Patents Examined by W. S. Edmonds
  • Patent number: 5036286
    Abstract: A magnetic and electric force sensing method uses a force responsive transducer made of a micromachined, solid state magnetic sensor consisting of a central silicon platform surrounded and supported by a thin silicon membrane. The silicon substrate is placed over an aluminum pad recessed into a well on a supporting glass substrate. The magnetic sensor responds to a static method of measuring force whereby the Earth's magnetic field or magnetic field or other origin acts as an attractive or repulsive force towards the magnetic material placed onto the silicon platform. The magnetic force mechanically displaces the silicon platform and diaphragm membrane which is transduced to an electrical signal where a change in capacitance is measured. Geometry of the silicon platform, diaphragm membrane and glass well depth are used to affect the linearity, sensitivity and range of measurements of the magnetic sensor.
    Type: Grant
    Filed: March 12, 1990
    Date of Patent: July 30, 1991
    Assignee: The Research Corporation of the University of Hawaii
    Inventors: James W. Holm-Kennedy, Donald K. Umemoto
  • Patent number: 5030912
    Abstract: Apparatus and methodology for mapping the superconductive properties of a sample of superconducting material. The material is cooled so that it is a mixed state and an alternating magnetic field is induced in a portion of the sample to be tested. The harmonic component of the induced alternating magnetic response is measured at a location proximate to the point of induction. As the inducing and measuring devices are displaced relative to the sample the measured amplitude of the harmonic component is stored in suitable storage means as a function of location in the sample. Thus, a map of the superconducting properties of the sample may be generated.
    Type: Grant
    Filed: December 21, 1989
    Date of Patent: July 9, 1991
    Assignee: North American Philips Corp.
    Inventors: Samuel P. Herko, Rameshwar N. Bhargava, Avner A. Shaulov
  • Patent number: 4401945
    Abstract: Apparatus for detecting the position of a probe relative to a workpiece, for example probe contact with the workpiece, is disclosed. The apparatus includes a transducer for converting probe contact to an electrical signal and a plurality of light emitting semiconductors for wirelessly transmitting an indication of the occurrence of the signal via infrared radiation. The apparatus is capable of operation with either a mechanical switch type probe transducer or a current measuring transformer type probe transducer. The apparatus is easily adapted to transmit the occurrence of probe contact by either amplitude modulation or frequency modulation of the emitted infrared radiation.
    Type: Grant
    Filed: April 30, 1981
    Date of Patent: August 30, 1983
    Assignee: The Valeron Corporation
    Inventor: Richard O. Juengel