Abstract: A health provider matching service is provided to match patients to health providers based on a semantic relationship graph of data associated with conditions of patients. Using natural language processing, the service identifies terms describing symptoms, treatments, and health providers associated with a condition. The service then identifies semantic relations among the terms and probability distributions of the terms to generate a semantic relationship graph. Quality information of therapists is combined with machine learning techniques to identify features that are used to distinguish high quality and low quality providers. Based on the semantic relationship graph and the derived quality information, the service matches a patient to a health provider suitable to treat the particular needs of the patient. The service also handles social, behavioral, or emotional issues for which medications are not appropriate.

Abstract: An optimization system optimizes groups of providers for a given population of users. The optimization system includes various engines such as a source interface engine, selection engine, and group score engine. The source interface engine receives information to be used in constrained optimization from server computers and stores the information in databases. The selection engine selects groups of providers from a set of all available providers. The group score engine generates a score for each group of providers. The selection engine continues to iteratively select groups of providers to minimize the generated score. The selection engine can use hard constraints, for example, requiring that a certain type of provider be included in all selected groups, or soft constraints, for example, requiring that a certain number of providers be included based on a size of the given population.

Abstract: A system and method autonomously determines the impact of respective tool parameters on tool performance in a semiconductor manufacturing system. A parameter impact identification system receives tool parameter and tool performance data for one or more process runs of the semiconductor fabrication system and generates a separate function for each tool parameter characterizing the behavior of a tool performance indicator in terms of a single one of the tool parameters. Each function is then scored according to how well the function predicts the actual behavior of the tool performance indicator, or based on a determined sensitivity of the tool performance indicator to changes in the single tool parameter. The tool parameters are then ranked based on these scores, and a reduced set of critical tool parameters is derived based on the ranking. The tool performance indicator can then be modeled based on this reduced set of tool parameters.

Abstract: A system and method for autonomously tracing a cause of particle contamination during semiconductor manufacture is provided. A contamination analysis system analyzes tool process logs together with particle contamination data for multiple process runs to determine a relationship between systematic particle contamination levels and one or more tool parameters. This relationship is used to predict expected contamination levels associated with regular usage of the tool, and to identify which tool parameters have the largest impact on expected levels of particle contamination. The contamination analysis system also identifies process logs showing unexpected deviant particle contamination levels that exceed expected contamination levels, and traces the cause of the deviant particle contamination to particular process log parameter events.

Abstract: An optimization system optimizes groups of providers for a given population of users. The optimization system includes various engines such as a source interface engine, selection engine, and group score engine. The source interface engine receives information to be used in constrained optimization from server computers and stores the information in databases. The selection engine selects groups of providers from a set of all available providers. The group score engine generates a score for each group of providers. The selection engine continues to iteratively select groups of providers to minimize the generated score. The selection engine can use hard constraints, for example, requiring that a certain type of provider be included in all selected groups, or soft constraints, for example, requiring that a certain number of providers be included based on a size of the given population.

Abstract: A health provider matching service is provided to match patients to health providers based on a semantic relationship graph of data associated with conditions of patients. Using natural language processing, the service identifies terms describing symptoms, treatments, and health providers associated with a condition. The service then identifies semantic relations among the terms and probability distributions of the terms to generate a semantic relationship graph. Quality information of therapists is combined with machine learning techniques to identify features that are used to distinguish high quality and low quality providers. Based on the semantic relationship graph and the derived quality information, the service matches a patient to a health provider suitable to treat the particular needs of the patient. The service also handles social, behavioral, or emotional issues for which medications are not appropriate.

Abstract: A system and method autonomously determines the impact of respective tool parameters on tool performance in a semiconductor manufacturing system. A parameter impact identification system receives tool parameter and tool performance data for one or more process runs of the semiconductor fabrication system and generates a separate function for each tool parameter characterizing the behavior of a tool performance indicator in terms of a single one of the tool parameters. Each function is then scored according to how well the function predicts the actual behavior of the tool performance indicator, or based on a determined sensitivity of the tool performance indicator to changes in the single tool parameter. The tool parameters are then ranked based on these scores, and a reduced set of critical tool parameters is derived based on the ranking. The tool performance indicator can then be modeled based on this reduced set of tool parameters.

Abstract: A behavioral health risk assessment service is provided to determine the behavioral health risk of a patient using personal demographic information and the patient's responses to adaptive screening questions. The screening questions are customized to the patient using machine learning techniques such as decision trees that optimize the amount of expected information gain on the behavioral health risk of the patient. A model of the patient's activity such as exercise and sleep is also generated and trained using data collected from smart devices used by the patient. Based on the determined behavioral health risk, the risk assessment service refers the patient to an appropriate provider, such as a therapist, to treat any diagnosed behavioral health conditions.

Abstract: A system and method autonomously determines the impact of respective tool parameters on tool performance in a semiconductor manufacturing system. A parameter impact identification system receives tool parameter and performance data for one or more process runs of the semiconductor fabrication system and generates a separate function for each tool parameter characterizing the behavior of a tool performance indicator in terms of a single one of the tool parameters. Each function is then scored according to how well the function predicts the behavior of the tool performance indicator, or based on a determined sensitivity of the tool performance indicator to changes in the single tool parameter. The tool parameters are then ranked based on these scores, and a reduced set of critical tool parameters is derived based on the ranking. The tool performance indicator can then be modeled based on this reduced set of tool parameters.

