Patents by Inventor Abel Rios-Baez

Abel Rios-Baez has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Test method and test device for electronic memories
    Patent number: 7127650
    Abstract: A test method for electronic memories includes reading out a previously defined test pattern sequentially as a time-dependent signal from the memory, determining the associated spectrum from the time-dependent signal by Fourier transformation, and assessing the memory to be tested using the spectrum. Also included is a suitable test device for the method.
    Type: Grant
    Filed: July 11, 2002
    Date of Patent: October 24, 2006
    Assignee: Infineon Technologies AG
    Inventors: Abel Rios-Baez, Michael Kund
  • Test method and test device for electronic memories
    Publication number: 20030065998
    Abstract: A test method for electronic memories includes reading out a previously defined test pattern sequentially as a time-dependent signal from the memory, determining the associated spectrum from the time-dependent signal by Fourier transformation, and assessing the memory to be tested using the spectrum. Also included is a suitable test device for the method.
    Type: Application
    Filed: July 11, 2002
    Publication date: April 3, 2003
    Inventors: Abel Rios-Baez, Michael Kund