Patents by Inventor A. Vince Mrstik

A. Vince Mrstik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and apparatus for determining parameters of an array
    Patent number: 8654016
    Abstract: Methods and apparatus for determining parameters for an array are described. An exemplary embodiment of a method determines a set of parameters for an antenna array including multiple array elements, the array being fed by a feed array including a plurality of feed elements. The embodiment of the method includes measuring a plurality of bistatic ranges Rijk through different signal path combinations, each signal path combination from a feed element “i,” to an array element “j,” and to a feed element “k”. The measuring includes radiating energy from feed element “i”, and reflecting some of the radiated energy from array element “j” back to feed element k of the feed array. The measured bistatic ranges are processed to solve for the set of parameters.
    Type: Grant
    Filed: November 5, 2012
    Date of Patent: February 18, 2014
    Assignee: Raytheon Company
    Inventor: A. Vince Mrstik
  • Methods and apparatus for determining parameters of an array
    Patent number: 8330662
    Abstract: Methods and apparatus for determining parameters for an array are described. An exemplary embodiment of a method determines a set of parameters for an antenna array including multiple array elements, the array being fed by a feed array including a plurality of feed elements. The embodiment of the method includes measuring a plurality of bistatic ranges Rijk through different signal path combinations, each signal path combination from a feed element “i,” to an array element “j,” and to a feed element “k”. The measuring includes radiating energy from feed element “i”, and reflecting some of the radiated energy from array element “j” back to feed element k of the feed array. The measured bistatic ranges are processed to solve for the set of parameters.
    Type: Grant
    Filed: February 23, 2010
    Date of Patent: December 11, 2012
    Assignee: Raytheon Company
    Inventor: A. Vince Mrstik
  • Methods and apparatus for determining parameters of an array
    Publication number: 20110205130
    Abstract: Methods and apparatus for determining parameters for an array are described. An exemplary embodiment of a method determines a set of parameters for an antenna array including multiple array elements, the array being fed by a feed array including a plurality of feed elements. The embodiment of the method includes measuring a plurality of bistatic ranges Rijk through different signal path combinations, each signal path combination from a feed element “i,” to an array element “j,” and to a feed element “k”. The measuring includes radiating energy from feed element “i”, and reflecting some of the radiated energy from array element “j” back to feed element k of the feed array. The measured bistatic ranges are processed to solve for the set of parameters.
    Type: Application
    Filed: February 23, 2010
    Publication date: August 25, 2011
    Inventor: A. Vince Mrstik