Patents by Inventor Aaron Torok
Aaron Torok has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11887805Abstract: Electron sources can include an electron source crystal coupled in series between opposing electrically conductive supports to form an electrically conductive path, wherein the electrical resistance of each of the electrically conductive supports is lower than the electrical resistance of the electron source crystal. Electron source crystals can include an emitting end and opposing shank end, wherein the shank end includes opposing leg portions. Electrically conductive supports can include foil supports spaced apart across a gap, wherein each of the opposing leg portions is attached to a respective foil support such that the foil supports are electrically connected to form the electrically conductive path. Particle focusing system are also disclosed. Electron sources can include an electron source crystal having an emitting end and opposing shank end, wherein the shank end is formed of a pair of opposing leg portions. Methods of manufacturing and operating electron sources are also disclosed.Type: GrantFiled: September 30, 2021Date of Patent: January 30, 2024Assignee: FEI CompanyInventors: John Stiller, Aaron Torok, Kevin Kagarice
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Publication number: 20240021407Abstract: Systems and method for the preparation and delivery of biological samples for charged particle analysis are disclosed herein. An example system at least includes an ion filter coupled to select a sample ion from an ionized sample supply, the ion filter including a quadrupole filter to select the sample ion from the sample supply, an energy reduction cell coupled to receive the selected sample ion and reduce a kinetic energy of the sample ion, a validation unit coupled to receive the sample ion and determine whether the sample ion is a target sample ion, a substrate coupled to receive the sample, wherein the substrate is electron transparent, an ion transport module coupled to receive the sample ion from the ion filter and transport the sample ion to the substrate, and an imaging system arranged to image, with a low energy charged particle beam, the sample located on the substrate, wherein the substrate is arranged in an analysis location.Type: ApplicationFiled: July 18, 2023Publication date: January 18, 2024Inventors: Marcus STRAW, Dmitry GRINFELD, Alexander MAKAROV, Alan BAHM, Aaron TOROK, Kun LIU, Joseph CHRISTIAN, Josh GILBERT, Tom NICHOLS, Jeff KOSMOSKI
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Patent number: 11749498Abstract: Systems and method for the preparation and delivery of biological samples for charged particle analysis are disclosed herein. An example system at least includes an ion filter coupled to select a sample ion from an ionized sample supply, the ion filter including a quadrupole filter to select the sample ion from the sample supply, an energy reduction cell coupled to receive the selected sample ion and reduce a kinetic energy of the sample ion, a validation unit coupled to receive the sample ion and determine whether the sample ion is a target sample ion, a substrate coupled to receive the sample, wherein the substrate is electron transparent, an ion transport module coupled to receive the sample ion from the ion filter and transport the sample ion to the substrate, and an imaging system arranged to image, with a low energy charged particle beam, the sample located on the substrate, wherein the substrate is arranged in an analysis location.Type: GrantFiled: December 22, 2021Date of Patent: September 5, 2023Assignee: FEI CompanyInventors: Marcus Straw, Alexander Makarov, Josh Gilbert, Aaron Torok, Joseph Christian, Alan Bahm, Kun Liu, Tom Nichols, Jeff Kosmoski, Dmitry Grinfeld
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Publication number: 20230101787Abstract: Electron sources can include an electron source crystal coupled in series between opposing electrically conductive supports to form an electrically conductive path, wherein the electrical resistance of each of the electrically conductive supports is lower than the electrical resistance of the electron source crystal. Electron source crystals can include an emitting end and opposing shank end, wherein the shank end includes opposing leg portions. Electrically conductive supports can include foil supports spaced apart across a gap, wherein each of the opposing leg portions is attached to a respective foil support such that the foil supports are electrically connected to form the electrically conductive path. Particle focusing system are also disclosed. Electron sources can include an electron source crystal having an emitting end and opposing shank end, wherein the shank end is formed of a pair of opposing leg portions. Methods of manufacturing and operating electron sources are also disclosed.Type: ApplicationFiled: September 30, 2021Publication date: March 30, 2023Applicant: FEI CompanyInventors: John Stiller, Aaron Torok, Kevin Kagarice
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Publication number: 20220115205Abstract: Systems and method for the preparation and delivery of biological samples for charged particle analysis are disclosed herein. An example system at least includes an ion filter coupled to select a sample ion from an ionized sample supply, the ion filter including a quadrupole filter to select the sample ion from the sample supply, an energy reduction cell coupled to receive the selected sample ion and reduce a kinetic energy of the sample ion, a validation unit coupled to receive the sample ion and determine whether the sample ion is a target sample ion, a substrate coupled to receive the sample, wherein the substrate is electron transparent, an ion transport module coupled to receive the sample ion from the ion filter and transport the sample ion to the substrate, and an imaging system arranged to image, with a low energy charged particle beam, the sample located on the substrate, wherein the substrate is arranged in an analysis location.Type: ApplicationFiled: December 22, 2021Publication date: April 14, 2022Applicant: FEI CompanyInventors: Marcus Straw, Alexander Makarov, Josh Gilbert, Aaron Torok, Joseph Christian, Alan Bahm, Kun Liu, Tom Nichols, Jeff Kosmoski, Dmitry Grinfeld
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Patent number: 11217425Abstract: Systems and method for the preparation and delivery of biological samples for charged particle analysis are disclosed herein. An example system at least includes an ion filter coupled to select a sample ion from an ionized sample supply, the ion filter including a quadrupole filter to select the sample ion from the sample supply, an energy reduction cell coupled to receive the selected sample ion and reduce a kinetic energy of the sample ion, a validation unit coupled to receive the sample ion and determine whether the sample ion is a target sample ion, a substrate coupled to receive the sample, wherein the substrate is electron transparent, an ion transport module coupled to receive the sample ion from the ion filter and transport the sample ion to the substrate, and an imaging system arranged to image, with a low energy charged particle beam, the sample located on the substrate, wherein the substrate is arranged in an analysis location.Type: GrantFiled: June 29, 2020Date of Patent: January 4, 2022Assignee: FEI CompanyInventors: Marcus Straw, Alexander Makarov, Josh Gilbert, Aaron Torok, Joseph Christian, Alan Bahm, Kun Liu, Tom Nichols, Jeff Kosmoski, Dmitry Grinfeld
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Publication number: 20200411282Abstract: Systems and method for the preparation and delivery of biological samples for charged particle analysis are disclosed herein. An example system at least includes an ion filter coupled to select a sample ion from an ionized sample supply, the ion filter including a quadrupole filter to select the sample ion from the sample supply, an energy reduction cell coupled to receive the selected sample ion and reduce a kinetic energy of the sample ion, a validation unit coupled to receive the sample ion and determine whether the sample ion is a target sample ion, a substrate coupled to receive the sample, wherein the substrate is electron transparent, an ion transport module coupled to receive the sample ion from the ion filter and transport the sample ion to the substrate, and an imaging system arranged to image, with a low energy charged particle beam, the sample located on the substrate, wherein the substrate is arranged in an analysis location.Type: ApplicationFiled: June 29, 2020Publication date: December 31, 2020Applicant: FEI CompanyInventors: Marcus Straw, Alexander Makarov, Josh Gilbert, Aaron Torok, Joseph Christian, Alan Bahm, Kun Liu, Tom Nichols, Jeff Kosmoski, Dmitry Grinfeld