Patents by Inventor ABHISHEK NIKHRA
ABHISHEK NIKHRA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10877450Abstract: A system includes a first database configured to store one or more workflow templates associated with one or more workflows, where each workflow is used to implement at least one change in at least one control system of an industrial plant. The system also includes a second database configured to document each of the one or more workflows. In addition, the system includes at least one processor configured to communicate with at least one user equipment and to provide at least one user interface to the at least one user equipment. The at least one user interface is configured to provide the one or more workflow templates and to receive definitions of the one or more workflows. The at least one user interface is also configured to provide the one or more workflows for implementation of the at least one change in the at least one control system.Type: GrantFiled: August 2, 2016Date of Patent: December 29, 2020Assignee: Honeywell International Inc.Inventors: Abhishek Nikhra, Manas Dutta, Ramakrishnan Ganapathi, Sreedhara Reddy Mallavarpu, Malathi Naidu
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Patent number: 10474136Abstract: A method of automatically determining interconnections between control and instrumentation (C&I) systems within an industrial facility (IF). A data collection system including a data collection algorithm that provides a data collection block and a data agents block is coupled to the IF which has C&I systems collectively utilizing different data formats each including C&I devices, where the C&I systems are coupled to field devices coupled to processing equipment configured for implementing an industrial process. A data collection process is initiated using respective data formats for obtaining engineering configuration data used in the C&I systems stored therein. The engineering configuration data from each C&I system is used to determine connections within and interconnections between the C&I systems. The format of the engineering configuration data can be converted to common format engineering configuration data and then be stored.Type: GrantFiled: June 9, 2016Date of Patent: November 12, 2019Assignee: Honeywell International Inc.Inventors: Abhishek Nikhra, Manas Dutta, Ramakrishnan Ganapathi
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Patent number: 10295982Abstract: A method of detecting and tracking changes in engineering configuration data (ECD) for control and instrumentation (C&I) systems an industrial facility. First ECD in a first data format used in a first C&I system and second ECD in a second data format used in a second C&I system are converted into a common format. The first and second ECD are stored together as reference snapshot data with a timestamp in a single information source. At a second time, after the first time reflected in the timestamp, the first and second ECD are obtained. The first ECD and the second ECD obtained at the second time are converted into the common format that collectively provides updated snapshot data. Changes are detected between the first ECD and the second ECD by comparing the reference snapshot data to the updated snapshot data.Type: GrantFiled: June 9, 2016Date of Patent: May 21, 2019Assignee: Honeywell International Inc.Inventors: Abhishek Nikhra, Ramakrishnan Ganapathi, Manas Dutta, Kiran N, Ravi Kumar R
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Patent number: 10296515Abstract: A system and method of engineering configuration data (ECD) collection for an industrial facility having a first control and instrumentation (C&I) system with first ECD using a first file format and a second C&I system with second ECD data using a second file format, and a data collection server. A first data agent has collection information regarding the first C&I system and a second data agent has collection information regarding the second C&I system. The first data agent collects the first ECD and the second data agent collects the second ECD. The first ECD and the second ECD are translated into one common generic data format. The first ECD and the second ECD are stored after being translated.Type: GrantFiled: June 9, 2016Date of Patent: May 21, 2019Assignee: Honeywell International Inc.Inventors: Abhishek Nikhra, Ramakrishnan Ganapathi, Manas Dutta, Kiran N, Ravi Kumar R, Avinash Rajan
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Patent number: 10218573Abstract: A system includes at least one processor configured to identify multiple nodes coupled to at least one network of an industrial plant, obtain configuration data from each of the nodes, parse the configuration data to extract specified information from the configuration data, and store the extracted specified information in a specified format. To parse the configuration data for each node, the at least one processor may be configured to generate a memory layout for the configuration data from the node, open a checkpoint file containing the configuration data from the node, and identify at least one point and header information for the at least one point in the checkpoint file using the memory layout. To identify the multiple nodes, the at least one processor can be configured to generate a network diagram of the nodes coupled to the at least one network and identify the nodes from the network diagram.Type: GrantFiled: August 2, 2016Date of Patent: February 26, 2019Assignee: Honeywell International Inc.Inventors: Shylaja Munihanumaiah, Ramakrishnan Ganapathi, Abhishek Nikhra
