Patents by Inventor Abhishek Chambe Venkatesh Murthy

Abhishek Chambe Venkatesh Murthy has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230169618
    Abstract: A method of transmitting a safety notification comprising: determining a user location of an entity; receiving event data including an event location of an event; determining a range from the event location; and where the user location is within the range, transmitting the safety notification to a user device regarding the event.
    Type: Application
    Filed: January 24, 2023
    Publication date: June 1, 2023
    Applicant: Early Warning Services, LLC
    Inventors: Jacob M. Bellman, Dan M. Hayden, Abhishek Chambe Venkatesh Murthy, John M. Kohoutek, Klementina Nikov
  • Publication number: 20230073719
    Abstract: A method of operating a machine learning target factory may include generating a plurality of machine learning targets. The method may include storing each of the plurality of machine learning targets on a network-attached database. The method may include receiving, at the network-attached database, a request for at least one of the plurality of machine learning targets for a machine learning model. The method may include providing the at least one of the plurality of machine learning targets to a computing device housing the machine learning model.
    Type: Application
    Filed: September 6, 2022
    Publication date: March 9, 2023
    Applicant: Early Warning Services, LLC
    Inventors: Jacob M. Bellman, Dan M. Hayden, Abhishek Chambe Venkatesh Murthy, John M. Kohoutek, Anthony J. Moliterno
  • Publication number: 20230070736
    Abstract: A method of analyzing the effectiveness of a machine learning model may include executing a test procedure of a machine learning model comprising a plurality of input features. The machine learning model may include a lag feature associated with one of the plurality of input features. Executing the test procedure may include querying one or more data sources for historical data records associated with the input features. The lag feature may restrict a query for historical data records from at least one of the data sources to a predetermined time prior to a time of the test procedure of the machine learning model. Executing the test procedure may include receiving the historical data records from the one or more data sources at the machine learning model. Executing the test procedure may include generating an output of the machine learning model.
    Type: Application
    Filed: September 6, 2022
    Publication date: March 9, 2023
    Applicant: Early Warning Services, LLC
    Inventors: Jacob M. Bellman, Dan M. Hayden, Abhishek Chambe Venkatesh Murthy, John M. Kohoutek