Abstract: A system is configured to determine a color distribution of an object moving along a flow direction relative to a spatial filter. The light emanating from the object is time modulated according to the mask features of the spatial filter. First and second detectors are arranged to sense the modulated light. The first detector senses light having a first wavelength spectrum and generates a first electrical output signal in response to the sensed light. The second detector light senses light having a second wavelength spectrum and generates a second electrical output signal in response to the sensed light. Signals from the first and second detectors include information about color distribution of the object.

Abstract: A metrology system includes an image device and a controller. The image device includes a spectrally-tunable illumination device and a detector to generate images of a sample having metrology target elements on two or more sample layers based on radiation emanating from the sample in response to illumination from the spectrally-tunable illumination device. The controller determines layer-specific imaging configurations of the imaging device to image the metrology target elements on the two or more sample layers within a selected image quality tolerance in which each layer-specific imaging configuration includes an illumination spectrum from the spectrally-tunable illumination device. The controller further receives one or more images of the metrology target elements on the two or more sample layers generated using the layer-specific imaging configurations. The controller further provides a metrology measurement based on the one or more images of the metrology target elements on the two or more sample layers.

Abstract: A Raman spectroscopic detection device comprising at least one microfluidic sample channel; at least one excitation waveguide for exciting a Raman signal and at least one collection waveguide for collecting a Raman signal. The output of the excitation waveguide and the input of the collection waveguide are positioned directly in the microfluidic sample channel.

Abstract: To review minute defects that were buried in roughness scattered light with an observation device provided with a dark-field microscope, a scanning electron microscope (SEM), and a control unit, the present invention configures the dark-field microscope by installing a filter for blocking a portion of the scattered light, an imaging lens for focusing the scattered light that has passed through the filter, and a detector for dividing the image of the scattered light focused by the imaging lens into the polarization directions converted by a wavelength plate and detecting the resulting images, and the control has a calculation unit for determining the position of a defect candidate detected by another inspection device using the plurality of images separated into polarization directions and detected by the detector.

Abstract: A non-contact and optical measuring automation system, configured to electrically connect to a computer to measure the profile accuracy of a disk cam, includes a base, a rotating chuck, a moving stage module and a laser displacement meter. The rotating chuck is disposed for clamping the disk cam. The moving stage module includes a first linear motion stage movable relative to the base in a first direction and a second linear motion stage movable relative to the first linear motion stage in a second direction. The computer is able to control the rotation of the rotating chuck and the movement of the moving stage module, and is able to control a beam emitted from the laser displacement meter projecting onto a profile surface of the disk cam so as to obtain a profile deviation value of the disk cam by using the laser triangulation method.

Abstract: The invention relates to an analysis method for supporting classification, a determination method for determining analysis parameters Ys, Ei, Ii, ?i for the analysis method, a computer program product, and an optical analysis system for supporting classification, with which system analysis parameters Ys, Ei, Ii, ?i can be defined on the basis of first and second calibration data. The parameters provide classification support according to the discriminant analysis and on the basis of measured values Pi of optical characteristics i, in particular of organic dispersions, and the information content thereof for classification, in particular the diagnosis of disease; and permit a classification proposal or a diagnosis proposal in comparison with a threshold Ys.

Abstract: A miniature spectrometer includes an optical system, a polarization interferometer with a polarizer and a Savart element and an analyzer, a detection unit with a detector, and a data unit. The optical system of the miniature spectrometer is configured as a diffuser.

Abstract: A spectrometer includes an input unit for receiving an optical signal, a diffraction grating disposed on the transmission path of the optical signal for dispersing the optical signal into a plurality of spectral rays, an image sensor disposed on the transmission path of at least a portion of the spectral rays, and a waveguide device. A waveguide space is formed between the first and second reflective surfaces of the waveguide device. The optical signal is transmitted from the input unit to the diffraction grating via the waveguide space. The portion of the spectral rays is transmitted to the image sensor via the waveguide space. At least one opening is formed on the waveguide device, and is substantially parallel to the first and/or second reflective surface. A portion of the spectral rays and/or the optical signal diffuses from the opening out of the waveguide space without reaching the image sensor.

Abstract: This invention describes the structure and function of an integrated multi-sensing system. Integrated systems described herein may be configured to form a microphone, pressure sensor, gas sensor or accelerometer. The system uses Fabry-Perot Interferometer in conjunction with beam collimator, beam splitter, optical waveguide and a photodetector integrated. It also describes a configurable method for tuning the integrated system to specific resonance frequency using electrostatic actuators.