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Patent number: 10148519Abstract: A method of automatic network topology determination for at least one Control & Instrumentation (C&I) system in an industrial facility. A network type, and all nodes and interconnecting networking devices including switches in the C&I system(s) are discovered. Additional connectivity information including a connection of the nodes to a specific port is collected. The network relationships of the nodes and interconnecting networking devices in the C&I system are determined. A network topology diagram of the C&I system is automatically generated from the nodes and interconnecting networking devices, additional connectivity information, and network relationships.Type: GrantFiled: June 9, 2016Date of Patent: December 4, 2018Assignee: Honeywell International Inc.Inventors: Manas Dutta, Ramakrishnan Ganapathi, Abhishek Nikhra, Praveen Shetty, Jaganmohan Y. Reddy
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Publication number: 20180039247Abstract: A system includes a first database configured to store one or more workflow templates associated with one or more workflows, where each workflow is used to implement at least one change in at least one control system of an industrial plant. The system also includes a second database configured to document each of the one or more workflows. In addition, the system includes at least one processor configured to communicate with at least one user equipment and to provide at least one user interface to the at least one user equipment. The at least one user interface is configured to provide the one or more workflow templates and to receive definitions of the one or more workflows. The at least one user interface is also configured to provide the one or more workflows for implementation of the at least one change in the at least one control system.Type: ApplicationFiled: August 2, 2016Publication date: February 8, 2018Inventors: Abhishek Nikhra, Manas Dutta, Ramakrishnan Ganapathi, Sreedhara Reddy Mallavarpu, Malathi Naidu
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Publication number: 20180041393Abstract: A system includes at least one processor configured to identify multiple nodes coupled to at least one network of an industrial plant, obtain configuration data from each of the nodes, parse the configuration data to extract specified information from the configuration data, and store the extracted specified information in a specified format. To parse the configuration data for each node, the at least one processor may be configured to generate a memory layout for the configuration data from the node, open a checkpoint file containing the configuration data from the node, and identify at least one point and header information for the at least one point in the checkpoint file using the memory layout. To identify the multiple nodes, the at least one processor can be configured to generate a network diagram of the nodes coupled to the at least one network and identify the nodes from the network diagram.Type: ApplicationFiled: August 2, 2016Publication date: February 8, 2018Inventors: Shylaja Munihanumaiah, Ramakrishnan Ganapathi, Abhishek Nikhra
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Publication number: 20180032468Abstract: A method includes identifying input/output (I/O) channels in a control and instrumentation system associated with an industrial plant. The method also includes identifying which of the I/O channels are not in use by the control and instrumentation system. The method further includes generating a graphical user interface identifying the I/O channels not in use by the control and instrumentation system. An indication that at least one I/O channel not in use by the control and instrumentation system is being reserved for use could be received, and the at least one I/O channel can be reserved. An indication that at least one I/O channel in use by the control and instrumentation system is now not in use by the control and instrumentation system could also be received, and the at least one I/O channel could be released so the at least one I/O channel is available for reservation or other use.Type: ApplicationFiled: November 2, 2016Publication date: February 1, 2018Inventors: Manas Dutta, Ramakrishnan Ganapathi, Abhishek Nikhra
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Publication number: 20170364060Abstract: A method includes applying a defect rule to engineering configurations in an industrial process control and automation system. This includes extracting query logic from the defect rule defining a defect. This also includes executing the extracted query logic on the engineering configurations. This further includes storing results of the executed query logic as an identified defect. The method could also include reconciling the identified defect by comparing the results of the executed query logic for a current iteration with results of the executed query logic from previous iterations and determining a current state of the identified defect based on the comparison.Type: ApplicationFiled: June 21, 2016Publication date: December 21, 2017Inventors: Abhishek Nikhra, Manas Dutta, Ramakrishnan Ganapathi
