corrupt or outlier data; (b) a method for improved analysis of bottleneck data using a plurality of rules for categorization; and (c) a method for improved display and/or allowing improved user feedback for bottleneck data using multivariate analysis and display. These methods can be used alone, or preferably be combined in whole or in part together to improve performance of an industrial process. A system is also provided.Type: GrantFiled: September 10, 2019Date of Patent: November 14, 2023Assignee: THROUGHPUT, INC.Inventors: Ali Hussan Raza, Bhaskar Subbarao Ballapragada, Seth Rom Page, Anzar Kamdar
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Patent number: 11809246Abstract: A computing device of an information handling system includes a hardware component. The hardware component is also connected to a trace. The computing device also includes a corrosion management component that is physically connected to the trace. The corrosion management component reduces a rate of corrosion of the trace due to an ambient environment in which the trace resides. The corrosion management component reduces the rate of corrosion by applying an electrical potential to the trace.Type: GrantFiled: July 24, 2020Date of Patent: November 7, 2023Assignee: DELL PRODUCTS L.P.Inventors: Steven Embleton, Jon Taylor Fitch, Sandor T. Farkas, Joseph Danny King
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Patent number: 11803127Abstract: A method for determining a root cause affecting yield in a process for manufacturing devices on a substrate, the method including: obtaining yield distribution data including a distribution of a yield parameter across the substrate or part thereof; obtaining sets of metrology data, each set including a spatial variation of a process parameter over the substrate or part thereof corresponding to a different layer of the substrate; comparing the yield distribution data and metrology data based on a similarity metric describing a spatial similarity between the yield distribution data and an individual set out of the sets of the metrology data; and determining a first similar set of metrology data out of the sets of metrology data, being the first set of metrology data in terms of processing order for the corresponding layers, which is determined to be similar to the yield distribution data.Type: GrantFiled: November 4, 2019Date of Patent: October 31, 2023Assignee: ASML NETHERLANDS B.V.Inventors: Chenxi Lin, Cyrus Emil Tabery, Hakki Ergün Cekli, Simon Philip Spencer Hastings, Boris Menchtchikov, Yi Zou, Yana Cheng, Maxime Philippe Frederic Genin, Tzu-Chao Chen, Davit Harutyunyan, Youping Zhang
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Patent number: 11794414Abstract: A method and apparatus is described in which a signal indicative of an operation of a energy source of a 3D printer during a second predetermined time period commencing with the end of a first predetermined time period is obtained, the first predetermined time period commencing with an activation of the energy source, wherein the energy source is active throughout the first and second time periods; the obtained signal is compared with a reference signal; and it is determined, based on the comparison, whether the energy source is operating according to predetermined characteristics.Type: GrantFiled: January 29, 2018Date of Patent: October 24, 2023Assignee: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.Inventors: Nicola Baldo, David Pinheiro, Albert Trenchs Magana, Esteve Comas Cespedes
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Patent number: 11796978Abstract: A user interface for designing, configuring and/or editing a control flow representing a control strategy associated with a semiconductor manufacturing process, the user interface including: a library of control elements having at least a control element representing a task of simulation and each control element being selectable by a user; a control flow editor configured to organize the control elements into a control flow representing the control strategy; and a communication interface for communicating the control flow to a calculation engine configured to evaluate the control flow.Type: GrantFiled: October 21, 2019Date of Patent: October 24, 2023Assignee: ASML NETHERLANDS B.V.Inventors: Chang-Wei Chen, Si-Han Zeng
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Patent number: 11785749Abstract: A method of controlling the cooling of servers in a data center including a plurality of server racks each including a plurality of servers, the cooling being provided by aisle cooling units via a cold isle and by server fans, wherein the method includes: obtaining temperature measurements from temperature sensors in the data center, performing an optimization of the total power consumption of the aisle cooling units and of the servers based on the temperature measurements, with constraints on a cold aisle temperature and on an air flow level of the aisle cooling units, and controlling the aisle cooling units based on the optimization.Type: GrantFiled: August 13, 2019Date of Patent: October 10, 2023Assignee: ABB Schweiz AGInventors: Winston Garcia-Gabin, Kateryna Mishchenko
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Patent number: 11772222Abstract: A machine tool system is equipped with a machine tool and a controller. The machine tool is equipped with a machine tool body and at least one temperature sensor that acquires temperature data of the machine tool body. The controller is equipped with a storage that stores the temperature data acquired in time-series by the temperature sensor, and an auxiliary power supply that supplies power to the temperature sensor and the storage when the supply of power to the machine tool body is stopped. The controller controls the machine tool by using the temperature data over a predetermined time range stored in the storage, and selects, in response to a charge state of the auxiliary power supply, the temperature data to be used in first control after the supply of power to the machine tool body is resumed.Type: GrantFiled: July 28, 2020Date of Patent: October 3, 2023Assignee: FANUC CORPORATIONInventors: Hitoshi Izumi, Kenichiro Kurihara
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Patent number: 11762367Abstract: A visual prototyping and assembly system includes a work surface configured to hold one or more work-in-progress units during an assembly operation. The visual prototyping and assembly system may receive the one or more images of the work-in-progress units; determine a current assembly state of the work-in-progress units based on the one or more images of the work-in-progress units; generate a current digital twin model of the -in-progress units corresponding to the current assembly state of the work-in-progress units and display the current digital twin model a user interface; determine a subsequent assembly state of the work-in-progress units; and generate a subsequent digital twin model of the work-in-progress units corresponding to the subsequent assembly state of the work-in-progress units and display the subsequent digital twin model on the user interface.Type: GrantFiled: May 7, 2021Date of Patent: September 19, 2023Assignee: Rockwell Collins, Inc.Inventor: Ryan Wheeler