Patents by Inventor ABHIJEET DHIMAN

ABHIJEET DHIMAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for measuring changes in dielectric properties in a structure
    Patent number: 11193964
    Abstract: A method of determining stress within a composite structure is provided which includes coupling a sensor to a composite structure under load having embedded therein a plurality of particles, wherein the particles at room temperature are paraelectric or ferroelectric, transmitting an electromagnetic radiation to the sensor, thereby generating an electromagnetic field into the composite structure, sweeping frequency from a first frequency to a second frequency in a pulsed manner, receiving reflected power from the composite structure, determining the resonance frequency of the sensor, and translating the resonance frequency of the sensor to stress within the composite structure.
    Type: Grant
    Filed: June 4, 2019
    Date of Patent: December 7, 2021
    Assignee: Purdue Research Foundation
    Inventors: Abhijeet Dhiman, Vikas Tomar, Animesh Sharma, Alexey Shashurin, Sergey O Macheret
  • APTAMER AGAINST M.TB MPT51 AND USES THEREOF
    Publication number: 20200283774
    Abstract: The invention provides single stranded DNA aptamers specific to M.tb MPT51 and uses thereof in rapid, robust, highly specific, and cost effective diagnosis of tuberculosis. The invention also provides methods and devices based on the aptamers of the invention for the diagnosis of tuberculosis. Advantageously, aptamers of the present invention can selectively detect as low as 2 ng of M.tb MPT51 and this activity remains unaltered in presence of anti-MPT51 antibodies. The developed device can give sample-to-answer within 30 minutes.
    Type: Application
    Filed: September 7, 2018
    Publication date: September 10, 2020
    Applicants: TRANSLATIONAL HEALTH SCIENCE AND TECHNOLOGY INSTITUTE, ALL INDIA INSTITUTE OF MEDICAL SCIENCES, APTABHARAT INNOVATION PRIVATE LIMITED
    Inventors: Tarun KUMAR SHARMA, Jaya SIVASWAMI TYAGI, Ritu DAS, Abhijeet DHIMAN
  • SYSTEM AND METHOD FOR MEASURING CHANGES IN DIELECTRIC PROPERTIES IN A STRUCTURE
    Publication number: 20190369149
    Abstract: A method of determining stress within a composite structure is provided which includes coupling a sensor to a composite structure under load having embedded therein a plurality of particles, wherein the particles at room temperature are paraelectric or ferroelectric, transmitting an electromagnetic radiation to the sensor, thereby generating an electromagnetic field into the composite structure, sweeping frequency from a first frequency to a second frequency in a pulsed manner, receiving reflected power from the composite structure, determining the resonance frequency of the sensor, and translating the resonance frequency of the sensor to stress within the composite structure.
    Type: Application
    Filed: June 4, 2019
    Publication date: December 5, 2019
    Applicant: Purdue Research Foundation
    Inventors: ABHIJEET DHIMAN, Vikas Tomar, Animesh Sharma, Alexey Shashurin, Sergey O Macheret