Patents by Inventor Aaron C. Drollette

Aaron C. Drollette has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and systems for detection of impurities in additive manufacturing material
    Patent number: 12240180
    Abstract: An example method for detection of impurities in additive manufacturing material includes illuminating, by a light source, a sample of additive manufacturing material with light, while illuminating the sample of the additive manufacturing material with light, causing a camera to acquire image data of the sample, and processing the image data to determine an amount of impurities in the sample of the additive manufacturing material. An example system for detection of impurities in additive manufacturing material includes a light source for illuminating a sample of additive manufacturing material with light, a camera for acquiring image data of the sample while illuminating the sample of the additive manufacturing material with light, and a computing device having one or more processors configured to execute instructions stored in memory for processing the image data to determine an amount of impurities in the sample of the additive manufacturing material.
    Type: Grant
    Filed: February 28, 2020
    Date of Patent: March 4, 2025
    Assignee: The Boeing Company
    Inventors: Alexander J. Coco, Brianna K. Nord, Robert W. Grube, Emma Romig, Aaron C. Drollette, Eric M. Chapman
  • Methods and Systems for Detection of Impurities in Additive Manufacturing Material
    Publication number: 20210268740
    Abstract: An example method for detection of impurities in additive manufacturing material includes illuminating, by a light source, a sample of additive manufacturing material with light, while illuminating the sample of the additive manufacturing material with light, causing a camera to acquire image data of the sample, and processing the image data to determine an amount of impurities in the sample of the additive manufacturing material. An example system for detection of impurities in additive manufacturing material includes a light source for illuminating a sample of additive manufacturing material with light, a camera for acquiring image data of the sample while illuminating the sample of the additive manufacturing material with light, and a computing device having one or more processors configured to execute instructions stored in memory for processing the image data to determine an amount of impurities in the sample of the additive manufacturing material.
    Type: Application
    Filed: February 28, 2020
    Publication date: September 2, 2021
    Inventors: Alexander J. Coco, Brianna K. Nord, Robert W. Grube, Emma Romig, Aaron C. Drollette, Eric M. Chapman