Abstract: A test apparatus implements a method for testing electronic devices that exhibit non-deterministic behavior. The test apparatus includes a high-speed buffer queue for storing data packets. The data packets arrive at one end of the queue and, as they exit at the other end, are compared against expect data packets stored in memory. If the data packet exiting the buffer queue corresponds to response signals generated by the device under test during a non-deterministic (e.g., idle) state, the expect data packet is not retrieved from memory and the comparison is not made.

Abstract: A test apparatus implements a method for testing electronic devices that exhibit non-deterministic behavior. The test apparatus includes a high-speed buffer queue for storing data packets. The data packets arrive at one end of the queue and, as they exit at the other end, are compared against expect data packets stored in memory. If the data packet exiting the buffer queue corresponds to response signals generated by the device under test during a non-deterministic (e.g., idle) state, the expect data packet is not retrieved from memory and the comparison is not made.

Abstract: An apparatus for testing electronic devices that output high-speed serial data bit streams employs a programmable device to adjust the timing of the strobe so that the data bit stream being analyzed is strobed at or near the center of the bit. The programmable device sets a number of different reference strobe points that are used to strobe the data bit streams. The different reference strobe points span a single bit interval at regular intervals. The programmable device evaluates the strobe readings generated with the different reference strobe points and selects one of them as the one to be used during testing. The selection is made during the initialization phase of testing or intermittently while the test is being carried out.