Abstract: A personalized health care provider matching service is provided to rank and select the best matched health care providers for a patient across multiple dimensions according to the patient's medical conditions, non-medical factors and treatment preferences. Each medical condition of the patient represents a dimension. The service measures a provider's level of competency for treating a medical condition, e.g., based on the provider's drug prescription patterns in treating the medical condition measured against a reference practice standard. The provider matching service ranks the providers across the multiple medical conditions/treatment needs of a patient, where the rankings of the providers represent the providers' competency across multiple dimensions. The provider matching service assesses a patient's needs across different medical conditions and applies different weights to different corresponding dimensions in ranking the providers.

Abstract: A system and method for autonomously tracing a cause of particle contamination during semiconductor manufacture is provided. A contamination analysis system analyzes tool process logs together with particle contamination data for multiple process runs to determine a relationship between systematic particle contamination levels and one or more tool parameters. This relationship is used to predict expected contamination levels associated with regular usage of the tool, and to identify which tool parameters have the largest impact on expected levels of particle contamination. The contamination analysis system also identifies process logs showing unexpected deviant particle contamination levels that exceed expected contamination levels, and traces the cause of the deviant particle contamination to particular process log parameter events.

Abstract: A system and method for autonomously tracing a cause of particle contamination during semiconductor manufacture is provided. A contamination analysis system analyzes tool process logs together with particle contamination data for multiple process runs to determine a relationship between systematic particle contamination levels and one or more tool parameters. This relationship is used to predict expected contamination levels associated with regular usage of the tool, and to identify which tool parameters have the largest impact on expected levels of particle contamination. The contamination analysis system also identifies process logs showing unexpected deviant particle contamination levels that exceed expected contamination levels, and traces the cause of the deviant particle contamination to particular process log parameter events.

Abstract: A method and apparatus for providing a facility location plan for a network with a V-shaped facility cost are disclosed. For example, the method receives an event from a queue, wherein the event comprises an open event or a tight event. The method connects a plurality of adjacent clients to a facility, if the event comprises the open event, and adds a new client-facility edge to a graph comprising a plurality of client-facility edges, if the event comprises the tight event.

Abstract: A method includes receiving demand information for a first segment of a media content item and receiving demand information for a second segment of the media content item. The method includes assigning the first segment to a first set of distribution nodes of a media content distribution system based at least partially on the demand information for the first segment and based at least partially on a first cost function and assigning the second segment to a second set of distribution nodes of the media content distribution system based at least partially on the demand information for the second segment and based at least partially on a second cost function. The media content distribution system includes a plurality of distribution nodes and each distribution node is configured to provide media content items to at least some of a plurality of endpoints.

Abstract: A system and method for autonomously tracing a cause of particle contamination during semiconductor manufacture is provided. A contamination analysis system analyzes tool process logs together with particle contamination data for multiple process runs to determine a relationship between systematic particle contamination levels and one or more tool parameters. This relationship is used to predict expected contamination levels associated with regular usage of the tool, and to identify which tool parameters have the largest impact on expected levels of particle contamination. The contamination analysis system also identifies process logs showing unexpected deviant particle contamination levels that exceed expected contamination levels, and traces the cause of the deviant particle contamination to particular process log parameter events.

Abstract: A system and method for autonomously determining the impact of respective tool parameters on tool performance in a semiconductor manufacturing system is provided. A parameter impact identification system receives tool parameter and tool performance data for one or more process runs of the semiconductor fabrication system and generates a separate function for each tool parameter characterizing the behavior of a tool performance indicator in terms of a single one of the tool parameters. Each function is then scored according to how well the function predicts the actual behavior of the tool performance indicator, or based on a determined sensitivity of the tool performance indicator to changes in the single tool parameter. The tool parameters are then ranked based on these scores, and a reduced set of critical tool parameters is derived based on the ranking. The tool performance indicator can then be modeled based on this reduced set of tool parameters.

Abstract: A method includes receiving demand information for a first segment of a media content item and receiving demand information for a second segment of the media content item. The method includes assigning the first segment to a first set of distribution nodes of a media content distribution system based at least partially on the demand information for the first segment and based at least partially on a first cost function and assigning the second segment to a second set of distribution nodes of the media content distribution system based at least partially on the demand information for the second segment and based at least partially on a second cost function. The media content distribution system includes a plurality of distribution nodes and each distribution node is configured to provide media content items to at least some of a plurality of endpoints.

Abstract: A method and apparatus for providing facility location plans for a network are disclosed. For example, the method identifies a facility and a number of nearest active clients associated with a minimized cost per unit demand of connecting these clients to this facility. The method then connects the number of nearest active clients to the facility associated with the minimized cost per unit demand. In one embodiment, the method iterates this process with the remaining clients until all demands have been assigned to facilities.