Patents by Inventor Aaron McLeod

Aaron McLeod has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20260130141
    Abstract: A method of selectively depositing a dielectric material on a metal surface relative to a non-metal surface is disclosed. An exemplary method includes using a first reactant to selectively form desired terminal functional groups on the non-metal surface and selectively reacting a second reactant with the terminal functional groups to selectively form an organic layer on the non-metal surface.
    Type: Application
    Filed: October 30, 2025
    Publication date: May 7, 2026
    Inventors: Adam Vianna, Krzysztof Kamil Kachel, Aaron McLeod, Leonard Rodriguez, Kristina Paula Martinez
  • Patent number: 12557651
    Abstract: Provided are high quality metal-nitride, such as aluminum nitride (AlN), films for heat dissipation and heat spreading applications, methods of preparing the same, and deposition of high thermal conductivity heat spreading layers for use in RF devices such as power amplifiers, high electron mobility transistors, etc. Aspects of the inventive concept can be used to enable heterogeneously integrated compound semiconductor on silicon devices or can be used in in non-RF applications as the power densities of these highly scaled microelectronic devices continues to increase.
    Type: Grant
    Filed: February 8, 2021
    Date of Patent: February 17, 2026
    Assignees: The Regents of the University of California, The Board of Trustees of the Leland Stanford Junior University, Raytheon Company
    Inventors: Scott Ueda, Aaron McLeod, Andrew Kummel, Mike Burkland, Eduardo M. Chumbes, Thomas E. Kazior, Eric Pop, Michelle Chen, Chris Perez, Mark Rodwell
  • Publication number: 20240052493
    Abstract: This invention allows for the deposition of aluminum nitride buffer layers and templating films that greatly enhance the quality of additional aluminum nitride deposited by alternate deposit ion techniques and reduce the overall thickness of needed buffer layers. Furthermore, these films can be deposited at substrate temperatures of 400° C. and 580° C. which is considerably lower than other techniques, such as molecular beam epitaxy (MBE) and metal organic chemical vapor deposition (MOCVD).
    Type: Application
    Filed: May 2, 2023
    Publication date: February 15, 2024
    Inventors: Aaron McLeod, Scott Ueda, Andrew Kummel
  • Publication number: 20210249331
    Abstract: Provided are high quality metal-nitride, such as aluminum nitride (AlN), films for heat dissipation and heat spreading applications, methods of preparing the same, and deposition of high thermal conductivity heat spreading layers for use in RF devices such as power amplifiers, high electron mobility transistors, etc. Aspects of the inventive concept can be used to enable heterogeneously integrated compound semiconductor on silicon devices or can be used in in non-RF applications as the power densities of these highly scaled microelectronic devices continues to increase.
    Type: Application
    Filed: February 8, 2021
    Publication date: August 12, 2021
    Inventors: Scott Ueda, Aaron McLeod, Andrew Kummel, Mike Burkland, Eduardo M. Chumbes, Thomas E. Kazior, Eric Pop, Michelle Chen, Chris Perez, Mark Rodwell