Abstract: An imaging system, semiconductor device, and method of manufacture of a photo-detector device are disclosed. For example, an imaging system is disclosed, which includes a photo-detector unit including a plurality of conductive trenches formed within the photo-detector unit, and a plurality of electrical contacts, each electrical contact connected to a respective conductive trench. The imaging system further includes a light data processor unit coupled to an output of the photo-detector unit to convert an analog signal received from the photo-detector unit to a digital signal, a processing unit coupled to an output of the light data processor unit to generate a control signal in response to the digital signal, and a display unit coupled to an output of the processing unit to vary the intensity of an image displayed in response to the control signal.