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Publication number: 20170357232Abstract: A method of detecting and tracking changes in engineering configuration data (ECD) for control and instrumentation (C&I) systems an industrial facility. First ECD in a first data format used in a first C&I system and second ECD in a second data format used in a second C&I system are converted into a common format. The first and second ECD are stored together as reference snapshot data with a timestamp in a single information source. At a second time, after the first time reflected in the timestamp, the first and second ECD are obtained. The first ECD and the second ECD obtained at the second time are converted into the common format that collectively provides updated snapshot data. Changes are detected between the first ECD and the second ECD by comparing the reference snapshot data to the updated snapshot data.Type: ApplicationFiled: June 9, 2016Publication date: December 14, 2017Inventors: ABHISHEK NIKHRA, RAMAKRISHNAN GANAPATHI, MANAS DUTTA, KIRAN N, RAVI KUMAR R
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Publication number: 20170357245Abstract: A method of automatically determining interconnections between control and instrumentation (C&I) systems within an industrial facility (IF). A data collection system including a data collection algorithm that provides a data collection block and a data agents block is coupled to the IF which has C&I systems collectively utilizing different data formats each including C&I devices, where the C&I systems are coupled to field devices coupled to processing equipment configured for implementing an industrial process. A data collection process is initiated using respective data formats for obtaining engineering configuration data used in the C&I systems stored therein. The engineering configuration data from each C&I system is used to determine connections within and interconnections between the C&I systems. The format of the engineering configuration data can be converted to common format engineering configuration data and then be stored.Type: ApplicationFiled: June 9, 2016Publication date: December 14, 2017Inventors: ABHISHEK NIKHRA, MANAS DUTTA, RAMAKRISHNAN GANAPATHI
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Publication number: 20170359222Abstract: A method of automatic network topology determination for at least one Control & Instrumentation (C&I) system in an industrial facility. A network type, and all nodes and interconnecting networking devices including switches in the C&I system(s) are discovered. Additional connectivity information including a connection of the nodes to a specific port is collected. The network relationships of the nodes and interconnecting networking devices in the C&I system are determined. A network topology diagram of the C&I system is automatically generated from the nodes and interconnecting networking devices, additional connectivity information, and network relationships.Type: ApplicationFiled: June 9, 2016Publication date: December 14, 2017Inventors: MANAS DUTTA, RAMAKRISHNAN GANAPATHI, ABHISHEK NIKHRA, PRAVEEN SHETTY, JAGANMOHAN Y. REDDY
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Publication number: 20170357702Abstract: A system and method of engineering configuration data (ECD) collection for an industrial facility having a first control and instrumentation (C&I) system with first ECD using a first file format and a second C&I system with second ECD data using a second file format, and a data collection server. A first data agent has collection information regarding the first C&I system and a second data agent has collection information regarding the second C&I system. The first data agent collects the first ECD and the second data agent collects the second ECD. The first ECD and the second ECD are translated into one common generic data format. The first ECD and the second ECD are stored after being translated.Type: ApplicationFiled: June 9, 2016Publication date: December 14, 2017Inventors: ABHISHEK NIKHRA, RAMAKRISHNAN GANAPATHI, MANAS DUTTA, KIRAN N, RAVI KUMAR R, AVINASH RAJAN
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Patent number: 9618910Abstract: A method (100) of generating on-demand device templates for integrating a controller controllable (CC) device with a process controller in a processing plant. A device description for the CC device is obtained (101) including a list of device parameters, connection details for communications including assembly structures, and a mapping of the device parameters into the assembly structures or the device description. Using a device template generating algorithm a custom device template is generated (102) for the CC device (i) by modifying an existing device template to include at least one modification or (ii) from the device description.Type: GrantFiled: November 7, 2013Date of Patent: April 11, 2017Assignee: Honeywell International Inc.Inventors: Abhishek Nikhra, Joseph Felix, Suraj Prakash, Ashutosh Singh, Girish Krishnanivas
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Publication number: 20140371882Abstract: A method (100) of generating on-demand device templates for integrating a controller controllable (CC) device with a process controller in a processing plant. A device description for the CC device is obtained (101) including a list of device parameters, connection details for communications including assembly structures, and a mapping of the device parameters into the assembly structures or the device description. Using a device template generating algorithm a custom device template is generated (102) for the CC device (i) by modifying an existing device template to include at least one modification or (ii) from the device description.Type: ApplicationFiled: November 7, 2013Publication date: December 18, 2014Applicant: Honeywell International Inc.Inventors: ABHISHEK NIKHRA, JOSEPH FELIX, SURAJ PRAKASH, ASHUTOSH SINGH, GIRISH KRISHNANIVAS