Patents by Inventor Abhishek Naik

Abhishek Naik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240044968
    Abstract: A test and measurement instrument includes a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to take measurements during application of a double pulse test to the DUT to create measurement data, identify a measurement start point, find a measurement stop point, use the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and display the output charge to a user. A method of determining output charge of a device under test (DUT) includes taking measurements during application of a double pulse test to create measurement data, identifying a measurement start point, finding a measurement stop point, using the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and displaying the output charge.
    Type: Application
    Filed: July 28, 2023
    Publication date: February 8, 2024
    Applicant: Tektronix, Inc.
    Inventors: Vivek Shivaram, Niranjan R. Hegde, Krishna N H Sri, Abhishek Naik, Shubha B, Yogesh M. Pai, Venkatraj Melinamane