Publication number: 20250183182
Abstract: Various techniques for alleviating (e.g., mitigating or reducing) stresses between glass core materials and electrically conductive materials deposited in through-glass vias (TGVs) and related devices and methods are disclosed. In one aspect, a microelectronic assembly includes a glass core having a first face and a second face opposite the first face, and a TGV extending through the glass core between the first face and the second face, wherein the TGV includes a conductive material and a buffer layer between the conductive material and the glass core, wherein a CTE of the buffer layer is smaller than a CTE of the conductive material.
Type:
Application
Filed:
November 30, 2023
Publication date:
June 5, 2025
Inventors:
Bohan Shan, Mahdi Mohammadighaleni, Joshua Stacey, Ehsan Zamani, Aaditya Candadai, Jacob Vehonsky, Daniel Wandera, Mitchell Page, Srinivas Venkata Ramanuja Pietambaram, Gang Duan, Jeremy Ecton, Brandon C. Marin, Onur Ozkan, Vinith Bejugam, Dhruba Pattadar, Amm Hasib, Nicholas Haehn, Makoyi Watson, Sanjay Tharmarajah, Jason M. Gamba, Yuqin Li, Astitva Tripathi, Mohammad Mamunur Rahman, Haifa Hariri, Shayan Kaviani, Logan Myers, Darko Grujicic, Elham Tavakoli, Whitney Bryks, Dilan Seneviratne, Bainye Angoua, Peumie Abeyratne Kuragama, Hongxia Feng, Kyle Jordan Arrington, Bai Nie, Jose Waimin, Ryan Carrazzone, Haobo Chen, Dingying Xu, Ziyin Lin, Yiqun Bai, Xiaoying Guo, Bin Mu, Thomas S. Heaton, Rahul N. Manepalli