Patents by Inventor Abhinaw Prakash

Abhinaw Prakash has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10380690
    Abstract: Datasets may be characterized by patterns. The patterns may be caused or otherwise influenced by external factors, such as temporal, meteorological, and/or system factors. The external factors, as well as the patterns which result in the data values of the dataset because of the external factors, may provide for techniques used to account for missing data elements, outlier data elements and/or otherwise cleanse the dataset. New elements may be generated to provide for the missing data elements, and derivative datasets may be generated based on one or more cleansed datasets.
    Type: Grant
    Filed: May 21, 2015
    Date of Patent: August 13, 2019
    Assignee: Chicago Mercantile Exchange Inc.
    Inventors: Jennifer Weng, Nataliya Frost, Shuo Liu, Panagiotis Xythalis, Lingrui Xiang, Xianqing Zou, Hariharan Kesavarao, Jie Zhu, Abhinaw Prakash
  • Publication number: 20160343080
    Abstract: Datasets may be characterized by patterns. The patterns may be caused or otherwise influenced by external factors, such as temporal, meteorological, and/or system factors. The external factors, as well as the patterns which result in the data values of the dataset because of the external factors, may provide for techniques used to account for missing data elements, outlier data elements and/or otherwise cleanse the dataset. New elements may be generated to provide for the missing data elements, and derivative datasets may be generated based on one or more cleansed datasets.
    Type: Application
    Filed: May 21, 2015
    Publication date: November 24, 2016
    Inventors: Jennifer Weng, Nataliya Frost, Shuo Liu, Panagiotis Xythalis, Lingrui Xiang, Xianqing Zou, Hariharan Kesavarao, Jie Zhu, Abhinaw Prakash