Abstract: The disclosed technology relates to a method and system for localizing and confining an autonomous mobile work system or systems for performing work in a user defined space. The system can include two or more variable reflective base stations at first and second locations that can modify their optical or electromagnetic reflectivity based upon either an external command via wired or wireless communications interface, or automatically on a regular or asynchronous time schedule under programmed or user settable control. The system also can include one or more autonomous mobile work systems capable of sensing the state of the variable reflectance base stations via sensors such as electromagnetic or optical sensors capable of measuring distance to the reflective base stations.

Abstract: A method for assigning chirality of carbon nanotube is provided. Firstly, carbon nanotube sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the carbon nanotube sample is immersed in the liquid. Thirdly, the carbon nanotube sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Fourthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the carbon nanotube sample. Fifthly, spectra of the carbon nanotube sample are measured to obtain chirality of the carbon nanotube sample.

Abstract: A method for imaging one dimension nanomaterials is provided. Firstly, one dimension nanomaterials sample, an optical microscope with a liquid immersion objective and a liquid are provided. Secondly, the one dimensional nanomaterials sample is immersed in the liquid. Thirdly, the one dimensional nanomaterials sample is illuminated by an incident beam to generate resonance Rayleigh scattering. Fourthly, the liquid immersion objective is immersed into the liquid to get a resonance Rayleigh scattering (RRS) image of the one dimensional nanomaterials sample. Fifthly, spectra of the one dimensional nanomaterials sample are measured to obtain chirality of the one dimensional nanomaterials sample.

Abstract: A laser radar system capable of active polarization comprises a signal processing unit for sending a control signal; a laser emitting unit for emitting a first laser to a target after receiving the control signal, wherein the laser emitting unit comprises a liquid crystal polarization driver and a liquid crystal polarization component group, and the liquid crystal polarization driver controls a phase delay of the liquid crystal polarization component group to therefore change a polarized state of the first laser; and a laser receiving unit for receiving a second laser reflected off the target and analyzing polarization information of the second laser through the signal processing unit to evaluate surface characteristics of the target.

Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

Abstract: Certain aspects of the present disclosure generally relate to an optical reference element having a wavelength spectrum comprising a plurality of wavelength functions having wavelength peaks spaced over a range of wavelengths, wherein adjacent wavelength functions are due to two orthogonal birefringence axes in the optical reference element. Aspects of the present disclosure may eliminate the drift issues associated with residual polarization and polarization dependent loss (PDL) with respect to grating-based sensor and reference element measurements.

Abstract: A compact, mapping spectrometer and various embodiments of the spectrometer are described. Methods for performing high-resolution spectroscopic, spatial, and polarimetric analyses of electromagnetic radiation across the complete electromagnetic spectrum, using spectrometer embodiments of the invention, are also described. The spectrometer and associated methods are useful for producing spectral and hyperspectral images associated with the incoming radiation and for identifying other information about electromagnetic radiation of interest.

Abstract: A sensor and methods of making a sensor are disclosed. The sensor may include a substrate including an opening, an optical source disposed in the substrate and configured to generate an optical source signal, an optical detector disposed in the substrate so that the opening is disposed between the optical source and the optical detector, a plurality of optical cavity structures disposed in the opening wherein each of the plurality of optical cavity structures contains an enclosed cavity so that the respective enclosed cavities are not in gas communication with each other, wherein the plurality of optical cavity structures are arranged in an optical path between the optical source and the optical detector, and a processing circuit coupled to the optical detector and configured to process an optical signal received by the optical detector.

Abstract: A spectrometry device includes a spectroscope, an extraneous light sensor, and a light intensity controller. The spectroscope includes a light source that emits illumination light to a medium and a wavelength-selective interference filter that performs spectroscopy on light incident from the medium. The extraneous light sensor detects the intensity of extraneous light which is incident on the medium. The light intensity controller controls the intensity of the illumination light emitted from the light source such that the light intensity ratio of the illumination light and the extraneous light is equal to a first value.

Abstract: A Raman spectroscopic detection device comprising at least one microfluidic sample channel; at least one excitation waveguide for exciting a Raman signal and at least one collection waveguide for collecting a Raman signal. The output of the excitation waveguide and the input of the collection waveguide are positioned directly in the microfluidic sample channel.

Abstract: The present invention provides a system for measuring a multiphase flow. Fibre optic probes are arranged around a pipe (109) where a multiphase flow passes through for obtaining information about the flow. The data collected from the probes will be translated into useful information.