Patents by Inventor A. E. LeColst

A. E. LeColst has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Integrated test cell
    Patent number: 6310486
    Abstract: A semiconductor tester is disclosed that is adapted for testing semiconductor devices disposed on a handling apparatus. The semiconductor tester includes a tester housing defining a self-supporting frame and formed with an externally accessible opening adapted for receiving the handling apparatus. A test controller is disposed within the housing and carried by the frame. Pin electronics including tester circuitry are responsive to the test controller and proximately coupled thereto and mounted to the frame. A docking apparatus is disposed above the opening and is adapted to couple the tester circuitry to the handling apparatus.
    Type: Grant
    Filed: October 1, 1999
    Date of Patent: October 30, 2001
    Assignee: Teradyne, Inc.
    Inventors: David Trevisan, Michael A. Caradonna, Paul Trudeau, Isreal Blagdan, A. E. LeColst