Patents by Inventor AbdelHakim S. Alhussein

AbdelHakim S. Alhussein has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10396817
    Abstract: A low-density parity-check decoder utilizes information about hard errors in a storage medium to identify bit locations to flip log-likelihood ratios while attempting to decode codewords. The decoder iteratively flips and saturates log-likelihood ratios for bits at hard error locations and re-decodes until a valid codeword is produced. The decoder also identifies variable nodes associated with trapping sets for iterative log-likelihood ratio bit flipping.
    Type: Grant
    Filed: December 5, 2016
    Date of Patent: August 27, 2019
    Assignee: Seagate Technology LLC
    Inventors: Zhengang Chen, Abdelhakim S. Alhussein, Erich F. Haratsch
  • Patent number: 8826110
    Abstract: The present invention is related to systems and methods for defect scanning.
    Type: Grant
    Filed: July 17, 2012
    Date of Patent: September 2, 2014
    Assignee: LSI Corporation
    Inventors: Ming Jin, Fan Zhang, Lei Chen, AbdelHakim S. Alhussein
  • Publication number: 20140026004
    Abstract: The present invention is related to systems and methods for defect scanning.
    Type: Application
    Filed: July 17, 2012
    Publication date: January 23, 2014
    Inventors: Ming Jin, Fan Zhang, Lei Chen, AbdelHakim S. Alhussein