Patents by Inventor Aaron C. Havener

Aaron C. Havener has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and method for inspection of a material
    Patent number: 11709150
    Abstract: A method of inspecting a material includes examining a surface of a test material with an eddy current sensor and applying an X-ray fluorescence analysis to the surface of the test material at the same location at which the eddy current examination was performed.
    Type: Grant
    Filed: December 23, 2021
    Date of Patent: July 25, 2023
    Assignee: BWXT Nuclear Operations Group, Inc.
    Inventors: Paul D. Sheldon, Wayne M. Latham, Thomas C. Mohr, Aaron C. Havener, Richard Manzini, Timothy A. Policke
  • APPARATUS AND METHOD FOR INSPECTION OF A MATERIAL
    Publication number: 20220268735
    Abstract: A method of inspecting a material includes examining a surface of a test material with an eddy current sensor and applying an X-ray fluorescence analysis to the surface of the test material at the same location at which the eddy current examination was performed.
    Type: Application
    Filed: December 23, 2021
    Publication date: August 25, 2022
    Inventors: Paul D. Sheldon, Wayne M. Latham, Thomas C. Mohr, Aaron C. Havener, Richard Manzini, Timothy A. Policke
  • Apparatus and method for inspection of a film on a substrate
    Patent number: 11237117
    Abstract: Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response.
    Type: Grant
    Filed: August 31, 2020
    Date of Patent: February 1, 2022
    Assignees: BWXT Nuclear Operations Group, Inc., BWXT NOG Technologies, Inc.
    Inventors: Aaron C. Havener, James D. Jogerst, Thomas C. Mohr, Keith B. Rider
  • APPARATUS AND METHOD FOR INSPECTION OF A FILM ON A SUBSTRATE
    Publication number: 20200400585
    Abstract: Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response.
    Type: Application
    Filed: August 31, 2020
    Publication date: December 24, 2020
    Inventors: Aaron C. Havener, James D. Jogerst, Thomas C. Mohr, Keith B. Rider
  • Apparatus and method for inspection of a film on a substrate
    Patent number: 10761032
    Abstract: Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response.
    Type: Grant
    Filed: February 26, 2019
    Date of Patent: September 1, 2020
    Assignees: BWXT Nuclear Operations Group, Inc., BWXT NOG Technologies, Inc.
    Inventors: Aaron C. Havener, James D. Jogerst, Thomas C. Mohr, Keith B. Rider
  • APPARATUS AND METHOD FOR INSPECTION OF A FILM ON A SUBSTRATE
    Publication number: 20200271591
    Abstract: Methods of and apparatus for inspecting composite layers of a first material formed on a second material are provided including providing an illumination source, illuminating at least a portion of the composite at the layer, receiving light reflected from the sample, determining a spectral response from the received light, and comparing the received spectral response to an expected spectral response.
    Type: Application
    Filed: February 26, 2019
    Publication date: August 27, 2020
    Inventors: Aaron C. Havener, James D. Jogerst, Thomas C. Mohr, Keith B. Rider