Patents by Inventor Abde Ali Kagalwalla

Abde Ali Kagalwalla has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220415442
    Abstract: This disclosure describes methods, non-transitory computer readable media, and systems that can generate signal-to-noise-ratio metrics for clusters of oligonucleotides to which tagged nucleotide bases are added and utilize the signal-to-noise-ratio metrics to generate nucleotide-base calls and determine base-call quality. For example, the disclosed systems can generate the signal-to-noise-ratio metrics using scaling factors and noise levels associated with light signals detected from the clusters of oligonucleotides. The disclosed systems can utilize the signal-to-noise-ratio metrics to generate intensity-value boundaries for generating nucleotide-base-calls for the signals in accordance with one or more base-call-distribution models. Additionally, the disclosed systems can utilize a threshold to filter out signals detected from the clusters of oligonucleotides that have low signal-to-noise-ratio metrics.
    Type: Application
    Filed: June 2, 2022
    Publication date: December 29, 2022
    Inventors: Eric Jon Ojard, Nitin Udpa, Abde Ali Kagalwalla, John S Vieceli, Rami Mehio
  • Patent number: 8589844
    Abstract: Methods and apparatus are provided for analyzing impact of design rules on a layout. One exemplary method involves generating variants of the layout for different values for the rule, determining values of a device metric for each of the layout variants, and identifying the relationship between rule and the device metric based on the values for the device metric corresponding to the different values for the rule. In one embodiment, the layout variants are generated by using the different values for the rule to perform layout compaction on an initial layout generated in accordance with an initial value for the rule.
    Type: Grant
    Filed: February 9, 2012
    Date of Patent: November 19, 2013
    Assignee: GLOBALFOUNDRIES, Inc.
    Inventors: Swamy Muddu, Abde Ali Kagalwalla, Luigi Capodieci
  • Publication number: 20130212548
    Abstract: Methods and apparatus are provided for analyzing impact of design rules on a layout. One exemplary method involves generating variants of the layout for different values for the rule, determining values of a device metric for each of the layout variants, and identifying the relationship between rule and the device metric based on the values for the device metric corresponding to the different values for the rule. In one embodiment, the layout variants are generated by using the different values for the rule to perform layout compaction on an initial layout generated in accordance with an initial value for the rule.
    Type: Application
    Filed: February 9, 2012
    Publication date: August 15, 2013
    Applicant: GLOBALFOUNDRIES INC.
    Inventors: Swamy Muddu, Abde Ali Kagalwalla, Luigi Capodieci