Abstract: Disclosed is a system for testing serial communications electrical circuit boards which interfaces to a board being tested through a plurality of serial channels. The system contains a plurality of personality modules, each of which can interface directly to a channel. A personality module will perform level shifting, data encoding/decoding, line termination, and clock/framing extraction as needed for a particular serial protocol. The system also contains one or more reconfigurable bit processors which may be connected together in a building block fashion to perform low-level processing on serial data received from or sent to a personality module. One of a plurality of serial test sequencers receives or sends data from/to a reconfigurable bit processor; provides a user programmable apparatus to control the application and reception of test patterns to and from a channel; and interfaces to the user through a system controller.

Abstract: Disclosed is a method of testing ultra large area integrated circuits. The circuit has a plurality of individually addressable elements. The method comprises providing a dispersed chargeable powder with the integrated circuit in proximity to and above the powder. At least one device of the integrated circuit is electrically selected. An electrical potential is applied between the integrated circuit and the dispersed powder. The potential causes the chargeable particles to adhere to substantially only functional selected devices of the integrated circuit, thereby differentiating between functional and non-functional devices.

Abstract: An improved method and apparatus for measuring a target electric current utilizing a Faraday effect in which an optical medium is magnetically coupled with the target electric current and light is passed through the optical medium at an orientation for which the effects of birefringence on the optical medium can be disregarded in comparison with the Faraday effect, and the light departing from the optical medium is measured and analyzed in a manner permitting the target current to be accurately determined.

Abstract: Three classes of active probes all with coaxial inputs and coplanar waveguide probe tips are described. A millimeter-wave active probe for generating signals with frequencies above 50 gHz and supplying same to millimeter-wave and ultrafast devices and integrated circuits on-wafer including a substrate upon which a frequency multiplier consisting of filter sections and impedance matching sections and nonlinear elements are integrated in uniplanar transmission line medium. Also disclosed is a harmonic mixer probe to step down RF received from an integrated circuit to a lower frequency by mixing it with the harmonics of a local oscillator signal.

Abstract: A method and apparatus are disclosed for testing integrated circuit devices. A ferromagnetic test substrate is manufactured, utilizing a process substantially similar to the process utilized to create the integrated circuit devices to be tested, such that the test substrate and the integrated circuit devices are thermally matched. The test substrate preferably includes a plurality of electrical contact points which correspond to a plurality of electrical contact points within the integrated circuit device. By aligning the ferromagnetic test substrate and integrated circuit device to be tested in a position proximate to an electromagnet and selectively energizing the electromagnet, the electrical contact points within the ferromagnetic test substrate are magnetically urged into contact with the electrical contact points within the integrated circuit device.

Abstract: A diaphragm test probe for establishing a detachable electrical connection to the pads on an integrated circuit chip. Leads are electrically connected to a plurality of conductive contacts which are affixed to a flexible diaphragm. The conductive contacts are arranged to match the pattern of the pads on the integrated circuit chip and are aligned with these pads using visual sighting. After alignment, fluidic pressure is applied to the flexible diaphragm, causing it to flex and, in turn, the conductive contacts to make electrical contact with the pads on the integrated circuit. A plurality of sets of conductive contacts may be affixed to a single flexible diaphragm so as to allow multiple chip testing without realignment of the test probe.

Abstract: A test fixture for testing microstrip assemblies and similar electronic circuit components and assemblies under application of high-frequency signals introduced through launchers whose positions are adjustable in the test fixture to accommodate circuit assemblies of different sizes and different geometry. An easily operated rapid connector positioning mechanism moves connectors which complete electrical connection between outer conductors of the launchers and a ground plane conductor of a microstrip assembly. The connectors also lift the microstrip assembly and support it while electrical connection is completed, without the need for a carrier beneath the test assembly. A lid is moved in coordination with operation of the connector positioning mechanism to provide electrical contact to a third point on the upper face of a circuit assembly to be tested.

Abstract: An auto-ranging circuit for an electronic watthour meter employs high- and low-range sources for increasing the dynamic range over which satisfactory measurement accuracy can be maintained. A counter, having a capacity equal to the ratio of high-range to low-range is interposed in the output during use of the low-range source so that output pulses have the same energy-consumption significance at all time. At transition from low-range to high-range, any residue in the counter, representing energy consumed but not yet recognized by the generation of an output pulse, is preset into an integrator of the electronic watthour meter for reducing correspondingly the amount of energy consumption required to produce an output pulse in the first measurement cycle following the low- to high-range transition.

Abstract: An automatic sheet resistance mapping system for semiconductor wafers which has the capability of taking high accuracy, multiple test readings in both contour scan and diameter scan modes. A rotatable wafer stage carries a semiconductor wafer thereon with the center of the wafer positioned substantially at the axis of rotation of the wafer stage. A probe head assembly, including a linear array of at least four equally spaced probe tips projecting from one surface of the assembly is mounted facing the wafer stage on an arrangement for moving the probe tips alternately into and out of contact with the surface of a wafer carried thereon. Positioning arrangements are provided for rotating the wafer stage to accurately registered angular test positions and for producing translation between the wafer stage and the probe head assembly to position the array of probe tips at accurately registered radial test positions relative to the center of the wafer.

Abstract: Method and apparatus for testing D.C. motors, D.C. generators, electromagnetic devices, and the like is disclosed. An electrical circuit produces a current limited, pulsating or otherwise time varying direct current signal which is applied to the device or component under test. The signal induces a return signal in the device or component under test, or in a magnetic sensor placed in proximity to the device or component under test. The return signal is amplified and displayed on an amplifier output display. Novel methods are disclosed which utilize the apparatus to (1) determine and set the neutral plane in a D.C. motor or commutator type generator, (2) locate grounded, shorted, open or crossed coils or bars in an armature of a D.C. motor or a D.C. generator, (3) determine the relative magnetic polarity of the windings of various electromagnetic devices, and (4) detect shorted, grounded, or faulty field windings of various electromagnetic devices, including field coil windings in D.C. motors and generators.

Abstract: A clamp-type ammeter probe includes two opposed jaws interconnected for pivotal movement between open and closed conditions and biased to the closed condition, with each of the jaws being of unitary one-piece molded construction. Each jaw includes a magnetic core unit comprising a core segment molded to a spacer segment and fitted within a channel-shaped shield segment to form a unit which is then molded between an outer shell and an inner segment of the jaw for encompassing the core unit except for exposed end portions thereof. These exposed portions on one jaw mate with those on the other jaw when the jaws are closed so that the core segments form a magnetic loop to encircle an associated conductor while the shield segments form a shield path encompassing the core loop. Stop surfaces on the inner segments provide a gap in the core loop in which a magnetic sensor is disposed.