Patents Examined by Vincent Barth
  • Patent number: 6738148
    Abstract: An upper stem diameter measurement (“USDM”) and basal area determination device for timber cruising operations incorporates a viewing window in which are projected variable, visual brackets for manual alignment by the user, or automatic setting under processor section control, with the left and right sides of a target tree stem or trunk. The device further includes a built-in inclinometer such that computations of height and stem diameter can be automatically adjusted depending on the user's line of sight with respect to a horizontal plane. In a preferred embodiment, a user actuatable keypad is provided for inputting data, such as a desired operational mode, a specified basal area factor and the like, a user viewable display as well as control buttons for adjusting the visual brackets and indicating an acceptance of various of the device parameters and operational characteristics.
    Type: Grant
    Filed: June 18, 2001
    Date of Patent: May 18, 2004
    Assignees: Laser Technology, Inc., Kama-Tech (HK) Limited
    Inventors: Jeremy G. Dunne, William R. Carr
  • Patent number: 6646731
    Abstract: Systems and methods for determining the positions of the discs of a mechanical display by using the shadow cast on an optical array by a profiled cam arrangement.
    Type: Grant
    Filed: March 5, 2002
    Date of Patent: November 11, 2003
    Assignee: Melexis NV
    Inventor: Rick Wolleswinkel
  • Patent number: 6646753
    Abstract: A method of determining thickness and refractive index of an optical thin film is described. The method includes generating a diagnostic light beam having a first and a second wavelength. The method also includes measuring unattenuated light intensities at the first and the second wavelength of the diagnostic light beam. The method also includes measuring attenuated light intensities at the first and the second wavelength of the diagnostic light beam after transmission through the optical thin film. A null light intensity for the diagnostic light beam at the first and second wavelength is also determined. A first and second normalized intensity function is determined using the measured unattenuated light intensities, the measured attenuated light intensities, and the measured null light intensities. The thickness and refractive index of the optical thin film is then determined by solving the first and second normalized intensity function for thickness and refractive index.
    Type: Grant
    Filed: October 4, 2001
    Date of Patent: November 11, 2003
    Assignee: Unaxis, USA, Inc.
    Inventors: Jian Zhang, Jing Pan
  • Patent number: 6630989
    Abstract: A method for determining the concentration of heparin in a fluid sample comprising: (a) providing a fluid sample containing heparin; (b) adding to the fluid sample a solution of a dye to form a mixture of sample and dye, wherein the dye interacts with the heparin in the sample so that the absorption spectrum of the mixture of sample and dye in the visible range varies as a result of the interaction in a manner quantitatively dependent on the heparin concentration; (c) determining the absorption spectrum in the visible range of the mixture of sample and dye; and (d) calculating a spectral parameter representative of both the reduction in the absorption of the free dye in solution and the increase in the absorption of the dye-heparin complex, the value of the spectral parameter being indicative of the concentration of heparin present in the fluid sample, in order to determine the concentration of heparin present in the fluid sample.
    Type: Grant
    Filed: October 11, 2000
    Date of Patent: October 7, 2003
    Assignee: Dideco S.p.A.
    Inventors: Giuseppe Caputo, Raffaele Castelli, Elena Comoglio, Leopoldo Della Ciana, Arnaldo Giannetti
  • Patent number: 6563575
    Abstract: An optical sensing system for detecting welds and defects in metal brightly illuminates a broad section of the metal and images a swath of the metal onto a multi-element detector array, generating voltage signals representing the reflectivity of the swath of the metal as it passes under the detector. A processor system detects areas of low reflectivity and indicates a defect. A slit mask placed in front of the detector array narrows the imaged swath to reduce false accepts. A color filter in front of the detector array reduces ambient light interference. The processor system incorporates an auto-calibration function to compare the current signal to an averaged reference signal.
    Type: Grant
    Filed: August 10, 2000
    Date of Patent: May 13, 2003
    Assignee: Automated Technology Services, Inc.
    Inventors: Randall William Nichols, Kenneth Wayne Maydew