Abstract: A directional resistivity tool includes at least one receiver deployed axially asymmetrically between at least one pair of transmitters. The transmitters are configured to transmit electromagnetic waves at first and second correspondingly distinct frequencies f1 and f2 such that: f1/f2=L2/L1, where L1 and L2 represent the corresponding axial distances between the first and second transmitters and the receiver. Exemplary embodiments of the invention further include a method for reducing the near-bed anisotropy effect. The anisotropy effect may be advantageously reduced (or removed) while at the same time providing for freedom in selecting the axial transmitter and receiver spacing.

Abstract: A magnetic field has a threshold that adapts in relation to a magnitude of a magnetic field signal representative of a movement of an object. A corresponding method adapts a threshold in relation to a magnitude of a magnetic field signal representative of a movement of an object.

Abstract: A quantum computer includes a unit including thin films A, B and C each containing a physical-system group A, B and C formed of physical systems A, B and C, the films A, B and C being alternately stacked in an order of A, B, C, A, . . . , each of the systems A, B and C having three-different-energy states |0>x, |1>x , |e>x, a quantum bit being expressed by a quantum-mechanical-superposition state of |0>x and |1>x , a light source generating light beams having angular frequencies ?A(E), ye, g, ?A(E), ye, e, ?x, ye, gg, ?x, ye, ge, ?x, ye, eg and ?x, ye, ee, ?A(E), ye, g, a unit controlling frequencies and intensities of the beams, and a unit measuring intensity of light emitted from or transmitted through physical-system group A(E) contained in a lowest one of the thin films A to detect a quantum state of the group A(E).

Abstract: A time-to-breakdown for a dielectric layer in a semiconductor device is determined based upon a sudden change in capacitance. An alternating voltage, greater in magnitude than an operating voltage of the device, is applied to the semiconductor device, capacitance is measured across the dielectric layer during the application of the voltage until a sudden change in capacitance occurs, thereby indicating a breakdown in the dielectric layer, and the breakdown time is scaled to the operating voltage.

Abstract: A frequency characteristic measuring apparatus measures a device under test in which the frequency of an input signal and the frequency of an output signal differ from each other, simplifying the configuration of a tracking generator and peripheral circuits associated with the tracking generator, and simultaneously measuring the characteristics of the input signal and the output signal of the device under test. A spectrum analyzer has mixers, local oscillators and IF sections as first and second measuring units for measuring frequency characteristics of two input signals by performing frequency sweep in correspondence with a first or second frequency range, a mixer and an oscillator as a tracking generator section which operates by being linked to the frequency sweep operation in the first measuring unit, and a section which generates a trigger signal designating measurement start timing.

Abstract: A method for extracting peak information from an amplitude varying sinusoidal waveform output from a sensor is provided. The method includes gating a counter with a keying signal having a keying-signal period generated by a sinusoidal waveform associated with the amplitude varying sinusoidal waveform, receiving high frequency clock signals at the gated counter during keying-signal periods, wherein a clock-signal period is much less than the keying-signal periods, disabling the counter at the end of each keying-signal period, generating a quarter-count value based on the disabling, and outputting a sample pulse associated with each keying-signal period. If a current-keying-signal period is the same as a last-keying-signal period, the sample pulse is generated at a quarter-wave of the sinusoidal waveform. If the current-keying-signal period differs from the last-keying-signal period, the associated output sample pulses are adjusted to the quarter-wave of the sinusoidal waveform in the next-keying-signal period.